Abstract:
A method of providing neighbor base station information via a mobile subscriber station in a broadband wireless access system is disclosed. In providing neighbor base station information (S316) to a serving base station from a mobile subscriber station in a broadband wireless access system, the present invention includes the steps of performing a scanning and a synchronization (S312, S313) on a mobile base station based on information provided from the serving base station (S311) and transmitting the neighbor base station information acquired from the scanning and the synchronization to the serving base station (S316) regardless of a presence or non-presence of a request from the serving base station. Accordingly, the present invention can efficiently transmit the neighbor base station signal intensity and frame information acquired by the mobile subscriber station.
Abstract:
Wiring for a semiconductor device which is suitable for high density device packing, and a method for forming the same, are disclosed. The wiring includes: impurity regions formed in a substrate on both sides of an insulated gate electrode; a first conduction layer formed on the impurity regions; and a second conduction layer formed in contact with the first conduction layer on one side of the gate electrode. The method includes the steps of: forming impurity regions in a substrate on both sides of an insulated gate electrode; forming a first conduction layer on the impurity regions; and forming a second conduction layer in contact on one side of the gate electrode with the first conduction layer.
Abstract:
A CMOS fabrication method includes the steps of providing a substrate having a surface, forming a first conductive well adjacent to the surface of the substrate, forming a second conductive well adjacent to the surface of the substrate, a portion of the first conductive well overlapping a portion of the second conductive well, forming a field oxide in the overlapping portion of the first and second conductive wells forming a first gate over the first conductive well and a second gate over the second conductive well, masking the first conductive well and implanting second conductive impurities on the second conductive well and masking the second conductive well and implanting first conductive impurities on the first conductive well.
Abstract:
A method for forming a contact between a conductive layer and a portion of the substrate during manufacture of a semiconductor device is disclosed. The process includes the steps of: (a) covering a semiconductor substrate with an insulating layer, and forming a contact hole on the portion where a contact is to be formed; (b) forming a metal layer on the whole surface of the substrate, and implanting positive ions into the metal layer; and (c) heat-treating the whole substrate so as to form a silicide layer. The metals used are those which can react with silicon to form a silicide, and may be selected from high melting point metals including Co, Ti, Ta, Ni, Mo, and Hf. The ions used are ions including H+ or halogen element ions, and a heat treatment is carried out so that the implanted positive ions may spread on/in the grain boundaries, or that the positive ions may bond with dangling bonds. Further, a silicidation heat treatment is carried out so that the silicide would be formed on the portion where the metal and the silicon substrate contact together. These heat treatments may be carried out simultaneously. The heat treatment for the spreading of the positive ions is carried out at a low temperature of about 300.degree.-500.degree. C., while the heat treatment of the silicidation reaction is carried out at a proper temperature depending on the metal used.
Abstract:
A semiconductor device capacitor structure comprises a semiconductor substrate having an impurity diffusion region; an insulating layer formed on the semiconductor substrate and having a contact hole on the impurity diffusion region; a first lower electrode of a half ring type formed on the insulating film along an upper edge of the contact hole; a second lower electrode formed on a surface of the substrate exposed through the contact hole, a wall of the contact hole, and the first lower electrode; a dielectric layer formed on the first and second lower electrodes; and an upper electrode formed on the dielectric layer. This structure increases capacitance, thereby improving the characteristics and reliability of the device.
Abstract:
A dual modem device includes a first processor to communicate with a first network and a second processor to communicate with a second network. The first processor includes a USB module to transceive a signal with a computer side using a universal serial bus (USB) interface, a first packet control block to determine a type of the signal transceived via the USB module and to decide a communication path, and a first function block to process a signal associated with the first network. The second processor includes a first control block to process a control signal for the first processor, a second control block to process a control signal for the second processor, and a second function block to process a signal associated with the second network.
Abstract:
A method of indicating downlink traffic to a mobile subscriber station that is in a sleep mode includes transmitting a sleep request message to a base station (BS); entering the sleep mode in response to a sleep response message received from the BS, wherein the sleep response message includes a first SLPID; receiving a traffic indication message including a FMT field indicating formats for the traffic indication message from the BS during a listening interval of the sleep mode, wherein the FMT field indicates one of an SLPID bitmap based format and an SLPID based format, and the traffic indication message further includes a second SLPID when the SLPID based format is used; and terminating the sleep mode to receive the downlink traffic when the second SLPID in the traffic indication message is same as the first SLPID included in the sleep response message.
Abstract:
A method of supporting operation of sleep mode in a wideband radio access system is disclosed. More specifically, a mobile subscriber station (MSS) which determines a frame offset information for synchronizing listening windows of at least one MSS that is in sleep mode, and transmits the determined framed offset information to at least one MSS.
Abstract:
A method uses inter-base station control messages to provide neighbor base station information to mobile subscriber stations in a mobile communication system. The method includes obtaining, at a serving base station, physical channel information of neighbor base stations over a backbone network via, either directly or via a server; periodically transmitting the obtained physical channel information from the serving base station to a mobile subscriber station connected to the serving base station; and measuring, based on the updated physical channel information, signal quality of the at least one neighbor base station at the mobile subscriber station. Thus, the serving base station receives from the neighbor base stations the inter-base station control messages containing the neighbor base station information, updates the information, and provides the updated information to the corresponding mobile subscriber station(s), to be used for a specific purpose such as handover or network entry.
Abstract:
Wiring for a semiconductor device which is suitable for high density device packing, and a method for forming the same, are disclosed. The wiring includes: impurity regions formed in a substrate on both sides of an insulated gate electrode; a first conduction layer formed on the impurity regions; and a second conduction layer formed in contact with the first conduction layer on one side of the gate electrode. The method includes the steps of: forming impurity regions in a substrate on both sides of an insulated gate electrode; forming a first conduction layer on the impurity regions; and forming a second conduction layer in contact on one side of the gate electrode with the first conduction layer.