公开(公告)号：US11047901B2

公开(公告)日：2021-06-29

申请号：US16437675

申请日：2019-06-11

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Mee-Hyun Lim ,  Sung-Yeol Kim ,  Seong-Keun Cho ,  Won-Don Joo ,  Jae-Hong Kim ,  Taek-Jin Kim ,  Kyung-Min Lee ,  Sang-Min Lee

IPC: G01R31/26 ,  G01N21/21 ,  G01R1/07 ,  G01R31/308

Abstract: In a method of testing an interconnection substrate, a blocking condition of a reference light reflected from a probe having an intrinsic optical characteristic may be set. An electric field emitted from a test interconnection substrate having a plurality of circuits may change the intrinsic optical characteristics of the probe into test optical characteristics. Light may be irradiated to the probe having the test optical characteristics. The reference light reflected from the probe having the test optical characteristic may be blocked in accordance with the blocking condition. The remaining reflected light that may be due to an abnormal circuit may be detected.

公开(公告)号：US10381925B2

公开(公告)日：2019-08-13

申请号：US15584486

申请日：2017-05-02

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seong-Kwan Lee ,  Sung-Chul Chun ,  Sung-Yeol Kim ,  Jae-Hong Kim

IPC: H02M3/156 ,  G01R1/30 ,  H02M3/02 ,  H02M1/00

Abstract: A power supply apparatus includes first through M-th switching regulators, first through N-th multiplexers, and first through N-th linear regulators, where each of M and N is a natural number greater than or equal to two. The first through M-th switching regulators generate first through M-th reference power signals using an input power signal. The first through N-th multiplexers select one of the first through M-th reference power signals, in response to a power selection signal, to provide first through N-th selection power signals. The first through N-th linear regulators generate first through N-th output power signals using the first through N-th selection power signals. The first through N-th linear regulators are connected to the first through N-th multiplexers, respectively.

公开(公告)号：US20190113565A1

公开(公告)日：2019-04-18

申请号：US15958387

申请日：2018-04-20

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung-Yeol Kim ,  Jae-Hong Kim ,  Kyung-Min Lee ,  Mee-Hyun Lim

IPC: G01R31/28 ,  G01N21/95 ,  G01N21/88 ,  G02F1/13 ,  G01R1/07

Abstract: An interconnect circuit testing apparatus including: an electric signal generating circuit for generating an electric signal; a first electrode arranged at a first region of a substrate, wherein the substrate includes an interconnect circuit, an upper surface and a lower surface; a second electrode arranged at a second region of the substrate; and a sensor for detecting an electric field emitted from the first region or the second region when the electric signal is applied to the substrate through the first electrode and the second electrode.

公开(公告)号：US09941016B2

公开(公告)日：2018-04-10

申请号：US15065920

申请日：2016-03-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Young-Seop Shim ,  Jae-Hong Kim

IPC: G11C16/34 ,  G11C16/16 ,  G11C7/04 ,  G11C16/10 ,  G11C11/56

CPC classification number: G11C16/3495 ,  G11C7/04 ,  G11C11/5628 ,  G11C11/5635 ,  G11C16/10 ,  G11C16/16 ,  G11C16/3445 ,  G11C16/3459 ,  G11C16/349

Abstract: A method of operating a flash memory device includes detecting the number of program/erase cycles that have been executed by the flash memory device. A setting value related to the number of times a program loop is performed is changed according to the detected number of program/erase cycles. Data is programmed within the flash memory by performing the program loop one or more times, in response to receiving a write command. A determination is made whether the programming has passed or failed, based on whether the number of program loops required to program the data within the flash memory is within a boundary identified by the changed setting-value.

公开(公告)号：US09344627B2

公开(公告)日：2016-05-17

申请号：US14105594

申请日：2013-12-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kwi-Sung Yoo ,  Yu-Jin Park ,  Jae-Hong Kim ,  Jin-Ho Seo ,  Wun-Ki Jung ,  Han-Kook Cho ,  Seog-Heon Ham ,  Min-Ji Hwang

IPC: H04N5/225 ,  H04N5/228 ,  H03M1/12 ,  H04N5/232 ,  H04N5/378

CPC classification number: H04N5/23245 ,  H04N5/378

Abstract: An image sensor includes a pixel array and an analog-to-digital (A/D) conversion unit. The pixel array generates an analog signal by sensing an incident light. The A/D conversion unit generates a digital signal in a first operation mode by performing a sigma-delta A/D conversion and a cyclic A/D conversion with respect to the analog signal and generates the digital signal in a second operation mode by performing a single-slope A/D conversion with respect to the analog signal. The image sensor provides a high-quality image in a still image photography mode and a dynamic image video mode.

Abstract translation: 图像传感器包括像素阵列和模数（A / D）转换单元。 像素阵列通过感测入射光产生模拟信号。 A / D转换单元通过对模拟信号执行Σ-ΔA/ D转换和循环A / D转换，以第一操作模式产生数字信号，并通过执行第二操作模式生成数字信号 相对于模拟信号的单斜率A / D转换。 图像传感器在静态图像拍摄模式和动态图像视频模式中提供高质量的图像。