公开(公告)号：US5313031A

公开(公告)日：1994-05-17

申请号：US809325

申请日：1991-12-18

申请人： Mitsugu Takahashi ,  Takao Mitsuhashi ,  Kenichi Nishina

发明人： Mitsugu Takahashi ,  Takao Mitsuhashi ,  Kenichi Nishina

IPC分类号： H01H9/44 ,  H01H1/06

CPC分类号： H01H9/44

摘要： A switch is configured that: in the closed-circuit state, at least part of its movable contact arm enters into a oblong generally hexahedral space defined by its elongated stationary conductor in its closed circuit position. Both contacting and breaking of the moving contact and the fixed contact occur in the space. Overall electromagnetic forces generated by the current flowing through the stationary conductor, movable contact arm and the arc induced at the time of breaking effectively act to extend the arc toward a terminal section of the stationary conductor and to increase the arc resistance at the time just after the breaking of both the contacts.

摘要翻译： 开关被配置为：在闭路状态下，其可动接触臂的至少一部分进入由其细长的固定导体在其闭合位置限定的长方形的大致六面体空间。 活动触点和固定触点的接触和断开都发生在空间中。 由流过静电导体的电流产生的总体电磁力，可动接触臂和断路时感应的电弧有效地将电弧延伸到固定导体的端子部分，并且在刚刚之后的时间点增加电弧电阻 打破了两个联系人。

公开(公告)号：US07554173B2

公开(公告)日：2009-06-30

申请号：US11722112

申请日：2005-12-19

申请人： Takashi Inaguchi ,  Takeshi Ohi ,  Katsuhiko Fukuhara ,  Naoshi Yamada ,  Yoshitsugu Inaba ,  Takao Mitsuhashi

发明人： Takashi Inaguchi ,  Takeshi Ohi ,  Katsuhiko Fukuhara ,  Naoshi Yamada ,  Yoshitsugu Inaba ,  Takao Mitsuhashi

IPC分类号： H01L29/00

CPC分类号： H01L29/7395 ,  G01K7/22 ,  H01L23/24 ,  H01L23/34 ,  H01L24/48 ,  H01L2224/0401 ,  H01L2224/05647 ,  H01L2224/48091 ,  H01L2224/48137 ,  H01L2224/8592 ,  H01L2924/00014 ,  H01L2924/01012 ,  H01L2924/01019 ,  H01L2924/0102 ,  H01L2924/01057 ,  H01L2924/01067 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/1301 ,  H01L2924/1305 ,  H01L2924/13055 ,  H01L2924/13091 ,  H01L2924/19107 ,  H01L2924/3011 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A semiconductor device accurately monitoring temperature of a semiconductor chip even in a noisy environment, while not requiring a highly accurate detection circuit. A PTC element is bonded onto an IGBT chip. Then, a constant current flows from a constant current source through the PTC element, and an output voltage of the PTC element is detected by a voltage monitor. When output voltage increases, a voltage applied to a gate electrode by a detection circuit is decreased. Since the PTC element is directly arranged on the IGBT chip, the temperature of the IGBT chip can be monitored with high accuracy. Further, since the change in output voltage of the PTC element per 1° C. is large, a highly accurate detection circuit is not necessary, thereby allowing accurate monitoring of the temperature of the IGBT chip even in a noisy environment.

摘要翻译： 半导体器件即使在嘈杂的环境中也能准确地监测半导体芯片的温度，同时不需要高精度的检测电路。 PTC元件接合在IGBT芯片上。 然后，恒定电流从恒定电流源流过PTC元件，并且通过电压监视器检测PTC元件的输出电压。 当输出电压升高时，由检测电路施加到栅电极的电压降低。 由于PTC元件直接配置在IGBT芯片上，因此可以高精度地监视IGBT芯片的温度。 此外，由于PTC元件每1℃的输出电压变化大，因此不需要高精度的检测电路，因此即使在嘈杂的环境下也能够精确地监视IGBT芯片的温度。

公开(公告)号：US20080006897A1

公开(公告)日：2008-01-10

申请号：US11722112

申请日：2005-12-19

申请人： Takashi Inaguchi ,  Takeshi Ohi ,  Katsuhiko Fukuhara ,  Naoshi Yamada ,  Yoshitsugu Inaba ,  Takao Mitsuhashi

发明人： Takashi Inaguchi ,  Takeshi Ohi ,  Katsuhiko Fukuhara ,  Naoshi Yamada ,  Yoshitsugu Inaba ,  Takao Mitsuhashi

IPC分类号： H01L23/34

CPC分类号： H01L29/7395 ,  G01K7/22 ,  H01L23/24 ,  H01L23/34 ,  H01L24/48 ,  H01L2224/0401 ,  H01L2224/05647 ,  H01L2224/48091 ,  H01L2224/48137 ,  H01L2224/8592 ,  H01L2924/00014 ,  H01L2924/01012 ,  H01L2924/01019 ,  H01L2924/0102 ,  H01L2924/01057 ,  H01L2924/01067 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/1301 ,  H01L2924/1305 ,  H01L2924/13055 ,  H01L2924/13091 ,  H01L2924/19107 ,  H01L2924/3011 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A semiconductor device accurately monitoring temperature of a semiconductor chip even in a noisy environment, while not requiring a highly accurate detection circuit. A PTC element is bonded onto an IGBT chip. Then, a constant current flows from a constant current source through the PTC element, and an output voltage of the PTC element is detected by a voltage monitor. When output voltage increases, a voltage applied to a gate electrode by a detection circuit is decreased. Since the PTC element is directly arranged on the IGBT chip, the temperature of the IGBT chip can be monitored with high accuracy. Further, since the change in output voltage of the PTC element per 1° C. is large, a highly accurate detection circuit is not necessary, thereby allowing accurate monitoring of the temperature of the IGBT chip even in a noisy environment.

摘要翻译： 半导体器件即使在嘈杂的环境中也能准确地监测半导体芯片的温度，同时不需要高精度的检测电路。 PTC元件接合在IGBT芯片上。 然后，恒定电流从恒定电流源流过PTC元件，并且通过电压监视器检测PTC元件的输出电压。 当输出电压升高时，由检测电路施加到栅电极的电压降低。 由于PTC元件直接配置在IGBT芯片上，因此可以高精度地监视IGBT芯片的温度。 此外，由于PTC元件每1℃的输出电压变化大，因此不需要高精度的检测电路，因此即使在嘈杂的环境下也能够精确地监视IGBT芯片的温度。