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公开(公告)号:US11084272B2
公开(公告)日:2021-08-10
申请号:US15609092
申请日:2017-05-31
Applicant: General Electric Company
Inventor: Mikhail Pavlov , Kassy Moy Hart , Kamilla Koenig-Urban
Abstract: Embodiments of the disclosure provide a test structure for additive manufacture and related methods for emitter alignment. A test structure according to the disclosure can include: a body having a reference surface, wherein the body is formed with a first beam scanner of the AM system; and a plurality of calibration features defined on the reference surface of the body, wherein each of the plurality of calibration features includes an alignment surface positioned at an offset distance relative to the reference surface, and wherein each of the plurality of calibration features is formed with a second beam scanner of the AM system different than the first beam scanner.
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12.
公开(公告)号:US10688593B2
公开(公告)日:2020-06-23
申请号:US15626413
申请日:2017-06-19
Applicant: General Electric Company
Inventor: Felix Martin Gerhard Roerig , Donnell Eugene Crear , Juan Vicente Haro Gonzalez , Mikhail Pavlov , Dean Andrew Snelling, Jr.
IPC: B22F3/00 , B23K26/06 , B23K26/342 , B33Y30/00 , B33Y80/00 , B33Y50/02 , B22F3/105 , B23K15/06 , B23K26/12 , B23K15/00 , B23K26/00 , B23K26/082 , B22F5/10 , B23K101/00 , B23K103/18 , B33Y10/00
Abstract: A component includes a body, and an interface in the body defining a first and second portion of the body made by different melting beam sources of a multiple melting beam source additive manufacturing system during a single build. The component also includes a channel extending through the body. The channel includes an interface-distant area on opposing sides of the interface, each interface-distant area having a first width. The channel also includes an enlarged width area fluidly communicative with the interface-distant areas and spanning the interface, the enlarged width area having a second width larger than the first width. Any misalignment of the melting beams at the interface is addressed by the enlarged width area, eliminating the problem of reduced cooling fluid flow in the channel.
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公开(公告)号:US10549345B2
公开(公告)日:2020-02-04
申请号:US15402288
申请日:2017-01-10
Applicant: General Electric Company
Inventor: Mikhail Pavlov , Kevin Peter Harvey
Abstract: Additive manufacturing systems are disclosed. The additive manufacturing system may include a sintering device configured to sinter a powder material to form a component, and an actuator coupled to the sintering device. The actuator may adjust a position of the sintering device. Additionally, the system may include at least one computing device operably connected to the actuator and the sintering device. The at least one computing device may control a movement of the sintering device by performing processes including determining an exposure pattern for the sintering device for sintering the powder material based on a geometry of the component. The exposure pattern may include at least one exposure track extending between two sides of the component. The computing device(s) may also perform processes including moving the sintering device, using the actuator, in the determined exposure pattern to sinter the powder material to form the component.
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公开(公告)号:US20180356350A1
公开(公告)日:2018-12-13
申请号:US15619775
申请日:2017-06-12
Applicant: General Electric Company
Inventor: Donnell Eugene Crear , Tiffany Muller Craft , Kassy Moy Hart , Mikhail Pavlov , Felix Martin Gerhard Roerig , Dean Andrew Snelling
IPC: G01N21/956 , G01N21/95 , G06T7/00 , B05C17/005 , G05D9/12 , B28B11/08 , B28B19/00
CPC classification number: G01N21/95607 , B05C17/00516 , B22F3/1055 , B22F2003/1056 , B28B11/0845 , B28B19/0015 , B29C64/30 , B29C64/393 , B33Y30/00 , B33Y40/00 , G01N21/8851 , G01N21/9515 , G01N2021/8887 , G05D9/12 , G06T7/001 , G06T2207/20221 , G06T2207/30164
Abstract: A damaged applicator identifier system for an additive manufacturing (AM) system, and AM system including the same are disclosed. The damaged applicator identifier system may include a damaged applicator identifier determining whether the active applicator is damaged by identifying a non-planar surface in a layer of raw material on a build platform of the AM system after formation of the layer by the active applicator. A damaged applicator controller is configured to cause replacement or repair of the damaged, active applicator in response to the damaged applicator identifier identifying the damaged, active applicator.
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公开(公告)号:US20180354208A1
公开(公告)日:2018-12-13
申请号:US15619772
申请日:2017-06-12
Applicant: General Electric Company
Inventor: Donnell Eugene Crear , Mikhail Pavlov , Felix Martin Gerhard Roerig , Dean Andrew Snelling
CPC classification number: B29C73/245 , B29C73/163 , B29C73/34 , B32B43/00 , B33Y10/00 , B33Y30/00 , B33Y80/00
Abstract: An applicator repair system for an additive manufacturing (AM) system, and an AM system including the same are disclosed. The applicator repair system includes a repair device including a repair element configured to repair a damaged applicator element on an applicator of an AM system. The damaged applicator element is configured to distribute a layer of raw material on a build platform of the AM system. The repair device is positioned within a processing chamber of the AM system. A damaged applicator controller may be provided that is configured to cause repair of the damaged active applicator in response to the damaged applicator being identified as damaged.
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