Top-Down Fabrication Method for Forming a Nanowire Transistor Device
    11.
    发明申请
    Top-Down Fabrication Method for Forming a Nanowire Transistor Device 有权
    用于形成纳米线晶体管器件的自顶向下制造方法

    公开(公告)号:US20150053925A1

    公开(公告)日:2015-02-26

    申请号:US13974095

    申请日:2013-08-23

    CPC classification number: G01N27/4145 H01L29/66439 H01L29/775

    Abstract: The present disclosure relates to a top-down method of forming a nanowire structure extending between source and drain regions of a nanowire transistor device, and an associated apparatus. In some embodiments, the method provides a substrate having a device layer disposed over a first dielectric layer. The device layer has a source region and a drain region separated by a device material. The first dielectric layer has an embedded gate structure abutting the device layer. One or more masking layers are selectively formed over the device layer to define a nanowire structure. The device layer is then selectively etched according to the one or more masking layers to form a nanowire structure at a position between the source region and the drain region. By forming the nanowire structure through a masking and etch process, the nanowire structure is automatically connected to the source and drain regions.

    Abstract translation: 本发明涉及形成在纳米线晶体管器件的源极和漏极区域之间延伸的纳米线结构的自顶向下的方法,以及相关联的器件。 在一些实施例中,该方法提供了具有设置在第一介电层上的器件层的衬底。 器件层具有由器件材料分离的源极区域和漏极区域。 第一电介质层具有邻接器件层的嵌入式栅极结构。 选择性地在器件层上形成一个或多个掩模层以限定纳米线结构。 然后根据一个或多个掩模层选择性地蚀刻器件层,以在源极区域和漏极区域之间的位置处形成纳米线结构。 通过掩模和蚀刻工艺形成纳米线结构,纳米线结构自动连接到源区和漏区。

    Fluid deposition appartus and method

    公开(公告)号:US10155244B2

    公开(公告)日:2018-12-18

    申请号:US14027368

    申请日:2013-09-16

    Abstract: The present disclosure relates to a micro-fluidic probe card that deposits a fluidic chemical onto a substrate with a minimal amount of fluidic chemical waste, and an associated method of operation. In some embodiments, the micro-fluidic probe card has a probe card body with a first side and a second side. A sealant element, which contacts a substrate, is connected to the second side of the probe card body in a manner that forms a cavity within an interior of the sealant element. A fluid inlet, which provides a fluid from a processing tool to the cavity, is a first conduit extending between the first side and the second side of the probe card body. A fluid outlet, which removes the fluid from the cavity, is a second conduit extending between the first side and the second side of the probe card body.

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