公开(公告)号：US20040145724A1

公开(公告)日：2004-07-29

申请号：US10683072

申请日：2003-10-10

发明人： Paul D. Hayford ,  David W. Long

IPC分类号： G01B011/16

CPC分类号： G01N21/01 ,  G01N3/02 ,  G01N2201/0233 ,  G01N2203/0017 ,  G01N2203/0025 ,  G01N2203/0238 ,  G01N2203/0242 ,  G01N2203/0647

摘要： Test apparatus comprising means for holding a sample to be tested, means for altering the strain in the sample, an optical arrangement for monitoring the sample to be tested, and processing means for processing the signals resulting from the monitoring of the sample under test, wherein the environment between the optical arrangement and the sample under test is controlled, and wherein the sample to be tested is located in a position external to the controlled environment.

摘要翻译： 包括用于保持待测试样品的装置的测试装置，用于改变样品中的应变的装置，用于监测待测试样品的光学装置，以及用于处理由待测试样品监测产生的信号的处理装置，其中 控制光学布置和被测试样品之间的环境，并且其中待测试的样品位于受控环境外部的位置。

公开(公告)号：US5164603A

公开(公告)日：1992-11-17

申请号：US731038

申请日：1991-07-16

申请人： Nile F. Hartman ,  James W. Larsen ,  Carl M. Verber

发明人： Nile F. Hartman ,  James W. Larsen ,  Carl M. Verber

IPC分类号： G01N21/59 ,  G01N21/86 ,  G01N21/88 ,  G01N21/89 ,  G01N21/892 ,  G01N21/93

CPC分类号： G01N21/8901 ,  G01N2021/4711 ,  G01N2021/5961 ,  G01N2021/8627 ,  G01N2201/0233 ,  G01N2201/04 ,  G01N2201/1085

摘要： An apparatus 10 for inspecting the surface of an object S moving in the direction of travel 23 relative to the apparatus comprises a modular sensing head assembly 11 including a plurality of sensing head modules 12, 13, each of which includes a number of sensing stations 16-21. Each sensing station includes a light source 77, 81, 84 for generating a line of light extending across substantially the width of the surface of the object and a plurality of optical detector means for detecting light scattered from the line of light by the surface of the object. The optical detectors are positioned and oriented to receive scattered light scattered along paths lying in detection planes which are perpendicular to each other and perpendicular to the surface of the object. Signal processing electronics are provided to convert the light received by the detectors into analog signals which are multiplexed, converted to digital signals, filtered and then compared to preselected thresholds to determine the existence of any defects in the surface.

摘要翻译： 用于检查在行进方向23相对于设备移动的物体S的表面的装置10包括：模块化感测头组件11，包括多个感测头模块12,13，每个检测头模块12,13包括多个感测站16 -21。 每个感测站包括用于产生延伸穿过物体表面的宽度的光线的光源77,81,84;以及多个光学检测器装置，用于检测从该光线的表面散射的光 目的。 光学检测器被定位和定向成接收沿着彼此垂直并且垂直于物体表面的检测平面中的路径散射的散射光。 提供信号处理电子设备以将由检测器接收的光转换成模拟信号，该模拟信号被多路复用，转换成数字信号，经过滤波，然后与预先选择的阈值进行比较，以确定表面存在任何缺陷。