Abstract:
Logic data is written in a memory having a first word line and a first bit line, with the memory including a first memory cell having a first ferroelectric transistor. The first ferroelectric transistor includes a layer of ferroelectric material and has a first conduction terminal coupled to the first bit line, and a control terminal coupled to the first word line. The logic data is written based on biasing the control terminal of the first ferroelectric transistor at a first biasing value, biasing the first conduction terminal of the first ferroelectric transistor at a second biasing value different from the first biasing value, and generating a stable variation of the state of polarization of the layer of ferroelectric material of the first ferroelectric transistor to write the logic data in the first memory cell.
Abstract:
A voltage booster device may include a plurality of multiplication stages arranged in a sequence so that an input terminal of each multiplication stage, with the exception of a first multiplication stage, is connected to an output terminal of a previous multiplication stage. Each multiplication stage may include pumping circuitry for accumulating an electric charge proportional to a pump voltage value of the multiplication stage. Each multiplication stage may also include a phase signal generating circuit for switching the multiplication stages between a transfer phase and a maintaining phase. In at least one of the stages, the pumping circuitry may include at least two series connected charge accumulators. A terminal may be shared between the charge accumulators and may be connected through biasing circuitry to an output terminal of a previous multiplication stage for forcing the charge accumulators within a threshold potential drop value.
Abstract:
A sigma-delta converter may include an input node, a switched capacitor input stage integrating a difference signal between an input signal from the input node and a feedback signal representing an output signal, and a switched capacitor adder coupled downstream from the switched capacitor input stage and generating a sum signal based upon the input signal with a signal generated by the switched capacitor input stage. The sigma-delta converter may include a switched capacitor output stage amplifying the sum signal and generating an analog amplified signal, a quantization stage coupled in cascade to the switched capacitor output stage and generating the output signal as a digital replica of the analog amplified signal, and a circuit generating the feedback signal as an analog replica of the output signal.
Abstract:
A multi-pixel photodetector array may include a semiconductor substrate having a back side and a front side, Geiger mode avalanche photodiodes (GM-APDs) on the semiconductor substrate, each including an anode contact, and a common cathode for the GM-APDs and having a first connection lead on the backside of the semiconductor substrate. The multi-pixel photodetector array may include a second connection lead, and a common anode on the front side of the semiconductor substrate and configured to couple in common the anode contacts of the GM-APDs to the second connection lead. Each GM-APD may be configured to generate, when a photon impinges thereon, a current pulse of different shape for discrimination by an external circuit connected to the common cathode and the common anode.
Abstract:
A method for identifying a corrupted received signal at a receiver is described. A received signal may include symbols. Each symbol may have a value of a Galois field associated therewith. The receiver may be configured to store a logarithm of normalized probability mass functions and corresponding Galois field values for each of the plurality of symbols. The normalized probability mass functions may be normalized with respect to a greatest probability mass function of a given symbol of the plurality of symbols. The method may include comparing, for each of the plurality of symbols, a logarithm of normalized probability of an n-th best probability value with a respective threshold, counting a number of the logarithms that exceed the respective threshold and generating, for each of the plurality of symbols, a score corresponding to the number. The method may also include calculating a moving average of the scores, and comparing the calculated moving average with an output threshold and flagging a just received one of the plurality of symbols as corrupted based upon the comparison.
Abstract:
An electrically programmable non-volatile memory device includes a plurality of memory cells, a plurality of lines for selectively biasing the memory cells, reconnection circuitry for reconnecting a pair of selected lines having different voltages, and a controller for controlling the memory device. The reconnection means includes a discharge circuit for discharging one of the selected lines being at the higher voltage in absolute value, an equalization circuit for equalizing the selected lines, a comparator circuit for measuring an indication of a voltage difference between the selected lines, and an evaluation circuit responsive to an enabling signal from the controller for activating the discharge circuit until an absolute value of the voltage difference exceeds a threshold value and for disabling the discharge circuit and enabling the equalization circuit when the absolute value of the voltage difference reaches the threshold value.
Abstract:
An electrically programmable non-volatile memory device is proposed. The memory device includes a plurality of memory cells and a driver circuit for driving the memory cells; the driver circuit includes programming means for providing a first programming voltage and a second programming voltage to a set of selected memory cells for programming the selected memory cells; the first programming voltage requires a first transient period for reaching a first target value thereof. In the solution according to an embodiment of the present invention, the programming means includes means for maintaining the second programming voltage substantially equal to the first programming voltage during a second transient period being required by the second programming voltage to reach a second target value thereof.
Abstract:
An integrated magnetic sensor formed in a body including a substrate of semiconductor material, which integrates a Hall cell. A trench is formed in the body, for example, on the back of the substrate, and is delimited by lateral surface portions that extend in a direction transverse to the main face of the body. The trench has a depth in a direction perpendicular to the main face that is much greater than its width in a direction parallel to the main face of the body, between the lateral surface portions. A concentrator made of ferromagnetic material is formed within the trench and is constituted by two ferromagnetic regions, which are set at a distance apart from one another and extend along the lateral surface portions of the trench towards the first Hall cell.
Abstract:
A method for testing a memory device. The memory device includes a matrix of memory cells having a plurality of rows and columns; the matrix includes a plurality of rows of operative memory cells each one for storing a variable value and at least one row of auxiliary memory cells each one storing a fixed value. The memory device further includes writing circuitry for writing selected values into the operative memory cells, and reading circuitry for reading the values being stored from the operative or auxiliary memory cells. The method includes reading output values from the row of auxiliary memory cells, determining a malfunctioning of the memory device in response to a missing match of the output values with the fixed values, determining a cause of the malfunctioning according to a pattern of reading errors between the output values and the corresponding fixed values, and providing a signal indicative of the cause of the malfunctioning.
Abstract:
A method for producing an integrated device including a capacitor. The method includes the steps of providing a functional substrate including functional circuits of the integrated device, forming a first conductive layer including a first plate of the capacitor on the functional substrate, forming a layer of insulating material including a dielectric layer of the capacitor on a portion of the first conductive layer corresponding to the first plate, forming a second conductive layer including a second plate of the capacitor and functional connections to the functional circuits on a portion of the layer of insulating material corresponding to the dielectric layer, forming a protective layer of insulating material covering the second plate and the functional connections, forming a first contact for contacting the first plate, and forming a second contact and functional contacts for contacting the second plate and the functional connections, respectively, through the protective layer.