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公开(公告)号:US20230123000A1
公开(公告)日:2023-04-20
申请号:US18082520
申请日:2022-12-15
Applicant: Psiquantum, Corp.
Inventor: Vimal Kumar Kamineni , Matteo Staffaroni , Faraz Najafi , Ann Melnichuk , George Kovall , Yong Liang
Abstract: A device includes a substrate, a dielectric layer on the substrate, a waveguide within the dielectric layer, and a photodetector optically coupled to the waveguide. The photodetector is disposed above the waveguide layer and is monolithically integrated with the substrate. The photodetector is configured to operate at low temperatures, such as below about 50 K or about 20 K. In some embodiments, the monolithic photonic device includes thermal isolation structures and optical isolation structures. Techniques for manufacturing the monolithic photonic device, including the thermal isolation structures and optical isolation structures, are also described.
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公开(公告)号:US20230018940A1
公开(公告)日:2023-01-19
申请号:US17377131
申请日:2021-07-15
Applicant: Psiquantum, Corp.
Inventor: Yong Liang , Vimal Kumar Kamineni , Chia-Ming Chang , James McMahon
Abstract: In some embodiments method comprises depositing a ferroelectric layer on a top surface of a semiconductor wafer and forming one or more gaps in the ferroelectric layer. The one or more gaps can be formed on a repetitive spacing to relieve stresses between the ferroelectric layer and the semiconductor wafer. A first dielectric layer is deposited over the ferroelectric layer and the first dielectric layer is planarized to fill in the gaps. A second dielectric layer is formed between the ferroelectric layer and the semiconductor wafer. The second dielectric layer can be formed by annealing the wafer in an oxidizing atmosphere such that an upper portion of the semiconductor substrate forms an oxide layer between the semiconductor substrate and the ferroelectric layer.
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公开(公告)号:US20230349067A1
公开(公告)日:2023-11-02
申请号:US18142415
申请日:2023-05-02
Applicant: Psiquantum, Corp.
Inventor: Yong Liang , John Elliott Ortmann, JR. , John Berg , Ann Melnichuk
CPC classification number: C30B23/002 , G06T7/001 , C30B29/32 , C30B23/02 , G06T2207/30108 , G06T2207/20081
Abstract: A method of forming a film comprises growing, using a deposition system, at least a portion of the film and analyzing, using a RHEED instrument, the at least a portion of the film. Using a computer, data is acquired from the RHEED instrument that is indicative of a stoichiometry of the at least a portion of the film. Using the computer, adjustments to one or more process parameters of the deposition system are calculated to control stoichiometry of the film during subsequent deposition. Using the computer, instructions are transmitted to the deposition system to execute the adjustments of the one or more process parameters. Using the deposition system, the one or more process parameters are adjusted.
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公开(公告)号:US11680337B2
公开(公告)日:2023-06-20
申请号:US17219970
申请日:2021-04-01
Applicant: Psiquantum, Corp.
Inventor: Yong Liang , John Elliott Ortmann, Jr. , John Berg , Ann Melnichuk
CPC classification number: C30B23/002 , C30B23/02 , C30B29/32 , G06T7/001 , G06T2207/20081 , G06T2207/30108
Abstract: A method of forming a film comprises growing, using a deposition system, at least a portion of the film and analyzing, using a RHEED instrument, the at least a portion of the film. Using a computer, data is acquired from the RHEED instrument that is indicative of a stoichiometry of the at least a portion of the film. Using the computer, adjustments to one or more process parameters of the deposition system are calculated to control stoichiometry of the film during subsequent deposition. Using the computer, instructions are transmitted to the deposition system to execute the adjustments of the one or more process parameters. Using the deposition system, the one or more process parameters are adjusted.
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公开(公告)号:US11615954B2
公开(公告)日:2023-03-28
申请号:US16791914
申请日:2020-02-14
Applicant: PsiQuantum Corp.
Inventor: Yong Liang
Abstract: A method for processing a substrate includes positioning a silicon substrate in a deposition chamber. One or more intermediate layers are deposited on a surface of the silicon. The one or more intermediate layers can include strontium, which combines with the silicon to form strontium silicide. Alternatively, the one or more intermediate layers comprise germanium. A layer of amorphous strontium titanate is deposited on the one or more intermediate layers in a transient environment in which oxygen pressure is reduced while temperature is increased. The substrate is then exposed to an oxidizing and annealing atmosphere that oxidizes the one or more intermediate layers and converts the layer of amorphous strontium titanate to crystalline strontium titanate.
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公开(公告)号:US20210242651A1
公开(公告)日:2021-08-05
申请号:US17239085
申请日:2021-04-23
Applicant: Psiquantum, Corp.
Inventor: Eric Dudley , Yong Liang , Faraz Najafi , Vimal Kamineni , Ann Melnichuk
Abstract: An optical device includes a substrate, a dielectric layer on the substrate, a waveguide within the dielectric layer, a light sensitive component (e.g., a photodetector) in the dielectric layer and coupled to the waveguide, and a plurality of light isolation structures in at least one of the substrate or the dielectric layer and configured to prevent stray light from reaching the light sensitive component. In some embodiments, a light isolation structure in the plurality of light isolation structures includes two opposing sidewalls and a filling material between the two opposing sidewalls. The two opposing sidewalls include an optical isolation layer. The filling material is characterized by a coefficient of thermal expansion (CTE) matching a CTE of at least one of the substrate or the dielectric layer.
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公开(公告)号:US20210124233A1
公开(公告)日:2021-04-29
申请号:US17083141
申请日:2020-10-28
Applicant: PSIQUANTUM, CORP.
Inventor: Yong Liang , Mark G. Thompson , Chia-Ming Chang , Vimal Kumar Kamineni
Abstract: An electro-optic device includes a substrate and a waveguide on the substrate. The waveguide includes a layer stack including a plurality of electro-optic material layers interleaved with a plurality of interlayers, a waveguide core adjacent to the layer stack, a waveguide cladding layer, and a pair of electrodes in electrical contact with the plurality of electro-optic material layers. The plurality of interlayers maintains a first lattice structure at room temperature and a cryogenic temperature. The plurality of electro-optic material layers maintains a second lattice structure and crystallographic phase at the room temperature and the cryogenic temperature.
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公开(公告)号:US20210028015A1
公开(公告)日:2021-01-28
申请号:US16791948
申请日:2020-02-14
Applicant: PsiQuantum Corp.
Inventor: Yong Liang , Vimal Kumar Kamineni
Abstract: A method for removing a native oxide film from a semiconductor substrate includes repetitively depositing layers of germanium on the native oxide and heating the substrate causing the layer of germanium to form germanium oxide, desorbing a portion of the native oxide film. The process is repeated until the oxide film is removed. A subsequent layer of strontium titanate can be deposited on the semiconductor substrate, over either residual germanium or a deposited germanium layer. The germanium can be converted to silicon germanium oxide by exposing the strontium titanate to oxygen.
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公开(公告)号:US12037700B2
公开(公告)日:2024-07-16
申请号:US18142415
申请日:2023-05-02
Applicant: Psiquantum, Corp.
Inventor: Yong Liang , John Elliott Ortmann, Jr. , John Berg , Ann Melnichuk
CPC classification number: C30B23/002 , C30B23/02 , C30B29/32 , G06T7/001 , G06T2207/20081 , G06T2207/30108
Abstract: A method of forming a film comprises growing, using a deposition system, at least a portion of the film and analyzing, using a RHEED instrument, the at least a portion of the film. Using a computer, data is acquired from the RHEED instrument that is indicative of a stoichiometry of the at least a portion of the film. Using the computer, adjustments to one or more process parameters of the deposition system are calculated to control stoichiometry of the film during subsequent deposition. Using the computer, instructions are transmitted to the deposition system to execute the adjustments of the one or more process parameters. Using the deposition system, the one or more process parameters are adjusted.
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公开(公告)号:US20240063146A1
公开(公告)日:2024-02-22
申请号:US18500504
申请日:2023-11-02
Applicant: Psiquantum, Corp.
Inventor: Yong Liang , Vimal Kumar Kamineni , Chia-Ming Chang , James McMahon
CPC classification number: H01L23/562 , H01L21/02186 , H01L27/1203
Abstract: A wafer includes a silicon layer, a first dielectric layer on the silicon layer, and a ferroelectric layer on the first dielectric layer. The ferroelectric layer defines one or more gaps between portions of the ferroelectric layer. The wafer also includes a second dielectric layer on the ferroelectric layer and disposed within the one or more gaps.
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