CHARGED PARTICLE BEAM DEVICE
    21.
    发明申请
    CHARGED PARTICLE BEAM DEVICE 有权
    充电颗粒光束装置

    公开(公告)号:US20130313430A1

    公开(公告)日:2013-11-28

    申请号:US13982805

    申请日:2011-11-02

    IPC分类号: H01J37/16 H01J37/26

    摘要: Provided is a charged particle beam device or charged particle microscope permitting observation of even a large-sized specimen in the air atmosphere or a gaseous atmosphere.A charged particle beam device that adopts a thin film which partitions a vacuum atmosphere and the air atmosphere (or gaseous atmosphere) includes a charged particle optical lens barrel in which a charged particle optical system is stored, a housing in which a route along which a primary charged particle beam emitted from the charged particle optical lens barrel reaches the thin film is sustained in the vacuum atmosphere, and a mechanism that bears the charged particle optical lens barrel and first housing against a device installation surface. As the bearing mechanism, a housing having an opening through which a large-sized specimen is carried in or a mechanism having a shape other than the shape of the housing, such as, a post is adopted.

    摘要翻译: 提供了一种带电粒子束装置或带电粒子显微镜,其允许在空气气氛或气体气氛中甚至观察大尺寸样品。 采用分隔真空气氛的薄膜和空气气氛(或气体气氛)的带电粒子束装置包括其中存储带电粒子光学系统的带电粒子光学镜筒,其中沿着 从带电粒子光学透镜镜筒发射的到达薄膜的初级带电粒子束在真空气氛中被维持,并且使得带电粒子光学镜片镜筒和第一壳体抵抗装置安装​​表面的机构。 作为轴承机构,采用具有大尺寸样本的开口的壳体或具有除壳体的形状以外的形状的机构,例如柱。

    CHARGED PARTICLE BEAM APPARATUS
    22.
    发明申请
    CHARGED PARTICLE BEAM APPARATUS 有权
    充电颗粒光束装置

    公开(公告)号:US20140021347A1

    公开(公告)日:2014-01-23

    申请号:US14111174

    申请日:2012-03-02

    IPC分类号: H01J37/16 H01J37/28

    摘要: Provided is a charged particle beam apparatus or charged particle microscope capable of observing an observation target sample in an air atmosphere or a gas environment without making significant changes to the configuration of a conventional high vacuum charged particle microscope. In a charged particle beam apparatus configured such that a thin film (10) is used to separate a vacuum environment and an air atmosphere (or a gas environment), an attachment (121) capable of holding the thin film (10) and whose interior can be maintained at an air atmosphere or a gas environment is inserted into a vacuum chamber (7) of a high vacuum charged particle microscope. The attachment (121) is vacuum-sealed and fixed to a vacuum partition of the vacuum sample chamber. Image quality is further improved by replacing the atmosphere in the attachment with helium or a light-elemental gas that has a lower mass than atmospheric gases such as nitrogen or water vapor.

    摘要翻译: 提供一种能够在空气气氛或气体环境中观察观察目标样品的带电粒子束装置或带电粒子显微镜,而不会对传统的高真空带电粒子显微镜的构造进行显着变化。 在构成为使用薄膜(10)分离真空环境和空气气氛(或气体环境)的带电粒子束装置中,能够保持薄膜(10)的附件(121),其内部 可以在空气气氛中保持,或者将气体环境插入到高真空带电粒子显微镜的真空室(7)中。 附件(121)被真空密封并固定到真空样品室的真空隔板。 通过用氦气或具有比大气气体如氮气或水蒸气更低的质量的轻质气体代替附件中的气氛来进一步改善图像质量。

    SAMPLE OBSERVATION METHOD USING ELECTRON BEAMS AND ELECTRON MICROSCOPE
    23.
    发明申请
    SAMPLE OBSERVATION METHOD USING ELECTRON BEAMS AND ELECTRON MICROSCOPE 审中-公开
    使用电子束和电子显微镜的样品观察方法

    公开(公告)号:US20120292506A1

    公开(公告)日:2012-11-22

    申请号:US13508774

    申请日:2010-11-08

    IPC分类号: H01J37/26

    摘要: A disclosed method for observing the structure and characteristics of a specimen by an electron microscope realizes high-density charge accumulation on a specimen and improves the quality of voltage contrast images. For structural observation of a specimen and evaluation of its electrical characteristic using an electron beam, charging the specimen is performed. In this charging process, high-density charge accumulation on the specimen is achieved by irradiating the specimen with an electron beam set to have injection energy that falls within an injection energy band for which high charging efficiency is attained during electron beam irradiation and changing irradiation energy, while maintaining the injection energy.

    摘要翻译: 通过电子显微镜观察样品的结构和特性的公开方法实现了样品上的高密度电荷累积,并提高了电压对比度图像的质量。 对于样品的结构观察和使用电子束评估其电特性,对样品进行充电。 在该充电过程中,通过用电子束照射样品来实现样品上的高密度电荷积累,该电子束设定为具有落入在电子束照射期间获得高充电效率的注入能带内的注入能量并且改变照射能量 同时保持注射能量。