公开(公告)号：US07015906B2

公开(公告)日：2006-03-21

申请号：US09683795

申请日：2002-02-15

Applicant: Frank Olschewski ,  Jochen Nickel

Inventor： Frank Olschewski ,  Jochen Nickel

IPC: G06T15/00

CPC classification number: G01B9/04

Abstract: The present invention concerns a method and an arrangement for imaging and measuring microscopic three-dimensional structures. In them, a data set is depicted in three-dimensional form on a display (27) associated with the microscope. At least one arbitrary section position and an arbitrary rotation angle are defined by the user. Rotation of the three-dimensional depiction on the display (27) is performed until a structure contained in the three-dimensional form reproduces on the display (27) a depiction that appears suitable to the user. The corresponding analytical operations are then performed on the structure.

Abstract translation: 本发明涉及用于成像和测量微观三维结构的方法和装置。 在它们中，在与显微镜相关联的显示器（27）上以三维形式描绘数据集。 用户定义至少一个任意的区段位置和任意的旋转角度。 执行显示器（27）上的三维描绘的旋转，直到三维形式中包含的结构在显示器（27）上再现适合于用户的描述。 然后对结构进行相应的分析操作。

公开(公告)号：US07006675B2

公开(公告)日：2006-02-28

申请号：US09682329

申请日：2001-08-21

Applicant: Frank Olschewski

Inventor： Frank Olschewski

IPC: G06K9/00

CPC classification number: G02B21/0004

Abstract: The present invention concerns a method, an arrangement, and a software program for controlling analytical and adjustment operations of a microscope. The arrangement has an electronic acquisition system (50) which converts the electrical signals coming from the detectors (19) into digital signals and preprocesses them. A PC (34) receives the digital signals from the electronic acquisition system (50) and identifies from the digital signals a graphical depiction. On a display (27), the graphical depiction is displayed and moreover the user is offered the opportunity to select adjustment functions. An input unit (33), with which selection of the adjustment functions and selection of at least one structure of interest can be achieved, is provided for selection. An electronic control system (67), with which the adjusting elements of the microscope can be controlled, is connected to the PC (34).

Abstract translation: 本发明涉及用于控制显微镜的分析和调整操作的方法，装置和软件程序。 该装置具有将来自检测器（19）的电信号转换为数字信号并对其进行预处理的电子采集系统（50）。 PC（34）从电子采集系统（50）接收数字信号，并从数字信号中识别图形描绘。 在显示器（27）上，显示图形描绘，并且还向用户提供选择调整功能的机会。 提供了一种输入单元（33），用于选择调整功能和选择至少一个感兴趣的结构。 PC（34）连接有可以控制显微镜的调节元件的电子控制系统（67）。

公开(公告)号：US06947861B2

公开(公告)日：2005-09-20

申请号：US10249181

申请日：2003-03-20

Applicant: Frank Olschewski

Inventor： Frank Olschewski

IPC: G01J3/44 ,  G01J3/443 ,  G01N13/10

CPC classification number: G01J3/4406 ,  G01J3/443

Abstract: The method implements time-optimized acquisition of special spectra using a scanning microscope, for which purpose the spectrum is subjected to bisecting interval measurements. The method for time-optimized acquisition of special spectra (emission spectra) using a scanning microscope is implemented in several steps. Firstly a complete spectrum to be examined, within which at least one special spectrum (emission spectrum) is located, is split into at least two intervals. The interval in which the intensity lies above a specific threshold is selected. That interval is split into at least two further intervals, and the procedure is continued until the size of the interval corresponds to the lower limit of the scanning microscope's measurement accuracy. The location of the special spectrum in the complete spectrum is defined, and an interval around it is created and is measured linearly.

Abstract translation: 该方法使用扫描显微镜实现特殊光谱的时间优化采集，为此，光谱经受二等分间隔测量。 使用扫描显微镜时间优化采集特殊光谱（发射光谱）的方法是在几个步骤中实现的。 首先，要检查的至少一个特殊频谱（发射频谱）所在的完整频谱被分成至少两个间隔。 选择强度在特定阈值之上的间隔。 该间隔分为至少两个间隔，并且继续该过程直到间隔的大小对应于扫描显微镜的测量精度的下限。 定义完整光谱中特殊光谱的位置，并创建其周围的间隔，并进行线性测量。

公开(公告)号：US20050046835A1

公开(公告)日：2005-03-03

申请号：US10924658

申请日：2004-08-24

Applicant: Frank Olschewski

Inventor： Frank Olschewski

IPC: G01J3/36 ,  G01J3/44 ,  G01N21/64 ,  G01J3/30

CPC classification number: G01N21/645 ,  G01J3/36 ,  G01J3/4406 ,  G01N2021/6417 ,  G02B21/0076

Abstract: A method for separating fluorescence spectra of dyes present in a specimen (15) is disclosed. Firstly a spectral scan of the fluorescence spectrum of all the dyes present in the specimen (15) is performed. The fluorescence spectra associated with the respective dyes are stored in a database of the computer system. After spectral deconvolution of the acquired mixed fluorescence spectrum, a comparison is made between the measured individual spectra ascertained by spectral deconvolution and the fluorescence spectra associated with the respective dyes. Lastly, a linear deconvolution of the acquired mixed fluorescence spectrum is performed.

Abstract translation: 公开了一种用于分离存在于样品（15）中的染料的荧光光谱的方法。 首先进行样品（15）中存在的所有染料的荧光光谱的光谱扫描。 与相应染料相关的荧光光谱存储在计算机系统的数据库中。 在获得的混合荧光光谱的光谱去卷积之后，通过光谱反卷积确定的测量的单个光谱和与各个染料相关的荧光光谱进行比较。 最后，进行采集的混合荧光光谱的线性去卷积。

公开(公告)号：US20050041861A1

公开(公告)日：2005-02-24

申请号：US10917174

申请日：2004-08-12

Applicant: Frank Olschewski

Inventor： Frank Olschewski

IPC: G02B21/36 ,  G06K9/34 ,  G06T1/00 ,  G06T5/00 ,  G06T7/00

CPC classification number: G02B21/365 ,  G06T7/11 ,  G06T2207/10056 ,  G06T2207/10064 ,  G06T2207/20092

Abstract: As a user works at a microscope, image details are constantly present in the user's field of view. The user usually analyzes those image details, marks them with a suitable graphical software mechanism on the screen, and selects a desired function. According to the present invention, the user is offered a user interface that is based substantially on the user's knowledge of the world. A suitable combination of automated adjustment operations, automatic and semiautomatic image analysis, appropriate visualization technology, and integration is automatically used for image depiction.

Abstract translation: 当用户在显微镜下工作时，图像细节不断地出现在用户的视野中。 用户通常会分析这些图像细节，并在屏幕上使用合适的图形软件机制标记它们，并选择所需的功能。 根据本发明，向用户提供基本上基于用户对世界的了解的用户界面。 自动调整操作，自动和半自动图像分析，适当的可视化技术和集成的适当组合自动用于图像描述。

公开(公告)号：US20050024637A1

公开(公告)日：2005-02-03

申请号：US10894554

申请日：2004-07-20

Applicant: Frank Olschewski

Inventor： Frank Olschewski

IPC: G01N21/64 ,  G02B21/00 ,  G02B21/16

CPC classification number: G01N21/6458 ,  G01N21/64 ,  G02B21/16

Abstract: A detector for detecting weak fluorescent radiation with a microscope system (100) is disclosed. The microscope system (100) is configured in such a way that it senses individual photons of the detected light beam (17) each as one event (50), and furnishes therefrom an output signal in the form of a characteristic function (52). A filter circuit (61) forms, from the characteristic function (52), a new characteristic function (55) that is conveyed to a discriminator (60).

Abstract translation: 公开了一种用显微镜系统（100）检测弱荧光辐射的检测器。 显微镜系统（100）以这样的方式配置，使得其以每个事件（50）的方式感测检测到的光束（17）的各个光子，并且从其提供形式为特征函数（52）的输出信号。 滤波器电路（61）从特征函数（52）形成传送到鉴别器（60）的新特征函数（55）。