摘要:
The distributed feedback semiconductor laser includes: a lower clad layer formed on a substrate; a ridge including an active layer and an upper clad layer sequentially formed on the lower clad layer; and a grating formed at a sidewall or both sidewalls of the ridge including the active layer in a direction perpendicular to the active layer and a resonance axis so as to enable a single longitudinal mode oscillation. The grating has parallel grooves that are equally spaced at a period equal to an integer multiple of half of an oscillation wavelength λ (nλ/2, n=1, 2, 3 . . . ).
摘要:
Provided are a semiconductor laser diode and a method of manufacturing the same. The semiconductor laser diode includes a lower cladding layer disposed on a substrate; a ridge including an optical waveguide layer, an active layer, an upper cladding layer, and an ohmic contact layer, which are sequentially stacked on the lower cladding layer, and having a predetermined width, which is obtained by performing a channel etching process on both sides of the ridge; an oxide layer disposed on surfaces of the upper and lower cladding layer to control the width of the ridge; a dielectric layer disposed on left and right channels of the ridge; an upper electrode layer disposed on the entire surface of the resultant structure to enclose the ridge and the dielectric layer; and a lower electrode layer disposed on a bottom surface of the substrate. The method is simpler than a conventional process of manufacturing a semiconductor laser diode. Also, by controlling a wet oxidation time, the width of a ridge can be freely controlled and an ohmic contact layer can be automatically formed.
摘要:
A distributed feedback (DFB) quantum dot semiconductor laser structure is provided. The DFB quantum dot semi-conductor laser structure includes: a first clad layer formed on a lower electrode; an optical waveguide (WG) formed on the first clad layer; a grating structure layer formed on the optical WG and including a plurality of periodically disposed gratings; a first separate confinement hetero (SCH) layer formed on the grating structure layer; an active layer formed on the first SCH layer and including at least a quantum dot; a second SCH layer formed on the active layer; a second clad layer formed on the second SCH layer; an ohmic layer formed on the second clad layer; and an upper electrode formed on the ohmic layer. Accordingly, an optical WG is disposed on the opposite side of the active layer from the grating structure layer, thereby increasing single optical mode efficiency. And, an asymmetric multi-electrode structure is used for applying current, thereby maximizing purity and efficiency of the single mode semiconductor laser structure.
摘要:
A distributed feedback (DFB) quantum dot semiconductor laser structure is provided. The DFB quantum dot semi-conductor laser structure includes: a first clad layer formed on a lower electrode; an optical waveguide (WG) formed on the first clad layer; a grating structure layer formed on the optical WG and including a plurality of periodically disposed gratings; a first separate confinement hetero (SCH) layer formed on the grating structure layer; an active layer formed on the first SCH layer and including at least a quantum dot; a second SCH layer formed on the active layer; a second clad layer formed on the second SCH layer; an ohmic layer formed on the second clad layer; and an upper electrode formed on the ohmic layer. Accordingly, an optical WG is disposed on the opposite side of the active layer from the grating structure layer, thereby increasing single optical mode efficiency. And, an asymmetric multi-electrode structure is used for applying current, thereby maximizing purity and efficiency of the single mode semiconductor laser structure.
摘要:
A method for forming a poly metal gate, comprising the steps of: providing a substrate where a gate oxide is formed; forming a polysilicon film, a barrier metal, a refractory metal film and a hard mask over the gate oxide; patterning the hard mask, the refractory metal film, the barrier metal and the polysilicon film to form a gate metal gate; forming a capping layer for oxidation prevention over the gate oxide to cover the poly metal gate; etching the capping layer for oxidation prevention to remain in sidewalls of the poly metal gate; carrying out a heat treatment using a H2 gas to cover a damage of the capping layer for oxidation prevention in the capping layer etching step; and carrying out a reoxidation process to recover a damage caused in the etching step for the formation of the poly metal gate and improve reliability of the gate oxide.
摘要:
A method of forming a gate electrode in a semiconductor device which can easily perform gate re-oxidation process without transforming the morphology of the gate electrode, is disclosed. According to the present invention, a gate oxide layer, a doped polysilicon layer, a barrier metal layer and a refractory metal layer are formed on a semiconductor substrate, in sequence. A hard mask is then formed on the refractory metal. Next, the refractory metal layer, the barrier metal layer and the polysilicon layer are etched using the hard mask as an etch mask to form a gate electrode. A spacer for oxidation barrier is then formed on the side wall of the gate electrode and the hard mask. Thereafter, gate re-oxidation process is performed using the spacer as an oxidation mask to form a re-oxidation layer on the substrate of both sides of the spacer. The spacer is formed of a nitride layer such as a SiON layer or a Si4N3 layer. Furthermore, the spacer is formed to the thickness of 50 to 300 Å.