公开(公告)号：US20150171879A1

公开(公告)日：2015-06-18

申请号：US14487179

申请日：2014-09-16

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Keisuke KIMURA ,  Yuichi OKUDA ,  Hideo NAKANE ,  Takaya YAMAMOTO

IPC: H03M1/06 ,  H03M1/46

CPC classification number: H03M1/0607 ,  H01L23/5225 ,  H01L23/5226 ,  H01L23/528 ,  H01L27/0629 ,  H01L2924/0002 ,  H03M1/0604 ,  H03M1/1023 ,  H03M1/124 ,  H03M1/1245 ,  H03M1/442 ,  H03M1/46 ,  H03M1/462 ,  H03M1/468 ,  H01L2924/00

Abstract: A semiconductor device according to an aspect of the invention relates to an AD converter that converts a signal level of an analog signal into a digital value by using a comparator, and determines an amount of adjustment of an offset voltage of the comparator based on an offset determination result of the comparator obtained immediately after a least significant bit (LSB) of a digital value output as a conversion result is converted.

Abstract translation: 根据本发明的一个方面的半导体器件涉及通过使用比较器将模拟信号的信号电平转换为数字值的AD转换器，并且基于偏移来确定比较器的偏移电压的调整量 在作为转换结果的数字值输出的最低有效位（LSB）之后立即获得的比较器的确定结果被转换。