Abstract:
A continuous time, sigma-delta analog-to-digital converter circuit includes a sigma-delta modulator circuit configured to receive an analog input signal. A single bit quantizer of the modulator generates a digital output signal at a sampling frequency. A data storage circuit stores bits of the digital output signal and digital-to-analog converter (DAC) elements are actuated in response to the stored bits to generate an analog feedback signal for comparison to the analog input signal. A filter circuit includes polyphase signal processing paths and a summation circuit configured to sum outputs from the polyphase signal processing paths to generate a converted output signal. A fan out circuit selectively applies the stored bits from the data storage circuit to inputs of the polyphase signal processing paths of the filter circuit.
Abstract:
A circuit and methods of operation thereof are provided for robust protection against soft errors. The circuit includes a first set of storage elements coupled to and configured to sample a set of data inputs at a first set of times. The circuit includes a second set of storage elements coupled to and configured to sample the set of data inputs at a second set of times. A first parity generator generates a first parity check for the set of data inputs and a second parity generator generates a second parity check for output of the first set of storage elements. An error correction unit compares the first parity check and the second parity check to detect occurrences of error conditions in the circuit. The error correction unit may control output or operating characteristics of the circuit as a result of error conditions detected.
Abstract:
Disclosed is a system and method for providing a critical path replica system in a circuit. A critical path replica system is created by determining a critical path in a circuit, generating a critical path replica circuit, generating a circuit blueprint, and creating the blueprinted circuit. The circuit comprises a functional logic module having functional logic elements and replica logic modules having logic elements. Each logic element is configured to replicate one or more of the functional logic elements and process a test signal. A replica error detection module analyzes the processed signal to determine whether a timing violation has occurred. In some embodiments, the replica logic module further comprises one or more load modules. A replica controller may modify operation of the circuit based on reported errors. A replica mode select module sets the replica logic module to an aging test mode or a timing sensor mode.
Abstract:
An embodiment of a circuit includes a data latch and a plurality of cascaded latches, wherein a first of the plurality of cascaded latches is configured to receive a first signal from the data latch and each subsequent cascaded latch is configured to receive a data output signal of a preceding cascaded latch, and an error-detection circuit configured to receive the respective data output signals and detect error in operation of the cascaded latches based thereon.
Abstract:
The present disclosure relates to a low consumption flip-flop circuit with data retention, comprising at least one flip-flop and at least one retention cell connected to the output of the flip-flop and configured so that during normal operation of the flip-flop circuit, the retention cell transmits the data or logic state present on the output terminal of the flip-flop to its own output terminal, while during low consumption operation of the flip-flop circuit a latch circuit of the retention cell suitable to memorize data or a logic state corresponding to the last data or logic state present on the output terminal of the flip-flop is activated.
Abstract:
The present disclosure relates to a low consumption flip-flop circuit with data retention, comprising at least one flip-flop and at least one retention cell connected to the output of the flip-flop and configured so that during normal operation of the flip-flop circuit, the retention cell transmits the data or logic state present on the output terminal of the flip-flop to its own output terminal, while during low consumption operation of the flip-flop circuit a latch circuit of the retention cell suitable to memorize data or a logic state corresponding to the last data or logic state present on the output terminal of the flip-flop is activated.