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公开(公告)号:US11200176B2
公开(公告)日:2021-12-14
申请号:US17009245
申请日:2020-09-01
Applicant: Intel Corporation
Inventor: Raj K. Ramanujan , Glenn J Hinton , David J. Zimmerman
IPC: G06F12/00 , G06F12/0891 , G06F12/0895 , G06F1/3234 , G06F1/3225 , G06F12/0868 , G06F12/0873 , G06F12/0804 , G06F11/07 , G06F1/30 , G06F12/0864
Abstract: A system and method are described for flushing a specified region of a memory side cache (MSC) within a multi-level memory hierarchy. For example, a computer system according to one embodiment comprises: a memory subsystem comprised of a non-volatile system memory and a volatile memory side cache (MSC) for caching portions of the non-volatile system memory; and a flush engine for flushing a specified region of the MSC to the non-volatile system memory in response to a deactivation condition associated with the specified region of the MSC.
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公开(公告)号:US10026475B2
公开(公告)日:2018-07-17
申请号:US14879008
申请日:2015-10-08
Applicant: Intel Corporation
Inventor: Shekoufeh Qawami , Rajesh Sundaram , David J. Zimmerman , Blaise Fanning
Abstract: Examples are disclosed for adaptive configuration of non-volatile memory. The examples include a mode register configured to include default and updated values to indicate one or more configurations of the non-volatile memory. The examples may also include discoverable capabilities maintained in a configuration table that may indicate memory address lengths and/or operating power states.
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公开(公告)号:US20170169900A1
公开(公告)日:2017-06-15
申请号:US15293123
申请日:2016-10-13
Applicant: Intel Corporation
Inventor: David J. Zimmerman
IPC: G11C29/32 , G01R31/3185 , G11C11/408 , G01R31/3177
CPC classification number: G11C29/32 , G01R31/3177 , G01R31/318513 , G01R31/318558 , G01R31/318572 , G11C5/04 , G11C11/4087 , H01L2924/0002 , H01L2924/00
Abstract: A boundary scan chain for stacked memory. An embodiment of a memory device includes a system element and a memory stack including one or more memory die layers, each memory die layer including input-output (I/O) cells and a boundary scan chain for the I/O cells. A boundary scan chain of a memory die layer includes a scan chain portion for each of the I/O cells, the scan chain portion for an I/O cell including a first scan logic multiplexer a scan logic latch, an input of the scan logic latch being coupled with an output of the first scan logic multiplexer, and a decoder to provide command signals to the boundary scan chain.
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公开(公告)号:US09036718B2
公开(公告)日:2015-05-19
申请号:US14132703
申请日:2013-12-18
Applicant: Intel Corporation
Inventor: David J. Zimmerman , Michael W. Williams
IPC: H04B3/00 , H04L25/00 , G06F13/28 , G11C5/06 , G11C7/10 , G11C11/4076 , G11C11/4096
CPC classification number: G06F13/28 , G11C5/066 , G11C7/10 , G11C7/1078 , G11C7/1084 , G11C7/109 , G11C11/4076 , G11C11/4096
Abstract: Embodiments provide access to a memory over a high speed serial link at slower speeds than the high speed serial links regular operation. An embodiment may comprise a memory apparatus with a differential receiver coupled to a protocol recognition circuit, a low speed receiving circuit that has a first receiver coupled with a first input of the differential receiver and a second receiver coupled with a second input of the differential receiver, wherein the low speed receiving circuit is coupled with the protocol recognition circuit, allowing the first and second receivers to access the protocol recognition block at a different frequency than the differential receiver.
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