Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point
    11.
    发明授权
    Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point 失效
    用光斑显微镜观察至少一个样品区域的过程,该光栅显微镜具有点状形式的光分布

    公开(公告)号:US07271382B2

    公开(公告)日:2007-09-18

    申请号:US10967636

    申请日:2004-10-19

    摘要: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

    摘要翻译: 用于通过第一扫描装置沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样本区域的过程,其中照明光平行照射样本 在多个点或区域处,同时检测多个点或区域,其中相对于相对运动的平面成一角度,优选垂直于其,第二扫描装置被移动,并且通过第一和第二扫描装置 被耦合,并且通过样品的照射来完成三维采样运动,其中第二扫描装置以这样的方式耦合到第一扫描装置的运动,使得直线和/或曲线和/或平面和/或 扫描沿着第一扫描线的至少一个扫描方向延伸的曲面 g装置以及沿着第二扫描装置的扫描方向。

    Process for the observation of at least one sample region with a light raster microscope
    14.
    发明授权
    Process for the observation of at least one sample region with a light raster microscope 有权
    用光栅显微镜观察至少一个样品区域的方法

    公开(公告)号:US07459698B2

    公开(公告)日:2008-12-02

    申请号:US11590851

    申请日:2006-11-01

    IPC分类号: G01N21/64

    CPC分类号: G02B21/0076 G02B21/0048

    摘要: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via a first scanner along at least one scanning axis essentially perpendicular to the illumination axis wherein at an angle to the plane of the relative movement, preferably perpendicular thereto a second scanner is moved and an image acquisition takes place by the movement of the first and second scanners being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanner is coupled to the movement of the first scanner in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanner as well as along the scanning direction of the second scanner.

    摘要翻译: 用于利用光栅显微镜通过第一扫描器沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样本之间的相对运动来观察至少一个样本区域的过程,其中, 相对运动,优选地垂直于其,第二扫描器被移动,并且通过被耦合的第一和第二扫描器的运动而进行图像采集,并且三维采样运动是通过样本的照射进行的,其中第二扫描器耦合到 第一扫描器的运动以这样的方式扫描直线和/或曲线和/或平面和/或曲面,其沿着第一扫描仪的至少一个扫描方向以及沿着第一扫描仪的扫描方向延伸 第二台扫描仪

    Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point
    17.
    发明申请
    Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point 失效
    用光斑显微镜观察至少一个样品区域的过程,该光栅显微镜具有点状形式的光分布

    公开(公告)号:US20060011824A1

    公开(公告)日:2006-01-19

    申请号:US10967636

    申请日:2004-10-19

    IPC分类号: H01J40/14 H01J7/24

    摘要: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

    摘要翻译: 用于通过第一扫描装置沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样本区域的过程,其中照明光平行照射样本 在多个点或区域处,同时检测多个点或区域,其中相对于相对运动的平面成一角度,优选垂直于其,第二扫描装置被移动,并且通过第一和第二扫描装置 被耦合,并且通过样品的照射来完成三维采样运动,其中第二扫描装置以这样的方式耦合到第一扫描装置的运动,使得直线和/或曲线和/或平面和/或 扫描沿着第一扫描线的至少一个扫描方向延伸的曲面 g装置以及沿着第二扫描装置的扫描方向。

    Process for the observation of at least one sample region with a light raster microscope with linear sampling
    18.
    发明申请
    Process for the observation of at least one sample region with a light raster microscope with linear sampling 有权
    用线性采样的光栅显微镜观察至少一个样品区域的方法

    公开(公告)号:US20060011804A1

    公开(公告)日:2006-01-19

    申请号:US10967341

    申请日:2004-10-19

    IPC分类号: G02B27/40

    摘要: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

    摘要翻译: 用于通过第一扫描装置沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样品区的方法,其中几个照亮的样品点位于一条线上 并且与空间分辨检测器同时检测器,其中相对于相对运动的平面,优选地与其垂直的平面移动第二扫描装置,并且通过耦合的第一和第二扫描装置的运动和 三维采样运动通过样品的照射来完成,其中第二扫描装置以扫描直线和/或曲线和/或平面和/或曲面扫描的方式与第一扫描装置的运动耦合 其沿着第一扫描装置的至少一个扫描方向以及沿着第一扫描装置的至少一个扫描方向延伸 第二扫描装置的扫描方向。

    Light scanning electron microscope and use
    19.
    发明申请
    Light scanning electron microscope and use 审中-公开
    光扫描电子显微镜和使用

    公开(公告)号:US20060012785A1

    公开(公告)日:2006-01-19

    申请号:US10967330

    申请日:2004-10-19

    IPC分类号: G01J3/44 G01N21/65

    摘要: In a confocal laser scanning microscope for Raman spectroscopy with an illuminating configuration (2), which provides an illuminating beam for illuminating a probe region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the probe while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated probe region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the probe f while scanning and that the confocal aperture is designed as a slotted aperture (26) or as a slot-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.

    摘要翻译: 在具有照明配置(2)的拉曼光谱的共焦激光扫描显微镜中,其提供用于照射探针区域(23)的照明光束,其具有扫描配置(3,4),其将照射光束引导到探针上,同时 扫描和检测器配置(5),其经由扫描配置(3,4)通过共焦孔(26)将照射的探测区域(23)图像到至少一个检测器单元(28)上, 提供扫描配置(3,4)的照明配置(2)提供线形照明光束,扫描配置(3,4)在扫描时将线形照明光束引导到探头f上,而在扫描结构 共焦孔被设计为开槽孔(26)或作为用作共焦孔的检测器单元(28)的槽形区域(28,48)。

    Light scanning microscope and use
    20.
    发明授权
    Light scanning microscope and use 有权
    光扫描显微镜和使用

    公开(公告)号:US07561326B2

    公开(公告)日:2009-07-14

    申请号:US10967638

    申请日:2004-10-19

    IPC分类号: G02B21/00 G02B21/06

    摘要: In a confocal laser scanning microscope with an illuminating configuration (2), which provides an illuminating beam for illuminating a specimen region (23), with a scanning configuration (3, 4), which guides the illuminating beam over the specimen while scanning, and with a detector configuration (5), which via the scanning configuration (3, 4) images the illuminated specimen region (23) by means of a confocal aperture (26) on to at least one detector unit (28), it is provided that the illuminating configuration (2) of the scanning configuration (3, 4) provides a line-shaped illuminating beam, that the scanning configuration (3, 4) guides the line-shaped illuminating beam over the specimen f while scanning and that the confocal aperture is designed as a slit aperture (26) or as a slit-shaped region (28, 48) of the detector unit (28) acting as a confocal aperture.

    摘要翻译: 在具有照射配置(2)的共焦激光扫描显微镜中,其提供用于照射样本区域(23)的照明光束,其具有扫描配置(3,4),其在扫描时将照射光束引导到样本上;以及 具有检测器配置(5),其通过扫描配置(3,4)通过共焦孔(26)将照射的样品区域(23)图像到至少一个检测器单元(28)上, 扫描配置(3,4)的照明配置(2)提供线状照明光束,扫描配置(3,4)在扫描时将线状照射光束引导到样本f上,并且共焦孔 被设计为狭缝孔(26)或作为用作共焦孔的检测器单元(28)的狭缝形区域(28,48)。