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公开(公告)号：US07847239B2
公开(公告)日：2010-12-07
申请号：US12055208
申请日：2008-03-25
申请人： Shao-Chuan Lu , Min-Kai Lee , Sung-Ho Liu
发明人： Shao-Chuan Lu , Min-Kai Lee , Sung-Ho Liu
IPC分类号： G12B13/00
CPC分类号： G12B13/00
摘要： A calibration strip and a laser calibration system using thereof are disclosed. The calibration strip is comprised of: a substrate; and a light impermissible layer, having a calibration pattern formed thereon while being formed on the substrate. The light impermissible layer is an opaque layer, being formed on the surface of the substrate by coating, electroplating or adhering. The substrate, manufactured by the principle for enabling the color or brightness of the substrate to have high contrast comparing with those of the light impermissible layer, can be a structure of a layer of transparent material and a light source; a layer of transparent material and a backlight source; or a metal film having a reflective layer formed thereon. Since, in the laser calibration system, the calibration strip with the calibration pattern is imaged by an imaging device and then the captured image is send to a processing unit where it is analyzed, the time-consuming and inaccurate off-line manual calibration is no longer required and the laser calibration system can be adapted for various lasers regardless of their spectra.
摘要翻译： 公开了一种校准条和其使用的激光校准系统。 校准条包括：基底; 以及不透光层，其上形成有在其上形成的校准图案。 不透光层是不透明层，通过涂覆，电镀或粘附形成在基板的表面上。 通过使与基板的颜色或亮度相比具有与不透光层不同的对比度的原理制造的基板可以是透明材料层和光源的结构; 透明材料层和背光源; 或在其上形成有反射层的金属膜。 由于在激光校准系统中，具有校准图案的校准条由成像装置成像，然后将捕获的图像发送到处理单元进行分析，因此耗时和不准确的离线手动校准不是 需要更长时间，激光校准系统可以适用于各种激光器，而不管其光谱如何。
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公开(公告)号：US20100012828A1
公开(公告)日：2010-01-21
申请号：US12175304
申请日：2008-07-17
IPC分类号： G12B13/00
CPC分类号： G12B13/00
摘要： An infrared sensor system and a method of calibrating the system are disclosed. In one aspect, a method includes determining a transmission of a transmissive window and a transmission of a transmissive fluid. In addition, an infrared emission of the transmissive window is determined along with an infrared emission of the transmissive fluid for at least one temperature. In a system that has an infrared sensor and an optical pathway to the infrared sensor, the transmissive window and the transmissive fluid are placed in the optical pathway. A semiconductor chip is placed in the optical pathway proximate the transmissive fluid. Radiation from the optical pathway is measured with the infrared sensor. An emissivity of the semiconductor chip is determined using the measured radiation and the determined transmissions and emissions of the transmissive window and the transmissive fluid.
摘要翻译： 公开了一种红外传感器系统和校准系统的方法。 一方面，一种方法包括确定透射窗的透射和透射流体的透射。 此外，透射窗的红外发射与至少一个温度的透射流体的红外发射一起确定。 在具有红外传感器和到红外传感器的光路的系统中，透射窗和透射流体被放置在光路中。 将半导体芯片放置在靠近透射流体的光学路径中。 用红外线传感器测量光路径的辐射。 使用所测量的辐射和所确定的透射窗和透射流体的透射和发射来确定半导体芯片的发射率。
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公开(公告)号：US07623230B2
公开(公告)日：2009-11-24
申请号：US11977230
申请日：2007-10-23
申请人： Niko Santeri Porjo
发明人： Niko Santeri Porjo
CPC分类号： G12B13/00
摘要： An apparatus including: an optical sensor comprising an optical transmitter and an optical receiver; and a calibration system configured to change calibration of the sensor when a measurement taken at the optical receiver, while the optical transmitter is on and the apparatus is in use, passes a test.
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公开(公告)号：US20090139297A1
公开(公告)日：2009-06-04
申请号：US12055208
申请日：2008-03-25
申请人： SHAO-CHUAN LU , MIN-KAI LEE , SUNG-HO LIU
发明人： SHAO-CHUAN LU , MIN-KAI LEE , SUNG-HO LIU
IPC分类号： G12B13/00
CPC分类号： G12B13/00
摘要： A calibration strip and a laser calibration system using thereof are disclosed. The calibration strip is comprised of: a substrate; and a light impermissible layer, having a calibration pattern formed thereon while being formed on the substrate. The light impermissible layer is an opaque layer, being formed on the surface of the substrate by coating, electroplating or adhering. The substrate, manufactured by the principle for enabling the color or brightness of the substrate to have high contrast comparing with those of the light impermissible layer, can be a structure of a layer of transparent material and a light source; a layer of transparent material and a backlight source; or a metal film having a reflective layer formed thereon. Since, in the laser calibration system, the calibration strip with the calibration pattern is imaged by an imaging device and then the captured image is send to a processing unit where it is analyzed, the time-consuming and inaccurate off-line manual calibration is no longer required and the laser calibration system can be adapted for various lasers regardless of their spectra.
摘要翻译： 公开了一种校准条和其使用的激光校准系统。 校准条包括：基底; 以及不透光层，其上形成有在其上形成的校准图案。 不透光层是不透明层，通过涂覆，电镀或粘附形成在基板的表面上。 通过使与基板的颜色或亮度相比具有与不透光层不同的对比度的原理制造的基板可以是透明材料层和光源的结构; 透明材料层和背光源; 或在其上形成有反射层的金属膜。 由于在激光校准系统中，具有校准图案的校准条由成像装置成像，然后将捕获的图像发送到处理单元进行分析，因此耗时和不准确的离线手动校准不是 需要更长时间，激光校准系统可以适用于各种激光器，而不管其光谱如何。
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公开(公告)号：US20090100903A1
公开(公告)日：2009-04-23
申请号：US11977230
申请日：2007-10-23
申请人： Niko Santeri Porjo
发明人： Niko Santeri Porjo
CPC分类号： G12B13/00
摘要： An apparatus including: an optical sensor comprising an optical transmitter and an optical receiver; and a calibration system configured to change calibration of the sensor when a measurement taken at the optical receiver, while the optical transmitter is on and the apparatus is in use, passes a test.
摘要翻译： 一种装置，包括：光学传感器，包括光发射器和光接收器; 以及校准系统，其被配置为当在光学接收器处的光学发射机接通并且该设备正在使用时进行测量时，改变传感器的校准。
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公开(公告)号：US07370398B2
公开(公告)日：2008-05-13
申请号：US11107755
申请日：2005-04-18
CPC分类号： G12B13/00 , Y10T29/49764 , Y10T29/49771 , Y10T29/49776 , Y10T29/49998 , Y10T29/53961
摘要： A new and improved method for calibrating workpiece clamping mechanisms such that once a particular clamping mechanism is calibrated with respect to a particular workpiece to be clamped upon a support surface, the clamping mechanism will always clamp the workpiece with a predetermined, precisely repeatable clamping force. In addition, the method of the present invention may be utilized in conjunction with the calibration of a plurality of clamping mechanisms so as to enable the plurality of clamping mechanisms to always generate the same precise clamping force whereby the multiple clamping mechanisms, utilized to clamp a single workpiece upon a support surface, can in fact clamp different regions of the single workpiece with precisely the same predetermined clamping force such that all regions of the single workpiece are in fact securely clamped.
摘要翻译： 一种用于校准工件夹紧机构的新的和改进的方法，使得一旦特定夹紧机构相对于要夹紧在支撑表面上的特定工件进行校准，夹紧机构将始终以预定的精确重复的夹紧力夹紧工件。 此外，本发明的方法可以与多个夹紧机构的校准一起使用，以便能够使多个夹紧机构总是产生相同的精确夹紧力，由此用于夹紧一个夹紧机构的多个夹紧机构 单个工件在支撑表面上实际上可以以精确相同的预定夹紧力夹紧单个工件的不同区域，使得单个工件的所有区域实际上被牢固地夹紧。
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17.发明授权Method of correcting an X-ray image recorded by a digital X-ray detector and calibrating an X-ray detector 有权校正由数字X射线检测器记录的X射线图像并校准X射线检测器的方法公开(公告)号：US07119327B2
公开(公告)日：2006-10-10
申请号：US10944591
申请日：2004-09-17
申请人： Martin Spahn , Boris Stowasser
发明人： Martin Spahn , Boris Stowasser
IPC分类号： G01D18/00
CPC分类号： G12B13/00
摘要： For the comparatively simple and precise correction of an X-ray image (RB) recorded by a digital X-ray detector (3) with comparatively little calibration, at least one gain image (G0,G1,G2) is selected from a plurality of stored gain images (G) for linking to the X-ray image (R) based on at least one parameter (Pi) characterizing the recording conditions of the X-ray image (RB), whereby the gain images (G) are stored such that they differ at least in respect of one parameter (Pi) used for the selection and whereby the selection of the at least one gain image (G0,G1,G2) is made based on the distance (d) between the parameter configuration (g0,g1,g2) of the gain image (G0,G1,G2) and the parameter configuration (p) of the X-ray image (RB) in a parameter space (35) set by the parameters (Pi).
摘要翻译： 为了相对简单且精确地校正由数字X射线检测器（3）以相对少的校准记录的X射线图像（RB），至少一个增益图像（G
0 < 基于至少一个参数，从多个存储的增益图像（G）中选择用于链接到X射线图像（R）的多个存储增益图像（P＆gt;，＆lt; 2＆gt; 2＆lt; 表示X射线图像（RB）的记录条件的特征，从而存储增益图像（G），使得它们至少相对于一个参数（P SUB>），并且由此选择至少一个增益图像（G 0，G 1，...，G 2）是 基于增益图像（G 0，G 1，G 2）的参数配置（g 0，g 1，g 2）与G SUP之间的距离（d），G 2）和由参数（P＆lt; i＆gt;）设置的参数空间（35）中的X射线图像（RB）的参数配置（p）。 -
18.发明申请Glide testing of disks with calibration confirmation testing by inducing collision of the slider with production disk surface 失效通过引导滑块与生产磁盘表面的碰撞，通过校准确认测试来滑动测试磁盘公开(公告)号：US20060042073A1
公开(公告)日：2006-03-02
申请号：US10931316
申请日：2004-08-31
申请人： Bradley Baumgartner , Norman Chu , Patricia Galindo , Hang Ngo , Yu Lo , Nalin Zhou
发明人： Bradley Baumgartner , Norman Chu , Patricia Galindo , Hang Ngo , Yu Lo , Nalin Zhou
CPC分类号： G11B5/455 , G11B5/6005 , G11B5/6076 , G12B13/00 , Y10T29/49069 , Y10T29/49771
摘要： A method is presented for glide testing a disk which tests the glide head fly-height by inducing a collision between the glide head and a disk under test. The glide test system is initially calibrated using calibration disks. The method of the invention periodically tests the calibration without interrupting the production testing by lowering the rotation rate until glide head collides with the rotating disk surface. The rotation rate at which the collision occurs is then compared with the value expected based on knowledge of disk samples and the initial calibration. Parameters for acceptable high and low values are established to detect changes in the glide test system performance to trigger automatic or manual recalibration.
摘要翻译： 提出了一种用于滑行测试的方法，其通过引起滑动头和被测盘之间的碰撞来测试滑翔头飞行高度。 滑行测试系统最初使用校准盘校准。 本发明的方法周期性地测试校准，而不会通过降低旋转速率来中断生产测试，直到滑动头与旋转盘表面碰撞。 然后将碰撞发生的旋转速率与基于磁盘样本知识和初始校准的预期值进行比较。 建立可接受的高低值参数，以检测滑行测试系统性能的变化，以触发自动或手动重新校准。
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公开(公告)号：US4141150A
公开(公告)日：1979-02-27
申请号：US861074
申请日：1977-12-14
申请人： Donald M. Miller
发明人： Donald M. Miller
CPC分类号： B24B13/046 , B23Q1/28 , B23Q1/48 , B23Q1/70 , B23Q17/22 , B23Q17/2495 , G01B7/002 , G01B7/28 , G12B13/00 , Y10S82/90 , Y10T82/148
摘要： A gage for measuring the contour of the surface of an element of a micromachining tool system and of a work piece machined by the micromachining tool system. The gage comprises a glass plate containing two electrical contacts and supporting a steel ball resting against the contacts. As the element or workpiece is moved against the steel ball, the very slight contact pressure causes an extremely small movement of the steel ball which breaks the electrical circuit between the two contacts. The contour information is supplied to a dedicated computer controlling the micromachining tool so that the computer knows the contour of the element and the work piece to an accuracy of .+-. 25 nm. The micromachining tool system with X- and omega-axes is used to machine spherical, aspherical, and irregular surfaces with a maximum contour error of 100 nanometers (nm) and surface waviness of no more than 0.8 nm RMS.
摘要翻译： 用于测量微加工工具系统的元件的表面轮廓的量规以及由微加工工具系统加工的工件。 量具包括一个玻璃板，它包含两个电触点，并支撑一个抵靠触点的钢球。 当元件或工件相对于钢球移动时，非常轻微的接触压力导致钢珠的移动极小，这破坏了两个触点之间的电路。 将轮廓信息提供给控制微加工工具的专用计算机，使计算机以+/- 25nm的精度了解元件和工件的轮廓。 具有X-和ω-轴的微加工工具系统用于加工球面，非球面和不规则表面，其最大轮廓误差为100纳米（nm），表面波纹不超过0.8nm RMS。
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公开(公告)号：US20180217664A1
公开(公告)日：2018-08-02
申请号：US15936865
申请日：2018-03-27
发明人： Yukimitsu YAMADA
CPC分类号： G06F3/012 , A61B5/04 , A61B5/11 , A61B5/1114 , A61B5/6803 , A61B2560/0223 , G02B27/0093 , G02B27/0172 , G02B2027/0138 , G02B2027/0178 , G12B13/00 , H04N5/23293
摘要： A tilt adjusting image including a captured image that is obtained by capturing a wearer wearing a spectacle-type electronic device, and a horizontal line image indicating a horizontal direction identified by a tilt identification part, is displayed. The wearer adjusts a position of the spectacle-type electronic device by a wearer's hand or the like while viewing the tilt adjusting image so that the spectacle-type electronic device becomes horizontal. When the wearer judges that the spectacle-type electronic device has become horizontal, the wearer operates an operation part and inputs a calibration instruction. When the calibration instruction is input, the calibration instruction is transmitted to the spectacle-type electronic device.
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