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公开(公告)号：US20200095480A1
公开(公告)日：2020-03-26
申请号：US16570941
申请日：2019-09-13
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell
IPC: C09J9/02 , C09J4/00 , C09J133/06
Abstract: A composition of matter includes an ultraviolet (UV) and thermally curable, non-epoxy acrylic adhesive having a concentration in the range of 5 to 30 weight percent of the composition and conductive metal particles having a concentration in the range of 70 to 95 weight percent of the composition.
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公开(公告)号：US10215776B2
公开(公告)日：2019-02-26
申请号：US14923242
申请日：2015-10-26
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Josiah A. Bartlett , David A. Sailor , Jay Schwichtenberg
Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
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公开(公告)号：US10168356B2
公开(公告)日：2019-01-01
申请号：US14830339
申请日：2015-08-19
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , William A. Hagerup , Ira G. Pollock
IPC: G01R1/067
Abstract: A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.
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公开(公告)号：US10119992B2
公开(公告)日：2018-11-06
申请号：US14676703
申请日：2015-04-01
Applicant: Tektronix, Inc.
Inventor： William A. Hagerup , Julie A. Campbell , Ira G. Pollock , James E. Spinar , Kathleen F. M. Ullom , Charles M. Hartmann , Daniel J. Ayres , Christina D. Enns
IPC: G01R1/067
Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.
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公开(公告)号：US20170052216A1
公开(公告)日：2017-02-23
申请号：US14830339
申请日：2015-08-19
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , William A. Hagerup , Ira G. Pollock
IPC: G01R1/067
CPC classification number: G01R1/06705 , G01R1/06722 , G01R1/06738 , G01R1/06772 , G01R1/06788 , H01R2201/20
Abstract: A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.
Abstract translation: 用于与被测设备的测试点进行电接触的探针包括主体，能够相对于主体线性地行进的刚性构件;柔性臂，其在一端具有测试点接触并且紧固到刚性构件 另一端，以及固定到主体和柔性臂的柔性连杆。 柔性连杆构造成使得柔性臂响应于刚性构件在一个方向上的移动而弯曲，并且响应于刚性构件沿另一方向的行进而使柔性臂解开弯曲。 可以包括第二柔性臂，两个臂打开和关闭以改变测试点触点之间的距离。 光源可以设置在柔性连接件的同时铰接以自动跟踪测试点接触的取向的部分上。
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Patent Agency Ranking
公开(公告)号：US12055578B2
公开(公告)日：2024-08-06
申请号：US17339877
申请日：2021-06-04
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell
CPC classification number: G01R31/2808 , G01R1/06738 , G01R1/06755
Abstract: A method of securing a probe tip to a device under test (DUT), the method comprising: positioning the probe tip near a test point of the DUT, the probe tip comprising a connection point on a signal-path portion of the probe tip and an attachment tab, the connection point making an electrical connection with the test point of the DUT, the attachment tab extending away from the signal-path portion of the probe tip; applying an adhesive to the DUT through a hole in the attachment tab of the probe tip; and curing the adhesive to secure the probe tip to the DUT.
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公开(公告)号：US11808786B2
公开(公告)日：2023-11-07
申请号：US17716435
申请日：2022-04-08
Applicant: TEKTRONIX, INC.
Inventor： Julie A. Campbell , Daniel G. Knierim , Barton T. Hickman
CPC classification number: G01R1/0416 , G01R1/0466 , G01R27/28
Abstract: An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.
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公开(公告)号：US20220011361A1
公开(公告)日：2022-01-13
申请号：US17339877
申请日：2021-06-04
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell
Abstract: A method of securing a probe tip to a device under test (DUT), the method comprising: positioning the probe tip near a test point of the DUT, the probe tip comprising a connection point on a signal-path portion of the probe tip and an attachment tab, the connection point making an electrical connection with the test point of the DUT, the attachment tab extending away from the signal-path portion of the probe tip; applying an adhesive to the DUT through a hole in the attachment tab of the probe tip; and curing the adhesive to secure the probe tip to the DUT.
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公开(公告)号：US20210148640A1
公开(公告)日：2021-05-20
申请号：US17096622
申请日：2020-11-12
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , David Thomas Engquist , Sam J. Strickling
Abstract: A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit. The shroud is configured to enclose a first portion of a probe head of the probe within an interior cavity of the shroud, while permitting a second portion of the probe head to extend out of the shroud. The shroud further includes a fluid outlet passageway configured to permit a heat-transfer fluid to pass from a probe-head end of the interior cavity, through the interior cavity of the shroud, and out of the shroud through an access portion of the shroud. The fluid inlet conduit enters the shroud through the access portion of the shroud, extends through the interior cavity of the shroud, and is configured to introduce the heat-transfer fluid to the probe-head end of the interior cavity.
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公开(公告)号：US20190353683A1
公开(公告)日：2019-11-21
申请号：US16165928
申请日：2018-10-19
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Josiah A. Bartlett
IPC: G01R1/067
Abstract: A test-probe tip having a tip component, a resistive element, and a compliance member. The tip component is configured to electrically connect to a device under test at a first end of the tip component. The resistive element is electrically connected to a second end of the tip component along a signal-flow axis. The resistive element is configured to provide electrical impedance to an electrical signal passing through the resistive element. The compliance member is configured to allow movement of the tip component in a first direction when a mechanical force applied to the tip component in the first direction and to cause movement of the tip component in an opposite, second direction when the mechanical force applied to the tip component is removed or reduced. Architectures for the resistive element are also described.
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