Abstract:
According to various embodiments, an electronic device includes a housing, a display viewable through a front surface of the housing and configured to display a screen, a camera sensor disposed in at least a portion of the front surface of the housing and configured to measure an external illuminance, a processor operationally connected to the display and the camera sensor; and a memory operationally connected to the processor. The memory may store instructions that, when executed, cause the processor to control the electronic device to: detect an turn-on event of the display, turn on the camera sensor to acquire the external illuminance using the camera sensor based on the display being turned on, acquire preview image information for a specified time through the camera sensor, turn off the camera sensor, acquire the external illuminance using an exposure time and a brightness value based on the acquired preview image information, and control a luminance of the display based on the external illuminance.
Abstract:
A signal component amount calculation unit calculates dispersion or standard deviation of multiple times of infrared detection signals detected by each detector element to be processed, and calculates the amount of a signal component dependent on infrared rays incident on the infrared detector included in the infrared detection signals, on the basis of the calculated dispersion or standard deviation. A fixed pattern noise calculation unit calculates the amount of a fixed pattern noise component on the basis of the infrared detection signals and the calculated amount of a signal component. A data update unit updates the fixed pattern noise data with the calculated amount of a fixed pattern noise component.
Abstract:
An apparatus including: an optical sensor comprising an optical transmitter and an optical receiver; and a calibration system configured to change calibration of the sensor when a measurement taken at the optical receiver, while the optical transmitter is on and the apparatus is in use, passes a test.
Abstract:
A low-cost alignment system suitable for aligning a wafer to a test fixture includes a bundle of optical fibers wherein at least one fiber serves to deliver illumination to the alignment target from an end thereof, and a plurality of receiver fibers, each having ends with a known spatial relationship to the end of the illuminator fiber. The ends of the fiber bundle have a known spatial relationship to the fixture. In some embodiments, the fiber bundle is disposed within the fixture such that there is an unobscured optical path between the wafer and the receiving and illuminating ends of the fibers. In some embodiments, the fiber bundle is coupled to a light source and a light sensor mounted on the fixture. In some embodiments the alignment target is one or more bonding pads disposed on a wafer.
Abstract:
A calibration system for a measuring device utilizing a photo multiplier tube is provided. The calibration system is intended to provide a stable light source variable over a wide range of intensities which can be used to calibrate the PMT reading using a closed loop feedback circuit. The LED and a photo cell are disposed in a reference block chamber whereby the photo cell is in close proximity disposed perpendicular to the axis of the LED. The LED being dome shaped will direct light energy on to the photo cell, and also peripherally. The PMT is disposed adjacent the LED and at an angle to its longitudinal axis whereby light generated by the PMT simultaneously strikes both the photo cell and the PMT without reflection.
Abstract:
An optical component comprises a thin film of an electrically controllable birefringent material confined between substantially planar surfaces. A respective electrode structure is provided on each of the surfaces, each electrode structure being patterned such that an electric field applied across the film by means of electrode structures, when a voltage is applied therebetween, causes modulation of the refractive index of the material such that the wavefront of electromagnetic radiation incident of the component and transmitted through the thin film is divided into Fresnel zones.