摘要:
To read information from a target information recording surface reliably by canceling DC offsets in tracking-signal detection signals is provided. In effecting tracking servo by 3-beam method, auxiliary light receiving domains D3—1, D3—2, D8—1, D8—2 are provided. The auxiliary light receiving domain receives images formed by the light returned from a different information recording surface from the one targeted for reading. Sub beams of ± first-order diffracted light enter the light receiving domains D3, D8, D1, D10. With respect to the diffraction direction of the hologram, the auxiliary light receiving domains D3—1, D3—2 (D8—1, D8—2) are provided on both sides of the light receiving domain D3 (D8). Since signals are computed as: D8−(D8—1+D8—2); and D3−(D3—1+D3—2) with the internal connection, DC offsets can be canceled in RES signals (D1+D3, D8+D10) used in the DPP method.
摘要:
A defect inspection apparatus includes an illumination optical unit for obliquely illuminating an object with a slit-like shaped laser, a first detection optical unit for detecting a first image formed by light reflected from the object by the illumination of the slit-like shaped laser and reflected in a first direction substantially normal to a surface of the object, a second detection optical unit for detecting a second image formed by light reflected from the object by the illumination of the slit-like shaped laser and reflected in a second direction inclined to the normal direction to the surface of the object, an image signal processing unit which processes a signal outputted from the first detection optical unit and a signal outputted from the second detection optical unit, and an output unit which outputs information processed by the image signal processing unit.
摘要:
An optical pickup converts a laser beam from a semiconductor laser (1) into a parallel ray with a collimator lens (2), and divides it into a main beam (30), a sub-beam (+1st order component) (31), and a sub-beam (−1st order component) (32) with a gradient multiple-division type phase difference grating (3). After passing through a beam splitter (4), an objective lens (5) condenses the light beams on a track (61) of an optical disc (6), and the reflected light that has passed through the objective lens 5 is reflected at the beam splitter (4) and is guided into optical detectors (8A, 8B, and 8C) by a condensing lens (7). Accordingly, in a tracking error signal detecting method using the push-pull signals of the main beam and sub-beams, an offset produced by an objective lens shift or a disc tilt can be cancelled at low cost without lowering the efficiency of using light.
摘要:
The object of the invention is to accurately detect the amount of tilt in the light reflector to the optical axis of an output light with a simple configuration. A tilt sensing apparatus includes a light reflector, a light source, a condensing unit for condensing an output light from the light source onto the light reflector, and a light sensing unit for sensing the reflected light from the light reflector. An optical device provided in the condensing unit for varying the light quantity of the transmitting light has first and second optical device strips that are formed at the positions of axial symmetry about the optical axis and have a predetermined shift in the direction of a straight line of connecting the axis of the light reflector to the condensed position where the light emitted from the light source is condensed onto the light reflector by the condensing unit.
摘要:
A bill arranger is provided that includes a loader for loading bills and feeding the bills one by one; a conveyer for conveying the bills fed from the loader; a discriminating device for discriminating the bills conveyed by the conveyer; a plurality of stackers for stacking the bills, which are conveyed by the conveyer, so that the bills can be removed; an operating device for selecting one of sorting process modes which defines a method of sorting the bills loaded in the loader; a controller for delivering the bills, which are fed from the loader, to one of the stackers, by the conveyer, based on the results of the discrimination by the discriminating device, according to the sorting process mode selected by the operating device; and guides, provided in the stackers, which are movable by the weight of the stacked bills delivered into the stackers from the conveyer.
摘要:
The present invention provides a defect inspecting apparatus and a defect inspection method for inspecting an object of inspection for a defect such as a foreign particle existing on the object wherein, by using a high-efficiency illumination optical system for radiating an illumination beam to the object of inspection from a direction to reduce the intensity of a scattered light generated by a pattern on the object of inspection, it is possible to decrease the intensity of the scattered light from the pattern which causes a variation of a signal and, in addition, by using a means for setting a detection threshold value based on a variation of a signal computed for each area in a chip on the object of inspection, the detection threshold value can be made small and, thus, the sensitivity as well as the throughput can be raised.
摘要:
A bill arranger is provided that includes a loader for loading bills and feeding the bills one by one; a conveyer for conveying the bills fed from the loader; a discriminating device for discriminating the bills conveyed by the conveyer; a plurality of stackers for stacking the bills, which are conveyed by the conveyer, so that the bills can be removed; an operating device for selecting one of sorting process modes which defines a method of sorting the bills loaded in the loader; and a controller for delivering the bills, which are fed from the loader, to one of the stackers, by the conveyer, based on the results of the discrimination by the discriminating device, according to the sorting process mode selected by the operating device.
摘要:
A conductive rotator is immersed in a sample liquid in a sample container. A magnet is arranged at a specific distance from the rotation plane of the rotator in a direction of a rotating axis of the rotator so as to face the sample container. The magnet applies a magnetic field to the rotator from the outside of the sample container. A fluctuating magnetic field drive unit drives the magnet to apply the magnetic field that fluctuates in term of time to the rotator. Induced current is excited in the rotator by the fluctuating magnetic field. A rotating torque is provided to the rotator by the Lorenz interaction between the induced current and the fluctuating magnetic field, and as a result, the rotator rotates in the rotation plane. A viscosity detecting unit obtains the viscosity of the sample liquid based on a rotating state of the rotator and a time-fluctuating state of the fluctuating magnetic field.
摘要:
A conductive rotator is immersed in a sample liquid in a sample container. A magnet is arranged at a specific distance from the rotation plane of the rotator in a direction of a rotating axis of the rotator so as to face the sample container. The magnet applies a magnetic field to the rotator from the outside of the sample container. A fluctuating magnetic field drive unit drives the magnet to apply the magnetic field that fluctuates in term of time to the rotator. Induced current is excited in the rotator by the fluctuating magnetic field. A rotating torque is provided to the rotator by the Lorenz interaction between the induced current and the fluctuating magnetic field, and as a result, the rotator rotates in the rotation plane. A viscosity detecting unit obtains the viscosity of the sample liquid based on a rotating state of the rotator and a time-fluctuating state of the fluctuating magnetic field.
摘要:
In a light source unit (210) serving as an embodiment of an illuminating apparatus, when P is a light-emitting element pitch [mm], and H is an optical axis distance [mm] between light-emitting elements (212) and an original (G), and when, in an illuminance cycle (T) representing repetition of bright and dark areas in a main scanning direction (X) on a light-irradiated face (Gs) of the original (G) caused by the light-emitting elements (212), the light-emitting element pitch (P) and the optical axis distance (H) are set such that unevenness [%] (M) (=(L1−L2)/L3 [%]) obtained by dividing a value obtained by subtracting a minimum illuminance value (L2) from a maximum illuminance value (L1) by an average illuminance value (L3) and an inter-unevenness distance [mm] (N) which is a half cycle of the illuminance cycle (T) satisfy the relation M≦N/2−5.5, and more preferably, M≦N/2−7.5.
摘要翻译:在作为照明装置的实施例的光源单元(210)中,当P是发光元件间距[mm],H是发光元件(212)与发光元件(212)之间的光轴距离[mm] 原始(G),并且当在由发光元件(G)引起的原始(G)的光照射面(G)上的主扫描方向(X)上的亮区域的重复的照度周期(T)中, 发光元件(212),发光元件间距(P)和光轴距离(H)被设定为使得通过划分获得的不平坦度[%](M)(=(L1-L2)/ L3 [%] 通过从最大照度值(L1)减去作为照度周期的半周期的平均照度值(L3)和不等间距离(mm)(N)而得到的最小照度值(L2) T)满足关系M&NlE; N / 2-5.5,更优选M< NE; N / 2-7.5。