Abstract:
A semiconductor device, including first and second fin patterns separated by a first trench; a gate electrode intersecting the first and second fin patterns; and a contact on at least one side of the gate electrode, the contact contacting the first fin pattern, the contact having a bottom surface that does not contact the second fin pattern, a height from a bottom of the first trench to a topmost end of the first fin pattern in a region in which the contact intersects the first fin pattern being a first height, and a height from the bottom of the first trench to a topmost end of the second fin pattern in a region in which an extension line of the contact extending along a direction in which the gate electrode extends intersects the second fin pattern being a second height, the first height being smaller than the second height.
Abstract:
An electronic device and a method for reproducing a sound in the electronic device are provided. The electronic device includes a touchscreen displaying a keyboard having a plurality of keys and a plurality of sound source buttons corresponding respectively to a plurality of different sound sources, a processor connected electrically to the touchscreen, and a memory connected electrically to the processor, wherein the memory stores instructions that are executed to cause the processor to perform control such that when an input to at least one key among the plurality of keys is received, the sound source corresponding to at least one sound source button selected among the plurality of sound source buttons is reproduced as a sound corresponding to the received input.
Abstract:
A semiconductor device includes a first fin-type pattern and a second fin-type pattern which protrude upwardly from an upper surface of a field insulating film and extend in a first direction. A gate structure intersects the first fin-type pattern and the second fin-type pattern. A first epitaxial layer is on the first fin-type pattern on at least one side of the gate structure, and a second epitaxial layer is on the second fin-type pattern on at least one side of the gate structure. A metal contact covers outer circumferential surfaces of the first epitaxial layer and the second epitaxial layer. The first epitaxial layer contacts the second epitaxial layer.
Abstract:
In a method of manufacturing a semiconductor device, a substrate is etched to form active fins spaced apart from one another in a first direction, and each active fin extends in the first direction. An isolation pattern is formed on the substrate to partially fill a space between the active fins. A mold pattern is formed on the isolation pattern, the mold pattern covering at least a portion of each of the active fins and including an opening exposing a portion of the isolation pattern between the active fins in the first direction. An insulation pattern is formed to fill the opening. The mold pattern is removed to expose the active fins. A gate structure and a dummy structure are formed on the exposed active fins and the insulation pattern, respectively, the gate structure and the dummy structure extending in a second direction substantially perpendicular to the first direction.