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公开(公告)号：US10753961B2
公开(公告)日：2020-08-25
申请号：US15687316
申请日：2017-08-25
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , David T. Engquist , Richard A. Booman
Abstract: Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The socket includes a concavity to receive a signal pin. The probe tip also comprises a reference body of conductive material surrounding the socket. The probe tip further comprises a insulating spacer element of non-conductive material surrounding the reference body at the proximate end of the probe tip. The insulating spacer element includes a signal port to receive the signal pin into the socket. The insulating spacer element further includes a reference port to receive a reference pin and maintain the reference pin in electrical communication with a proximate end of the reference body.
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公开(公告)号：US10684311B2
公开(公告)日：2020-06-16
申请号：US15948163
申请日：2018-04-09
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , Richard A. Booman
Abstract: The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.
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公开(公告)号：US10302676B2
公开(公告)日：2019-05-28
申请号：US15259818
申请日：2016-09-08
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , Gary W. Reed , James D. Pileggi , Karl A. Rinder , Richard A. Booman , Martin Van Pelt
IPC: G01R1/067 , H03H1/00 , H01P1/22 , G01R1/18 , H01R13/6461 , H01R24/40 , H01R103/00
Abstract: A flexible resistive tip cable assembly includes a probe Radio Frequency (RF) connector structured to receive a RF differential signal and a testing connection assembly. A coaxial cable is structured to conduct the RF differential signal between the probe RF connector and the testing connection assembly. The coaxial cable includes a cable for conducting the differential signal, and a plurality of magnetic elements positioned along a length of the cable and structured to isolate the differential signal from common mode interference. The magnetic elements are separated from adjacent magnetic elements by a gap with elastomeric elements is positioned in each gap to provide cable flexibility. The assembly may also include an Electrically Erasable Programmable Read Only Memory (EEPROM) loaded with an attenuation associated with the flexible resistive tip cable assembly for use in signal testing by a device coupled to the testing connection assembly.
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公开(公告)号：US09933456B2
公开(公告)日：2018-04-03
申请号：US14725243
申请日：2015-05-29
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , Richard A. Booman
CPC classification number: G01R1/071 , G01R29/0885 , G01R29/12 , G02B6/4274 , G02F1/011 , G02F1/035
Abstract: A test and measurement system including an electro-optical accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the electro-optical accessory with a variable input signal, and a processor. The electro-optical accessory includes two sets of electrodes in which a sensitivity of the first set of electrodes is different from a sensitivity of the second set of electrodes. The processor in the test and measurement system is configured to modify the modulated output signal from the electro-optical voltage accessory to reconstruct the variable input signal of the electro-optical voltage accessory that exceeds the linear input range of the optical sensor.
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公开(公告)号：US09804473B2
公开(公告)日：2017-10-31
申请号：US14133390
申请日：2013-12-18
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , Richard A. Booman
CPC classification number: G02F1/225 , G01R15/241 , G02F1/0121 , G02F1/0123 , G02F1/0316 , G02F2001/212 , G02F2201/122
Abstract: An electro-optic modulator of a test and measurement system. The electro-optic modulator includes a first electrode, a second electrode with identical electrical characteristics as the first electrode and an optical waveguide between the first electrode and the second electrode. The first electrode and the second electrode present a balanced load to a device under test.
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Patent Agency Ranking
公开(公告)号：US20150171589A1
公开(公告)日：2015-06-18
申请号：US14133413
申请日：2013-12-18
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , Richard A. Booman
IPC: H01S3/10
CPC classification number: H01S3/10015 , G01R1/071 , G01R35/005
Abstract: A method of controlling the gain or sensitivity of a test and measurement system. The test and measurement system includes a host, a controller with an optical transmitter and an optical receiver, optical-to-electrical converter, an accessory head, and a device under test. The method includes determining whether a gain or sensitivity adjustment of the test and measurement system is required, determining the amount of gain or sensitivity adjustment, and adjusting the output power of a laser of the optical transmitter in response to the determination of the gain or sensitivity adjustment of the test and measurement system.
Abstract translation: 一种控制测试和测量系统的增益或灵敏度的方法。 测试和测量系统包括主机，具有光发射机的控制器和光接收器，光电转换器，附件头和被测设备。 该方法包括确定是否需要测试和测量系统的增益或灵敏度调整，确定增益或灵敏度调整量，以及响应于增益或灵敏度的确定来调整光发射机的激光器的输出功率 测试和测量系统的调整。
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公开(公告)号：USD992437S1
公开(公告)日：2023-07-18
申请号：US29832636
申请日：2022-03-29
Applicant: Tektronix, Inc.
Designer： David Thomas Engquist , Heather J. Vermilyea , Karl A. Rinder , Michael J. Mende , Tony Lee Tarr
Abstract: FIG. 1 is a front-side isometric view of a tip cable component of a measurement probe head assembly.
FIG. 2 is a front view of the tip cable component of FIG. 1.
FIG. 3 is a rear view of the tip cable component of FIG. 1.
FIG. 4 is a rear-side isometric view of the tip cable component of FIG. 1.
FIG. 5 is a top view of the tip cable component of FIG. 1.
FIG. 6 is a first-side view of the tip cable component of FIG. 1.
FIG. 7 is a bottom view of the tip cable component of FIG. 1; and,
FIG. 8 is a second-side view of the tip cable component of FIG. 1.
Environmental portions of the tip cable component of a measurement probe head assembly are shown in broken lines and form no part of the claimed design.-
公开(公告)号：US20180328964A1
公开(公告)日：2018-11-15
申请号：US15948163
申请日：2018-04-09
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , Richard A. Booman
CPC classification number: G01R13/347 , G01R1/06788 , G01R15/241
Abstract: The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.
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公开(公告)号：US09793661B2
公开(公告)日：2017-10-17
申请号：US15257681
申请日：2016-09-06
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , Gary W. Reed , James D. Pileggi , Karl A. Rinder , Richard A. Booman
IPC: H01R9/05 , H01R24/54 , H01R103/00
CPC classification number: H01R24/542 , G01R1/0408 , H01R13/646 , H01R31/06 , H01R2103/00 , H01R2201/20
Abstract: A differential pin to RF adaptor includes a center conductor contact with an RF connector on one end and a signal contact on the other end. An insulating sleeve surrounds the central contact. A reference contact surrounds the insulating sleeve. The signal pin of the differential pair interfaces with the center conductor contact of the RF connector. The adaptor is structured to slide down over a pair of pins/leads so that the reference contact abuts a circuit board attached to the pins. The pins/leads are shielded all the way to the circuit board, which shields/isolates the pins from common mode and other types of interference. The adaptor maintains the shape of the signal pin and the reference pin during testing. The adaptor maintains a fixed impedance of the pins, which reduces or eliminates uncontrolled impedance and hence preserves system frequency response and reduces/eliminates erroneous ripple currents.
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公开(公告)号：US20170271826A1
公开(公告)日：2017-09-21
申请号：US15259818
申请日：2016-09-08
Applicant: Tektronix, Inc.
Inventor： Michael J. Mende , Gary W. Reed , James D. Pileggi , Karl A. Rinder , Richard A. Booman , Martin Van Pelt
IPC: H01R24/40 , G01R1/18 , H01R13/6461
CPC classification number: H01R24/40 , G01R1/06772 , G01R1/18 , H01R13/6461 , H01R2103/00 , H01R2201/20
Abstract: A flexible resistive tip cable assembly includes a probe Radio Frequency (RF) connector structured to receive a RF differential signal and a testing connection assembly. A coaxial cable is structured to conduct the RF differential signal between the probe RF connector and the testing connection assembly. The coaxial cable includes a cable for conducting the differential signal, and a plurality of magnetic elements positioned along a length of the cable and structured to isolate the differential signal from common mode interference. The magnetic elements are separated from adjacent magnetic elements by a gap with elastomeric elements is positioned in each gap to provide cable flexibility. The assembly may also include an Electrically Erasable Programmable Read Only Memory (EEPROM) loaded with an attenuation associated with the flexible resistive tip cable assembly for use in signal testing by a device coupled to the testing connection assembly.
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