摘要:
A phase diversity wavefront sensor includes an optical system including at least one optical element for receiving a light beam; a diffractive optical element having a diffractive pattern defining a filter function, the diffractive optical element being arranged to produce, in conjunction with the optical system, images from the light beam associated with at least two diffraction orders; and a detector for detecting the images and outputting image data corresponding to the detected images. In one embodiment, the optical system, diffractive optical element, and detector are arranged to provide telecentric, pupil plane images of the light beam. A processor receives the image data from the detector, and executes a Gerchberg-Saxton phase retrieval algorithm to measure the wavefront of the light beam.
摘要:
Improved devices, systems, and methods for diagnosing, planning treatments of, and/or treating the refractive structures of an eye of a patient incorporate results of prior refractive corrections into a planned refractive treatment of a particular patient by driving an effective treatment vector function based on data from the prior eye treatments. The exemplary effective treatment vector employs an influence matrix which may allow improved refractive corrections to be generated so as to increase the overall accuracy of laser eye surgery (including LASIK, PRK, and the like), customized intraocular lenses (IOLs), refractive femtosecond treatments, and the like.
摘要:
A method of determining a wavefront of a received light beam includes: (a) receiving a light beam; (b) producing a group of light spots from the light beam; (c) qualifying a set of the light spots for use in determining a wavefront of the received light beam; and (d) determining the wavefront of the received light beam using the qualified set of light spots. Qualifying the set of light spots includes, for each light spot: calculating a first calculated location of the light spot using a first calculation algorithm; calculating a second calculated location of the light spot using a second calculation algorithm; and when a difference between the first and second calculated locations for the light spot is greater than an agreement threshold, excluding the light spot from the set of light spots and/or from being employed in determining the wavefront of the received light beam.
摘要:
A system for determining the shape of an object and/or a distance of the object from the system includes a first plurality of light source, a second plurality of light sources, and a detector or detector array. The first plurality of light sources are disposed about a central axis and are separated from the central axis by radial distances defining an aperture in the first plurality of light sources. The system also includes an optical system adapted to provide light from the second plurality of light sources through the aperture to the object. The system may further include a computer configured to determine the shape of the object and/or the distance of the object from the system using light from the first and second plurality of light sources that is reflected from the object and received by the detector.
摘要:
This invention relates to optical methods and optical systems for making both on-axis and wide-field, peripheral off-axis wavefront measurements of an eye; and for designing and manufacturing wavefront-guided customized contact lens useful for myopia control. The wide-field optical instrument can comprise either (1) a multi-axis optical configuration using multiple off-axis beamlets, or (2) an instrument comprising a rotatable scanning mirror that generates off-axis probe beams.
摘要:
A method of measuring aberrations of a three-dimensional structure of an optical system, such as an eye, includes creating a plurality of light beams, optically imaging the light beams and projecting the light beams onto different locations in an optical system, receiving scattered light from each of the locations, and detecting individual wavefronts of the scattered light. The plurality of light beams may be created and projected simultaneously or sequentially. A system for measuring aberrations of a three-dimensional structure of an optical system includes a light source creating a plurality of light beams, an optical imaging system optically imaging the light beams and projecting the light beams onto different locations in the target optical system, and a wavefront sensor receiving scattered light from each of the locations and detecting individual wavefronts of the scattered light.
摘要:
A monolithically integrated photonic circuit combining a semiconductor source of excitation light with an optically active waveguide formed on the substrate. The optically active waveguide is preferably formed of a spin-on glass to which are added optically active materials which can enable lasing action, optical amplification, optical loss, or frequency conversion in the waveguide, depending upon the added material.
摘要:
A system for correcting vision in an eye that uses a premium, customized IOL, the system comprising: (1) optical aberrometer means for measuring wavefront aberrations of the eye; (2) computer means for designing a wavefront-customized correction profile for the IOL; (3) manufacturing means for creating a customized IOL with the wavefront-corrected profile; and (4) surgical means for implanting the customized IOL in the eye. Alternatively an uncorrected IOL is first implanted and aligned in the eye, followed by in-situ scanning a femtosecond laser spot across the implanted IOL to locally change an index of Refraction of the IOL material in-situ.
摘要:
A method and system for correcting vision in an eye that uses a wavefront-customized phakic or pseudophakic Intraocular Lens (IOL), the method comprising: (1) measuring wavefront aberrations of the eye; (2) designing a wavefront-customized correction profile for an IOL; (3) creating a customized IOL with the customized correction profile; and (4) implanting the customized IOL in the eye, without having to remove the natural lens. Alternatively, an uncorrected IOL is implanted first, followed by scanning a femtosecond laser spot across the implanted IOL to locally change the Index of Refraction of the IOL material and create an in-situ customized IOL.
摘要:
A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.