摘要:
A document detection system using a detection result presentation that can facilitate a user's quick comprehension of the relevancy of each detected document. In this system, a user's input for commanding a document detection is analyzed to extract keywords and viewpoints relevant to each keyword contained in the user's input, and a detection command is constructed from the keywords and the viewpoints extracted from the user's input. Then, the detection operation is executed to detect those documents among a plurality of stored documents which match with the constructed detection command as detected documents for a detection result. The detection result can be presented in the multi-dimensional display formed by setting the viewpoints to axes with the detection command as an origin and using distances of the detected documents with respect to the origin for each viewpoint as coordinates of the detected documents with respect to each axis representing each viewpoint.
摘要:
A machine translation system capable of obtaining a consistent translation for an entire document by taking context into account in translating each word or sentence. In this system, document information necessary to remove uncertainty in the translation due to a presence of a plurality of candidates for the translation is utilized whenever uncertainity due to a presence of a plurality of candidates for the translation arises by attempting to translate according to a translation dictionary containing rules for translation.
摘要:
A method for manufacturing a probed for an electrical test includes producing by a deposition technique a deposit including a probe main body portion made of a nickel-boron alloy and a probe tip portion projecting downward from the probe main body portion and made of a different conductive material from the probe main body portion. The method further includes annealing the deposit. The average grain diameter of the nickel-boron alloy is between 97 Å and 170 Å. The contained amount of boron is from 0.02 wt % to 0.20 wt %.
摘要:
A probe for current test comprising: a probe body having a plate-like connection portion whose end face becomes a connection face to a probe board; a solder layer formed on at least one side face of said connection portion; and a guide portion formed on the connection portion, penetrating the connection portion in its thickness direction from the one side face with the solder layer formed to the other side face, and when the solder layer is melted, capable of guiding a portion thereof to the other side face.
摘要:
A probe tip section of an electrical test probe has a laminated structure consisting of a first deposition portion and a second deposition portion covering the first deposition portion, and by the laminated structure, a maximum cross-sectional area portion at which the cross-sectional area of the probe tip section is increased to a base portion is provided between a tip end of the probe tip section and the base portion in the probe tip section. At the maximum cross-sectional area portion, a dimension in the X direction as seen on a flat surface perpendicular to a protruding direction of the probe tip section is increased in a one-dimensional way, and in addition, a dimension in the Y direction perpendicular to the X direction is increased from the tip end toward the base portion, as a result of which the cross-sectional area of the probe tip section can be increased in a two-dimensional way. Thus, the cross-sectional area at the maximum cross-sectional area portion reaching the base portion of the probe tip section can be made to be larger than in the conventional case, and along with the increase of the cross-sectional area, the stress acting on the base portion can be lowered.
摘要:
A probe formed on a base table is detached from the base table without giving damage on the probe. The present invention provides a probe manufacturing method comprising the steps of forming on a sacrificial layer on a base table a recess exposing the sacrificial layer with a resist, depositing a probe material in the recess to form a probe and then removing the resist, leaving part of the sacrificial layer and removing the rest by an etching process, and detaching from the base table the probe held on the base table by the remaining part of the sacrificial layer. In the recess of the resist are formed a main body part corresponding to a flat surface shape of the probe and an auxiliary part continuing into the main body part. The probe is formed by deposition of the material at the main body part, and a holding portion is formed by deposition of the material at the auxiliary part. The auxiliary part is formed in a flat surface shape sufficient for a sacrificial layer part under the holding portion to remain when a sacrificial layer part under the probe is removed by the etching process. The probe is separated from the holding portion after the sacrificial layer part under the probe is removed and while the sacrificial layer part under the holding portion remains.
摘要:
A probe for electrical test comprises a probe body having a base end attached to a support base plate through a solder and a front end continuous with said base end and a surface layer showing a conductivity higher than that of the probe body and a solder wettability higher than that of the probe body and extending on the surface of the probe body from the base end to the front end. In the vicinity of the base end of the surface layer, a shield region having a smaller solder wettability than that of the surface layer is formed across the surface layer.
摘要:
A probe includes an arm region extending in the back and forth direction, and a tip region extending downward from the front end portion of the arm region. The tip region has a pedestal portion integrally continuous to a lower edge portion at the front end side of the arm region and having an underside inclined to an imaginary axis extending in the vertical direction; and a contact portion projected from the underside of the pedestal portion and having a tip orthogonal to an imaginary axis. Thus, the position of the tip can be accurately determined.
摘要:
A probe comprises a body member having a front end area and supported on a support member in a cantilever state, and a tip member combined with the front end area of the body member. The tip member includes a base portion with at least a part of the tip member embedded in the front end area; a contact portion to be pressed against a device under test and projecting from the base portion in a second direction; and a reference portion formed at a position spaced apart from the contact portion in a first direction and projecting from the base portion in the second direction intersecting the first direction, and is made of a harder material than the body member.
摘要:
An expression pattern in a document and the data describing related information associated with the output information to obtain the output information corresponding to the expression pattern are inputted. An expression pattern in a document on a computer network is sensed by reference to the expression pattern in the data. The output information corresponding to the sensed expression pattern is created from a document on the computer network on the basis of the related information in the inputted data.