Document detection system using detection result presentation for
facilitating user's comprehension
    11.
    发明授权
    Document detection system using detection result presentation for facilitating user's comprehension 失效
    文件检测系统采用检测结果表示,方便用户理解

    公开(公告)号:US5649193A

    公开(公告)日:1997-07-15

    申请号:US560512

    申请日:1995-11-17

    IPC分类号: G06F17/30

    摘要: A document detection system using a detection result presentation that can facilitate a user's quick comprehension of the relevancy of each detected document. In this system, a user's input for commanding a document detection is analyzed to extract keywords and viewpoints relevant to each keyword contained in the user's input, and a detection command is constructed from the keywords and the viewpoints extracted from the user's input. Then, the detection operation is executed to detect those documents among a plurality of stored documents which match with the constructed detection command as detected documents for a detection result. The detection result can be presented in the multi-dimensional display formed by setting the viewpoints to axes with the detection command as an origin and using distances of the detected documents with respect to the origin for each viewpoint as coordinates of the detected documents with respect to each axis representing each viewpoint.

    摘要翻译: 一种使用检测结果呈现的文档检测系统,其可以促进用户快速理解每个检测到的文档的相关性。 在该系统中,分析用于命令文档检测的用户输入,以提取与用户输入中包含的每个关键字相关的关键字和视点,并且从关键字和从用户输入提取的视点构建检测命令。 然后,执行检测操作,以检测与构成的检测命令相匹配的多个存储文档中的这些文档作为用于检测结果的检测文档。 可以将检测结果呈现在通过将检测命令的视点设置为轴的多维显示为起点,并且使用检测到的文档相对于每个视点的原点的距离作为检测到的文档的坐标,相对于 每个轴代表每个视点。

    Machine translation system and method of machine translation
    12.
    发明授权
    Machine translation system and method of machine translation 失效
    机器翻译系统和机器翻译方法

    公开(公告)号:US5088038A

    公开(公告)日:1992-02-11

    申请号:US527894

    申请日:1990-05-24

    IPC分类号: G06F17/27 G06F17/28

    摘要: A machine translation system capable of obtaining a consistent translation for an entire document by taking context into account in translating each word or sentence. In this system, document information necessary to remove uncertainty in the translation due to a presence of a plurality of candidates for the translation is utilized whenever uncertainity due to a presence of a plurality of candidates for the translation arises by attempting to translate according to a translation dictionary containing rules for translation.

    摘要翻译: 一种机器翻译系统,能够通过在翻译每个单词或句子时考虑上下文来获得整个文档的一致翻译。 在该系统中,由于存在用于翻译的多个候选者而导致的翻译中的不确定性所需的文档信息被利用,这是由于通过尝试根据翻译进行翻译而产生的多个用于翻译的候选者的存在的不确定性 包含翻译规则的字典。

    Method for manufacturing a probe for an electrical test
    13.
    发明授权
    Method for manufacturing a probe for an electrical test 有权
    制造电气试验用探针的方法

    公开(公告)号:US08671567B2

    公开(公告)日:2014-03-18

    申请号:US12939879

    申请日:2010-11-04

    IPC分类号: H01R43/00

    摘要: A method for manufacturing a probed for an electrical test includes producing by a deposition technique a deposit including a probe main body portion made of a nickel-boron alloy and a probe tip portion projecting downward from the probe main body portion and made of a different conductive material from the probe main body portion. The method further includes annealing the deposit. The average grain diameter of the nickel-boron alloy is between 97 Å and 170 Å. The contained amount of boron is from 0.02 wt % to 0.20 wt %.

    摘要翻译: 用于电测试的探测方法包括通过沉积技术制造包括由镍 - 硼合金制成的探针主体部分和从探针主体部分向下突出并由不同导电 材料从探针主体部分。 该方法还包括退火沉积物。 镍 - 硼合金的平均粒径为97埃至170埃。 含硼量为0.02重量%〜0.20重量%。

    Method for manufacturing an electrical test probe
    15.
    发明授权
    Method for manufacturing an electrical test probe 有权
    电测试探头的制造方法

    公开(公告)号:US07736690B2

    公开(公告)日:2010-06-15

    申请号:US12017300

    申请日:2008-01-21

    IPC分类号: B05D5/12

    摘要: A probe tip section of an electrical test probe has a laminated structure consisting of a first deposition portion and a second deposition portion covering the first deposition portion, and by the laminated structure, a maximum cross-sectional area portion at which the cross-sectional area of the probe tip section is increased to a base portion is provided between a tip end of the probe tip section and the base portion in the probe tip section. At the maximum cross-sectional area portion, a dimension in the X direction as seen on a flat surface perpendicular to a protruding direction of the probe tip section is increased in a one-dimensional way, and in addition, a dimension in the Y direction perpendicular to the X direction is increased from the tip end toward the base portion, as a result of which the cross-sectional area of the probe tip section can be increased in a two-dimensional way. Thus, the cross-sectional area at the maximum cross-sectional area portion reaching the base portion of the probe tip section can be made to be larger than in the conventional case, and along with the increase of the cross-sectional area, the stress acting on the base portion can be lowered.

    摘要翻译: 电测试探针的探针尖端部分具有由第一沉积部分和覆盖第一沉积部分的第二沉积部分组成的层压结构,并且通过层压结构,包括最大横截面积部分,其截面积 在探针末端部的前端部与探针头部的基部之间,设置有探针头部的部分增加到基部。 在最大横截面积部分,在垂直于探针尖端部分的突出方向的平坦表面上看到的X方向上的尺寸以一维方式增加,另外,Y方向上的尺寸 与X方向垂直的方向从前端朝向基部增加,结果能够以二维方式增大探针末端部的截面积。 因此,能够使到达到探头前端部的基部的最大截面积部分的截面积大于常规情况,并且随着横截面积的增加,应力 可以降低作用于基部的部分。

    Method for manufacturing a probe
    16.
    发明授权
    Method for manufacturing a probe 有权
    探针制造方法

    公开(公告)号:US07721429B2

    公开(公告)日:2010-05-25

    申请号:US12017299

    申请日:2008-01-21

    IPC分类号: H01R43/16

    摘要: A probe formed on a base table is detached from the base table without giving damage on the probe. The present invention provides a probe manufacturing method comprising the steps of forming on a sacrificial layer on a base table a recess exposing the sacrificial layer with a resist, depositing a probe material in the recess to form a probe and then removing the resist, leaving part of the sacrificial layer and removing the rest by an etching process, and detaching from the base table the probe held on the base table by the remaining part of the sacrificial layer. In the recess of the resist are formed a main body part corresponding to a flat surface shape of the probe and an auxiliary part continuing into the main body part. The probe is formed by deposition of the material at the main body part, and a holding portion is formed by deposition of the material at the auxiliary part. The auxiliary part is formed in a flat surface shape sufficient for a sacrificial layer part under the holding portion to remain when a sacrificial layer part under the probe is removed by the etching process. The probe is separated from the holding portion after the sacrificial layer part under the probe is removed and while the sacrificial layer part under the holding portion remains.

    摘要翻译: 形成在基台上的探头与基座分离而不会损坏探头。 本发明提供了一种探针制造方法,包括以下步骤:在基台上的牺牲层上形成用抗蚀剂暴露牺牲层的凹部,将探针材料沉积在凹部中以形成探针,然后除去抗蚀剂,留下部分 的牺牲层,并通过蚀刻工艺去除其余部分,并且通过牺牲层的剩余部分从基台分离保持在基台上的探针。 在抗蚀剂的凹部中形成有对应于探针的平坦表面形状的主体部分和连续进入主体部分的辅助部件。 探针通过在主体部分沉积材料形成,并且通过在辅助部分沉积材料形成保持部分。 当通过蚀刻工艺去除探针下方的牺牲层部分时,辅助部件形成为足够用于保持部分下方的牺牲层部分的平坦表面形状。 在探针下方的牺牲层部分被去除之后,并且在保持部分下面的牺牲层部分保留下来,探针与保持部分分离。

    Probe for electrical test and probe assembly
    17.
    发明授权
    Probe for electrical test and probe assembly 有权
    探头用于电气测试和探头组装

    公开(公告)号:US07557593B2

    公开(公告)日:2009-07-07

    申请号:US11627900

    申请日:2007-01-26

    IPC分类号: G01R1/067 H01R12/00 H01R4/02

    摘要: A probe for electrical test comprises a probe body having a base end attached to a support base plate through a solder and a front end continuous with said base end and a surface layer showing a conductivity higher than that of the probe body and a solder wettability higher than that of the probe body and extending on the surface of the probe body from the base end to the front end. In the vicinity of the base end of the surface layer, a shield region having a smaller solder wettability than that of the surface layer is formed across the surface layer.

    摘要翻译: 用于电测试的探针包括探针主体,其具有通过焊料附接到支撑基板的基端,并且与所述基端连续的前端和表现出高于探针主体的导电性的表面层,并且焊料润湿性更高 比探针主体的长度大,并且在探头主体的表面上从基端延伸到前端。 在表面层的基端附近,在表面层上形成具有比表层更小的焊料润湿性的屏蔽区域。

    PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT
    18.
    发明申请
    PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT 有权
    电气测试和电气连接设备的探索

    公开(公告)号:US20090051382A1

    公开(公告)日:2009-02-26

    申请号:US11817493

    申请日:2005-03-07

    IPC分类号: G01R1/067

    CPC分类号: G01R1/06727 G01R1/06738

    摘要: A probe includes an arm region extending in the back and forth direction, and a tip region extending downward from the front end portion of the arm region. The tip region has a pedestal portion integrally continuous to a lower edge portion at the front end side of the arm region and having an underside inclined to an imaginary axis extending in the vertical direction; and a contact portion projected from the underside of the pedestal portion and having a tip orthogonal to an imaginary axis. Thus, the position of the tip can be accurately determined.

    摘要翻译: 探头包括在前后方向上延伸的臂区域和从臂区域的前端部向下延伸的尖端区域。 尖端区域具有与臂区域的前端侧的下边缘部分整体连续的基座部分,并且具有沿垂直方向延伸的假想轴线倾斜的下侧; 以及从基座部分的下侧突出并具有与假想轴正交的尖端的接触部分。 因此,可以精确地确定尖端的位置。

    Probe use in electric test
    19.
    发明申请
    Probe use in electric test 审中-公开
    探头用于电气测试

    公开(公告)号:US20070018633A1

    公开(公告)日:2007-01-25

    申请号:US11436674

    申请日:2006-05-19

    IPC分类号: G01R31/02

    CPC分类号: G01R1/06733 G01R1/06727

    摘要: A probe comprises a body member having a front end area and supported on a support member in a cantilever state, and a tip member combined with the front end area of the body member. The tip member includes a base portion with at least a part of the tip member embedded in the front end area; a contact portion to be pressed against a device under test and projecting from the base portion in a second direction; and a reference portion formed at a position spaced apart from the contact portion in a first direction and projecting from the base portion in the second direction intersecting the first direction, and is made of a harder material than the body member.

    摘要翻译: 探针包括具有前端区域并以悬臂状态支撑在支撑构件上的主体构件,以及与主体构件的前端区域结合的末端构件。 尖端构件包括:基部,其顶端构件的至少一部分嵌入前端区域; 接触部分,被压靠在被测设备上并从第二方向从基部突出; 以及基准部,其形成在与所述接触部在第一方向间隔开的位置,并且在与所述第一方向交叉的所述第二方向上从所述基部突出,并且由比所述主体部件更硬的材料制成。