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公开(公告)号：US11346764B2
公开(公告)日：2022-05-31
申请号：US17268663
申请日：2019-08-16
Applicant: Essenlix Corporation
Inventor： Stephen Chou , Wei Ding , Wu Chou , Jun Tian , Yuecheng Zhang , Mingquan Wu , Xing Li
Abstract: The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.
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