Abstract:
An electro-optical measuring system is described wherein a laser or light beam is precisely translated in a straight line perpendicular to the direction of propagation of the beam at a uniform, repeatable speed to define a time-varying sensing field whose energy is picked up by a photosensor which yields an output signal. An object whose dimension is to be measured is inserted in the field whereby the output signal of the photosensor takes the form of a pulse whose leading edge is developed by the traversal of the beam across one edge of the object, thereby blocking passage of the energy to the photosensor. The trailing edge is developed by the traversal of the beam across the opposite edge of the object thereby restoring the energy to the photosensor. The width or time duration of the pulse is a measure of the distance between the two edges. Measurements of exceptional precision are obtained by a circulation reducer in the light path of the translated beam to substantially eliminate convection currents in the air, further precision is obtained by using group delay equalization in the edge sensing signal processing to reduce systematic errors due to variations in edge pulse width, and by using analog interpolation to provide high resolution measurement of the location of the edge of the object.
Abstract:
Methods and apparatuses for performing the same, where the methods include obtaining, from an interferometer, a time-varying interference signal S(t) based on a combination of a first beam and a second beam, the first beam being diffracted from an encoder scale, in which at least one of the encoder scale and the interferometer is moveable with respect to the other, obtaining one or more error correction signals based on one or more errors that modify the time-varying interference signal S(t), and outputting information about a change in a position of the encoder scale relative to the interferometer based on the time-varying interference signal S(t) and the one or more error correction signals.
Abstract:
An interference signal S(t) is provided from interference between two beams directed along different paths. The signal S(t) is indicative of changes in an optical path difference n{tilde over (L)}(t) between the different paths, where n is an average refractive index along the different paths, {tilde over (L)}(t) is a total physical path difference between the different paths, and t is time. An error signal is provided to reduce errors in an estimate of {tilde over (L)}(t). The error signal is derived at least in part based on one or more collective properties of a distribution of multi-dimensional values. At least one of the multi-dimensional values in the distribution is generated from a plurality of samples of the signal S(t) (e.g., samples of the signal captured at different times).
Abstract:
A method and apparatus used to reduce glitches in measurements made by an accumulation of phase changes over a range greater than 2π. Embodiments of the invention feature the use of a glitch filter that receives a phase input indicating a position value. The glitch filter reduces glitches by using a feedback term that has been reduced modulo 2π.The method includes measuring a plurality of values of a measurement signal, determining a current position value based on each of the plurality of measured values, wherein determining includes determining a delta value based on a current measured value and a previous position value, wherein the delta value is reduced modulo 2π to a range of ±π, and determining the current position value based on the determined delta value, and outputting at least one of the determined current position value and a velocity value.
Abstract:
A method for compensating data age in measurement signals from an interferometer includes measuring a value of the measurement signal and adjusting the measured value based on the measurement signal with a data age adjustment value to correct for data age.
Abstract:
Apparatus and methods particularly suitable for use in electro-optical metrology and other applications to measure and monitor the refractive index of a gas in a measurement path and/or the change in optical path length of the measurement path due to the gas while the refractive index of the gas may be fluctuating due to turbulence or the like and/or the physical length of the measuring path may be changing.
Abstract:
Apparatus and methods particularly suitable for use in electro-optical metrology and other applications to measure and monitor the refractive index of a gas in a measurement path and/or the change in optical path length of the measurement path due to the gas while the refractive index of the gas may be fluctuating due to turbulence or the like and/or the physical length of the measuring path may be changing. More specifically, the invention employs electronic frequency processing to provide measurements of dispersion of the refractive index, the dispersion being substantially proportional to the density of the gas, and/or measurements of dispersion of the optical path length, the dispersion of the optical path length being related to the dispersion of the refractive index and the physical length of the measurement path. The refractive index of the gas and/or the optical path length effects of the gas are subsequently computed from the measured dispersion of the refractive index and/or the measured dispersion of the optical path length, respectively. The information generated by the inventive apparatus is particularly suitable for use in interferometric distance measuring instruments (DMI) to compensate for errors related to refractive index of gas in a measurement path brought about by environmental effects and turbulence induced by rapid stage slew rates.
Abstract:
Apparatus and methods particularly suitable for use in electro-optical metrology and other applications to measure and monitor the refractive index of a gas in a measurement path and/or the change in optical path length of the measurement path due to the gas while the refractive index of the gas may be fluctuating due to turbulence or the like and/or the physical length of the measuring path may be changing. More specifically, the invention employs electronic frequency processing to provide measurements of dispersion of the refractive index, the dispersion being substantially proportional to the density of the gas, and/or measurements of dispersion of the optical path length, the dispersion of the optical path length being related to the dispersion of the refractive index and the physical length of the measurement path. The refractive index of the gas and/or the optical path length effects of the gas are subsequently computed from the measured dispersion of the refractive index and/or the measured dispersion of the optical path length, respectively. The information generated by the inventive apparatus is particularly suitable for use in interferometric distance measuring instruments (DMI) to compensate for errors related to refractive index of gas in a measurement path brought about by environmental effects and turbulence induced by rapid stage slew rates.