Resist composition and patterning process
    24.
    发明授权
    Resist composition and patterning process 有权
    抗蚀剂组成和图案化工艺

    公开(公告)号:US06399274B1

    公开(公告)日:2002-06-04

    申请号:US09694706

    申请日:2000-10-24

    IPC分类号: G03F7004

    CPC分类号: G03F7/039 G03F7/0045

    摘要: A resist composition contains as a base resin a polymer comprising recurring units of the formula (1-1) or (1-2) and having a Mw of 1,000-500,000. R1 is H, methyl or CO2R2, R2 is a straight, branched or cyclic C1-15 alkyl group, R3 is hydrogen, methyl or CH2CO2R2, R4 is an acid labile group, i is an integer of 1 to 4, and k is equal to 0 or 1. The resist composition has significantly improved sensitivity, resolution and etching resistance and is very useful in precise microfabrication.

    摘要翻译: 抗蚀剂组合物含有作为基础树脂的包含式(1-1)或(1-2)的重复单元并且具有1,000-500,000的Mw的聚合物.R1是H,甲基或CO 2 R 2,R 2是直链,支链的 或环状C 1-15烷基,R 3是氢,甲基或CH 2 CO 2 R 2,R 4是酸不稳定基团,i是1至4的整数,并且k等于0或1.抗蚀剂组合物具有显着提高的灵敏度,分辨率 和抗蚀刻性,并且在精密微细加工中非常有用。