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公开(公告)号：US10119992B2
公开(公告)日：2018-11-06
申请号：US14676703
申请日：2015-04-01
Applicant: Tektronix, Inc.
Inventor： William A. Hagerup , Julie A. Campbell , Ira G. Pollock , James E. Spinar , Kathleen F. M. Ullom , Charles M. Hartmann , Daniel J. Ayres , Christina D. Enns
IPC: G01R1/067
Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.
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Patent Agency Ranking
公开(公告)号：US20180059139A1
公开(公告)日：2018-03-01
申请号：US15806270
申请日：2017-11-07
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , William A. Hagerup , Ira G. Pollock , Christina D. Enns , James E. Spinar , Kathleen F.M. Ullom , Charles M. Hartmann , Daniel J. Ayres
IPC: G01R1/067
CPC classification number: G01R1/06722 , C12Q1/00 , G01R1/06733 , G01R1/06766 , G01R1/06772 , G01R1/06788 , G01R1/073 , G05G1/00 , H01L21/00 , H01L2221/00 , H01R13/2421 , H01R2101/00 , H01R2201/20
Abstract: A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.
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公开(公告)号：US10241133B2
公开(公告)日：2019-03-26
申请号：US15806270
申请日：2017-11-07
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , William A. Hagerup , Ira G. Pollock , Christina D. Enns , James E. Spinar , Kathleen F. M. Ullom , Charles M. Hartmann , Daniel J. Ayres
Abstract: A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.
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公开(公告)号：US09810715B2
公开(公告)日：2017-11-07
申请号：US14587703
申请日：2014-12-31
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Ira G. Pollock , William A. Hagerup , Christina D. Enns
CPC classification number: G01R1/06772 , G01R1/06722 , G01R1/06766 , G01R1/073 , G05G1/00 , H01L21/00 , H01R13/2421 , H01R2101/00 , H01R2201/20 , H03F1/00
Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.
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公开(公告)号：US20160291054A1
公开(公告)日：2016-10-06
申请号：US14676703
申请日：2015-04-01
Applicant: Tektronix, Inc.
Inventor： William A. Hagerup , Julie A. Campbell , Ira G. Pollock , James E. Spinar , Kathleen F.M. Ullom , Charles M. Hartmann , Daniel J. Ayres , Christina D. Enns
IPC: G01R1/067
CPC classification number: G01R1/06722 , G01R1/06733 , G01R1/06788
Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.
Abstract translation: 测试探针尖端可以包括顺应性构件或力偏转组件和尖端部件。 柔性构件或力偏转组件可以包括柱塞部件和容纳柱塞部件的筒部件，其中柱塞部件构造成在筒部件内部轴向滑动。 测试探针尖端还可以包括在筒部件内作用在柱塞部件上的弹簧机构，以及在一端与柱塞部件耦合的电阻/阻抗元件，并且在相对端与尖端部件耦合，电阻/阻抗元件 包括至少一个具有半圆柱形状的杆和位于其上的电阻材料。
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公开(公告)号：US20160187382A1
公开(公告)日：2016-06-30
申请号：US14587703
申请日：2014-12-31
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Ira G. Pollock , William A. Hagerup , Christina D. Enns
IPC: G01R1/067
CPC classification number: G01R1/06772 , G01R1/06722 , G01R1/06766 , G01R1/073 , G05G1/00 , H01L21/00 , H01R13/2421 , H01R2101/00 , H01R2201/20 , H03F1/00
Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.
Abstract translation: 测试探针尖端可以包括顺应性构件或力偏转组件和尖端部件。 柔性构件或力偏转组件可以包括柱塞部件和容纳柱塞部件的筒部件，其中柱塞部件构造成在筒部件内部轴向滑动。 测试探针尖端还可以包括在筒部件内作用于柱塞部件上的弹簧机构，以及阻塞/阻抗元件，例如圆棒电阻器，其一端与柱塞部件耦合，并且在尖端部件处于 对面
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