Processor isolation method for integrated multi-processor systems
    12.
    发明授权
    Processor isolation method for integrated multi-processor systems 失效
    集成多处理器系统的处理器隔离方法

    公开(公告)号:US06681341B1

    公开(公告)日:2004-01-20

    申请号:US09432526

    申请日:1999-11-03

    IPC分类号: G06F1100

    CPC分类号: G06F11/2242

    摘要: A processor isolation technique enhances debug capability in a highly integrated multiprocessor circuit containing a programmable arrayed processing engine for efficiently processing transient data within an intermediate network station of a computer network. The technique comprises a mechanism for programming a code entry point for each processor of a processor complex utilizing a register set that is accessible via an out-of-band bus coupled to a remote processor of the engine. The programmable entry point mechanism operates in conjunction with a bypass capability that passes transient data through a processor complex that is not functional, not running or otherwise unable to process data. Another aspect of the debug technique involves the ability to override completion control signals provided by each processor complex in order to advance a pipeline of the processing engine.

    摘要翻译: 处理器隔离技术在包含可编程阵列处理引擎的高度集成的多处理器电路中增强了调试能力,用于有效地处理计算机网络的中间网络站内的瞬态数据。 该技术包括一种用于使用可经由耦合到发动机的远程处理器的带外总线访问的寄存器组来对处理器复合体的每个处理器进行编码入口点的机制。 可编程入口点机制与旁路能力相结合,该旁路能力通过不起作用或以其他方式不能处理数据的处理器复合体传递瞬态数据。 调试技术的另一方面涉及覆盖由每个处理器复合体提供的完成控制信号以提升处理引擎的流水线的能力。

    Testing of replicated components of electronic device
    13.
    发明授权
    Testing of replicated components of electronic device 有权
    测试电子设备的复制组件

    公开(公告)号:US06385747B1

    公开(公告)日:2002-05-07

    申请号:US09212314

    申请日:1998-12-14

    IPC分类号: G11C2900

    CPC分类号: G11C29/48 G11C29/40

    摘要: A technique is provided for use in testing replicated components (e.g., identical circuit components) of an electronic device for defects. In one aspect of this testing technique, the same test inputs may be broadcast, in parallel, from a single test interface to each of the replicated components of the electronic device under test. Respective test outputs generated by the replicated components in response to the test inputs may be supplied to a comparator, comprised in the electronic device, that compares the respective test outputs to each other and generates a fault signal if corresponding test outputs are not identical. This fault signal may be supplied to an external test interface pin of the single test interface, and its assertion may indicate that one or more of the replicated components may be defective. The respective test outputs may be multiplexed to permit output via an external interface of respective test outputs from a selected component. These respective test outputs may be compared to expected values therefor whereby to determine presence and/or nature of defects in the replicated components.

    摘要翻译: 提供了用于测试用于缺陷的电子设备的复制组件(例如,相同的电路组件)的技术。 在该测试技术的一个方面,相同的测试输入可以并行地从单个测试接口广播到被测试的电子设备的每个复制组件。 响应于测试输入而由复制组件生成的各个测试输出可以被提供给包括在电子设备中的比较器,其将相应的测试输出彼此进行比较,并且如果相应的测试输出不相同则产生故障信号。 该故障信号可以被提供给单个测试接口的外部测试接口引脚,并且其断言可以指示一个或多个复制部件可能是有缺陷的。 相应的测试输出可以被多路复用以允许经由所选择的组件的相应测试输出的外部接口的输出。 这些各自的测试输出可以与期望值进行比较,从而确定复制组件中的缺陷的存在和/或性质。