GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS

    公开(公告)号:US20240230555A9

    公开(公告)日:2024-07-11

    申请号:US18452457

    申请日:2023-08-18

    CPC classification number: G01N21/9501 G01N2201/0233

    Abstract: Methods and systems for inspecting a specimen are provided. One system includes an inspection subsystem configured for directing light to an area on the specimen and for generating output responsive to light from the area on the specimen. The system also includes a first gas flow subsystem configured for replacing a gas in a first local volume surrounding the area on the specimen with a first medium that scatters less of the light than the gas. In addition, the system includes a second gas flow subsystem configured for replacing the gas in a second local volume proximate the first local volume with a second medium different than the first medium. The system further includes a computer subsystem configured for detecting abnormalities on the specimen based on the output.

    GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS

    公开(公告)号:US20240133825A1

    公开(公告)日:2024-04-25

    申请号:US18452457

    申请日:2023-08-17

    CPC classification number: G01N21/9501 G01N2201/0233

    Abstract: Methods and systems for inspecting a specimen are provided. One system includes an inspection subsystem configured for directing light to an area on the specimen and for generating output responsive to light from the area on the specimen. The system also includes a first gas flow subsystem configured for replacing a gas in a first local volume surrounding the area on the specimen with a first medium that scatters less of the light than the gas. In addition, the system includes a second gas flow subsystem configured for replacing the gas in a second local volume proximate the first local volume with a second medium different than the first medium. The system further includes a computer subsystem configured for detecting abnormalities on the specimen based on the output.

    Universal spectrometer system having modular sampling chamber
    6.
    发明授权
    Universal spectrometer system having modular sampling chamber 失效
    通用光谱仪系统具有模块化采样腔

    公开(公告)号:US4657390A

    公开(公告)日:1987-04-14

    申请号:US703762

    申请日:1985-02-21

    Inventor: Walter M. Doyle

    Abstract: A spectrometer system is disclosed in which the sample-containing chamber is a separately constructed, enclosed modular unit which is readily attachable to, and detachable from, one wall of a housing which constitutes the basic unit of the spectrometer, and which contains an interferometer, one or more detectors, and other portions of the system. Various examples of the essentially unlimited types of sampling modules are disclosed. Also, automatic sample loading and unloading devices are disclosed, which are feasible because of the modular construction. And means of loading and unloading samples without purge loss are disclosed, which are feasible because of the modular construction.

    Abstract translation: 公开了一种光谱仪系统,其中样品容纳室是单独构造的封闭的模块化单元,其容易地附接到构成所述光谱仪的基本单元的壳体的一个壁上并可拆卸,并且其包含干涉仪, 一个或多个检测器和系统的其它部分。 公开了基本上无限类型的采样模块的各种示例。 此外,公开了自动样品装载和卸载装置,这是因为模块化结构是可行的。 并且公开了无吹扫损失的装载和卸载样品,这是因为模块化构造是可行的。

    METHOD AND APPARATUS FOR MEASURING APPEARANCE AND DISAPPEARANCE TEMPERATURES OF WAX FOR TRANSPARENT, TRANSLUCENT AND OPAQUE OILS
    7.
    发明申请
    METHOD AND APPARATUS FOR MEASURING APPEARANCE AND DISAPPEARANCE TEMPERATURES OF WAX FOR TRANSPARENT, TRANSLUCENT AND OPAQUE OILS 有权
    用于测量透明,透明和无油油的WAX外观和不适宜温度的方法和装置

    公开(公告)号:US20160097717A1

    公开(公告)日:2016-04-07

    申请号:US14507979

    申请日:2014-10-07

    Abstract: An apparatus and method for the measurement of wax appearance temperature and wax disappearance temperature. The apparatus includes the following. The sample receptacle having a receptacle opening, including a bottom, at least one side and an open top. The sample receptacle including an inlet and an outlet for sample insertion and removal. The at least one side about the receptacle opening being light absorbing. The sample receptacle including a transparent cover mounted over the open top. The bottom of the receptacle opening having a reflective upper surface. A thermo device temperature change of the sample. A thermometer to register current temperature of the sample. A viewing chamber above the transparent cover, where the viewing chamber is surrounded by material that is light absorbing. A light emitting device to project light through the viewing chamber and the transparent cover.

    Abstract translation: 用于测量蜡外观温度和蜡消失温度的装置和方法。 该装置包括以下装置。 样品容器具有容器开口,包括底部,至少一侧和敞开的顶部。 样品容器包括用于样品插入和取出的入口和出口。 围绕容器开口的至少一侧是光吸收。 样品容器包括安装在开口顶部上的透明盖。 容器开口的底部具有反射的上表面。 样品的热敏元件温度变化。 用于记录样品当前温度的温度计。 在透明盖上方的观察室,其中观察室由吸光材料包围。 一种用于通过观察室和透明盖突出光的发光装置。

    Method for Monitoring by Absorption Spectroscopy During the Forming of Flat Glass and Monitoring Device
    8.
    发明申请
    Method for Monitoring by Absorption Spectroscopy During the Forming of Flat Glass and Monitoring Device 失效
    平板玻璃和监测装置成型过程中吸收光谱监测方法

    公开(公告)号:US20100162766A1

    公开(公告)日:2010-07-01

    申请号:US12063311

    申请日:2006-08-09

    Inventor: Nicolas Docquier

    Abstract: The invention relates to a method for controlling flat glass forming by flowing a molten glass over a liquid tin layer contained in a forming vat wherein a forming characteristic quantity is measured above the glass surface during forming by means of beams generated by at least one absorption spectroscopy-based analyser, wherein the light beams generated by said analyser form a net above the glass surface. A device for carrying out the inventive method comprising an arm for supporting a vessel which comprises a retroreflecting means for receiving a light beam and transmitting it in an opposite direction parallel to an incident optical path is also disclosed.

    Abstract translation: 本发明涉及一种用于通过使熔融玻璃流过包含在成形槽中的液体锡层上来控制平板玻璃形成的方法,其中在成形期间通过至少一个吸收光谱产生的光束在玻璃表面上测量成形特征量 其中由所述分析器产生的光束在玻璃表面上形成网。 还公开了一种用于实施本发明的方法的装置,其包括用于支撑容器的臂,该臂包括用于接收光束并沿与入射光路平行的相反方向透射的后向反射装置。

    Testing of samples
    9.
    发明申请
    Testing of samples 有权
    样品检测

    公开(公告)号:US20060185440A1

    公开(公告)日:2006-08-24

    申请号:US11410686

    申请日:2006-04-24

    Abstract: A method of monitoring the surface of a sample under test is provided and the method comprises the steps of: illuminating the surface with light (20) polarised in a first direction; viewing light reflected from the surface through a polarising filter (27) arranged at 90° to the first direction, wherein the surface of the sample under test is provided with a marked area where diffuse reflection of the incident polarised light will occur in order to improve the contrast between the marked area and the surface of the sample under text.

    Abstract translation: 提供了一种监测待测样品表面的方法,该方法包括以下步骤:用在第一方向上极化的光(20)照射该表面; 从通过与第一方向成90°的偏振滤光器(27)从表面反射的光,其中被测试样品的表面设置有突出的区域,其中将出现入射偏振光的漫反射以便改善 文字标记区域与样品表面之间的对比度。

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