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    INSPECTION SYSTEM AND METHOD
    21.
    发明公开
    INSPECTION SYSTEM AND METHOD 审中-公开

    公开(公告)号：US20240310305A1

    公开(公告)日：2024-09-19

    申请号：US18575577

    申请日：2022-07-06

    Applicant: NUCTECH COMPANY LIMITED ,  Tsinghua University

    Inventor： Zhiqiang CHEN ,  Li ZHANG ,  Qingping HUANG ,  Yong ZHOU ,  Hui DING ,  Xin JIN ,  Chao JI

    IPC: G01N23/10 ,  G01N23/046 ,  G01N23/083

    CPC classification number: G01N23/10 ,  G01N23/046 ,  G01N23/083 ,  G01N2223/204 ,  G01N2223/33 ,  G01N2223/50 ,  G01N2223/643

    Abstract: An inspection system and method, and the system includes: a ray source; a detector assembly; and a conveying device for carrying an aviation pallet cargo. The ray source and the detector assembly are movable in a traveling direction parallel to the central axis relative to the conveying device so that the aviation pallet cargo enters an inspection region, the ray source is translatable between a plurality of scanning positions, and a translation distance of the ray source between two adjacent scanning positions is greater than a spacing between adjacent target spots of the ray source. When the ray source is located at one of the scanning positions, the ray source and the detector assembly move in the traveling direction and the ray source emits X-rays; and when the ray source and the detector assembly move a predetermined distance in the traveling direction, the ray source translates to another one of the plurality of scanning positions.

    INSPECTION SYSTEM AND INSPECTION METHOD
    23.
    发明公开
    INSPECTION SYSTEM AND INSPECTION METHOD 审中-公开

    公开(公告)号：US20240219325A1

    公开(公告)日：2024-07-04

    申请号：US18574653

    申请日：2022-07-06

    Applicant: Nuctech Company Limited ,  Tsinghua University

    Inventor： Li ZHANG ,  Zhiqiang CHEN ,  Qingping HUANG ,  Hui DING ,  Yong ZHOU ,  Xin JIN ,  Liming Yao

    IPC: G01N23/10 ,  G01N23/046 ,  G01N23/083

    CPC classification number: G01N23/10 ,  G01N23/046 ,  G01N23/083 ,  G01N2223/3303 ,  G01N2223/643

    Abstract: Provided are an inspection system and an inspection method, the inspection system includes: a carrying device (300); at least one ray source (100) each includes a separate housing (110) to define a vacuum space and target spots enclosed within the housing (110), and a detector assembly (200). The at least one ray source (100) is rotatable between a plurality of scanning positions around a rotation axis relative to the carrying device (300). The at least one ray source (100) and the detector assembly (200) may be lifted or lowered along the rotation axis relative to the carrying device (300). When the at least one ray source (100) is located at one of scanning positions relative to the carrying device (300), the at least one ray source (100) and the detector assembly (200) are lifted or lowered along the rotation axis relative to the carrying device (300) and the at least one ray source (100) emits X-rays. After the at least one ray source (100) and the detector assembly (200) are lifted or lowered a predetermined distance relative to the carrying device (300), the at least one ray source (100) rotates around the rotation axis relative to the carrying device (300) to another one of scanning positions.

    SCANNING IMAGING SYSTEM FOR SECURITY INSPECTION OF AN OBJECT AND IMAGING METHOD THEREOF
    24.
    发明申请
    SCANNING IMAGING SYSTEM FOR SECURITY INSPECTION OF AN OBJECT AND IMAGING METHOD THEREOF 审中-公开

    公开(公告)号：US20190094407A1

    公开(公告)日：2019-03-28

    申请号：US16037810

    申请日：2018-07-17

    Applicant: Nuctech Company Limited ,  Tsinghua University

    Inventor： Li ZHANG ,  Zhiqiang CHEN ,  Le SHEN ,  Qingping HUANG ,  Yunda SUN ,  Xin JIN ,  Hui DING ,  Yuxiang XING

    IPC: G01V5/00 ,  G01N23/046

    Abstract: The disclosure provides a scanning imaging system for security inspection of an object and an imaging method thereof, the system comprising: a conveying unit configured for bringing the object to move along a conveying direction; a plurality of radiographic sources at one side of the conveying unit, being arranged successively in a direction vertical to a plane, in which the conveying unit is located, and configured for alternately emitting ray beams to form a scanning area; a linear detector array at the other side of the conveying unit, being configured for detecting first projection images, which are formed after the ray beams emitted by the plurality of radiographic sources penetrate through the object, in the process of the object passing through the scanning area; an imaging unit configured for obtaining a first reconstructed image of the object based on the first projection images of the plurality of radiographic sources.

    CT SYSTEMS AND METHODS THEREOF
    25.
    发明申请
    CT SYSTEMS AND METHODS THEREOF 有权
    CT系统及其方法

    公开(公告)号：US20150199804A1

    公开(公告)日：2015-07-16

    申请号：US14576705

    申请日：2014-12-19

    Applicant: Tsinghua University ,  Nuctech Company Limited

    Inventor： Zhiqiang CHEN ,  Li ZHANG ,  Ji ZHAO ,  Qingping HUANG ,  Xin JIN

    IPC: G06T7/00

    CPC classification number: G06T7/0002 ,  G01V5/005 ,  G06T2207/30112

    Abstract: A CT system and method thereof are discloses. The system includes: a fixed multi-plane multi-source X-ray generation device and a control system thereof that provide X-ray source used in luggage inspection; a single-energy, pseudo-dual-energy or spectral detector system and data transfer system that receive perspective data of X ray penetrating the luggage, and transfer the data to a computer for processing; a conveyor and a control system thereof that control a speed for moving the luggage forth and back, and perform tomogram scanning; and a host computer system that performs tomogram reconstruction and provides man-machine interaction. The system takes full advantage of characteristics, such as high speed and stability, brought by the distributed ray sources which replace the normal slip ring technology. The system also adopts the idea of inverse-geometry CT, and reduces detector area and cost by increasing the number of ray sources. With the reduction of detector area, cone-beam artifacts and cup-shape artifacts caused by scattering are also reduced, and influence of the oblique effect on registration of dual-energy data is suppressed.

    Abstract translation: 公开了一种CT系统及其方法。 该系统包括：提供行李检查中使用的X射线源的固定多平面多源X射线产生装置及其控制系统; 单能量，伪双能量或光谱检测器系统和数据传输系统，其接收穿透行李的X射线的透视数据，并将数据传送到计算机进行处理; 输送机及其控制系统，其控制行李前后移动的速度，并执行断层图像扫描; 以及执行断层图像重建并提供人机交互的主计算机系统。 系统充分利用了代替普通滑环技术的分布式射线源带来的高速度，稳定性等特点。 该系统还采用反几何CT的思想，通过增加射线源数量，减少探测器面积和成本。 随着检测器面积的减小，散射引起的锥束伪影和杯形伪影也减少，并且斜率对双能数据配准的影响受到抑制。

    INSPECTION SYSTEM AND INSPECTION METHOD
    26.
    发明申请
    INSPECTION SYSTEM AND INSPECTION METHOD 有权

    公开(公告)号：US20250046012A1

    公开(公告)日：2025-02-06

    申请号：US18576857

    申请日：2022-07-06

    Applicant: NUCTECH COMPANY LIMITED ,  Tsinghua University

    Inventor： Li ZHANG ,  Zhiqiang CHEN ,  Qingping HUANG ,  Hui DING ,  Yong ZHOU ,  Xin JIN ,  Liming YAO

    IPC: G06T17/00 ,  G01V5/226

    Abstract: An inspection system and method, the inspection system includes: a carrying device, at least one ray source and a detector assembly. The ray source and the detector assembly are lifted or lowered along a central axis of the carrying device relative to the carrying device. When viewed along the central axis, the ray source is translatable between scanning positions relative to the carrying device. When the ray source is at one of the scanning positions the ray source and the detector assembly are lifted or lowered relative to the carrying device along the central axis, and the ray source emits X-rays; and when the ray source and the detector assembly are lifted or lowered a predetermined distance the ray source translates to another scanning position. The inspection system further reconstructs a three-dimensional scanning image of the object to be inspected based on detection data of the detector assembly.

    DEFLECTION ELECTRODE ASSEMBLY, X-RAY SOURCE, AND X-RAY IMAGING SYSTEM
    28.
    发明公开
    DEFLECTION ELECTRODE ASSEMBLY, X-RAY SOURCE, AND X-RAY IMAGING SYSTEM 审中-公开

    公开(公告)号：US20230255576A1

    公开(公告)日：2023-08-17

    申请号：US18011388

    申请日：2021-07-02

    Applicant: TSINGHUA UNIVERSITY ,  Nuctech Company Limited ,  NuRay Technology Co., Ltd.

    Inventor： Zhiqiang CHEN ,  Huaping TANG ,  Xin JIN

    IPC: A61B6/00 ,  A61B6/03

    CPC classification number: A61B6/40 ,  A61B6/03 ,  A61B6/54

    Abstract: The present application relates to a deflection electrode assembly, an X-ray source, and an X-ray imaging system. The deflection electrode assembly includes: a first electrode plate, including a first connection portion and a plurality of first tooth portions, wherein the first electrode plate is formed as a comb shape; and a second electrode plate, including a second connection portion and a plurality of second tooth portions, wherein the second electrode plate is formed as a comb shape. The first electrode plate and the second electrode plate are not in contact with each other, and the plurality of first tooth portions and the plurality of second tooth portions are arranged at least partially in a staggered manner to form a plurality of electron beam passageways; each electron beam passageway is located between adjacent first and second tooth portions.

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