公开(公告)号：US5424633A

公开(公告)日：1995-06-13

申请号：US953845

申请日：1992-09-30

申请人： Jacob Soiferman

发明人： Jacob Soiferman

IPC分类号： G01R31/309 ,  G01R31/315 ,  G01R31/02 ,  H01H31/04

CPC分类号： G01R31/2812 ,  G01R31/309 ,  G01R31/315

摘要： This application describes a method of testing for manufacturing faults and quality of unpopulated or inactive populated electronic printed circuit boards (PCB). This method can be used to develop a new contactless test system (CTS). An electromagnetic field is generated by an energizing plate connected to an AC signal. When a board under test (BUT) is placed within the electromagnetic field, perturbation of the original field by conducting elements on the BUT is solely a function of the geometrical layout of the conducting elements on the BUT. Therefore, measurement of the perturbed electromagnetic field produces a characteristic pattern for the BUT. Such a pattern can then be compared to a known pattern for the same type of board to determine whether the BUT is faulty (shorts or opens) or not faulty. The most distinctive feature of this method is that testing PCBs by this method requires no electrical contact with the BUT due to the use of the energizing plate.

摘要翻译： 本申请描述了一种测试制造故障和未填充或不活动的人口密集的电子印刷电路板（PCB）的质量的方法。 该方法可用于开发新的非接触式测试系统（CTS）。 由与AC信号连接的激励板产生电磁场。 当被测试板（BUT）置于电磁场内时，通过在BUT上传导元件对原始场的扰动仅仅是BUT上的导电元件的几何布局的函数。 因此，扰动电磁场的测量产生了BUT的特征模式。 然后可以将这样的模式与用于相同类型的板的已知模式进行比较，以确定BUT是否有故障（短路或断开）或不发生故障。 该方法最显着的特征是通过这种方法测试PCB不需要使用通电板与BUT电接触。

公开(公告)号：US5414370A

公开(公告)日：1995-05-09

申请号：US191539

申请日：1994-02-04

申请人： Tatsuya Hashinaga ,  Masanori Nishiguchi

发明人： Tatsuya Hashinaga ,  Masanori Nishiguchi

IPC分类号： G01R31/28 ,  G01R31/309

CPC分类号： G01R31/2877 ,  G01R31/2849 ,  G01R31/2884 ,  G01R31/309 ,  G01R31/2856 ,  G01R31/2862 ,  G01R31/2863

摘要： A burn-in apparatus used in burn-in tests includes a burn-in test chamber for accommodating a plurality of semiconductor devices to be tested. Also, the burn-in apparatus includes measuring means for detecting electric characteristics of temperature sensors built in the respective semiconductor devices to individually measure junction temperatures of the semiconductor chips incorporated in the respective semiconductor devices, and laser beam irradiating means or electric heating members. The laser irradiating means or the heating members are controlled by control means, based on outputs of the measuring means. Thus, the junction temperatures are maintained in a set junction temperature range, and the screening accuracy can be improved.

摘要翻译： 用于老化测试的老化装置包括用于容纳待测试的多个半导体器件的老化测试室。 此外，老化装置还包括用于检测内置在各个半导体器件中的温度传感器的电特性的测量装置，以分别测量结合在各个半导体器件中的半导体芯片的结温度，以及激光束照射装置或电加热部件。 激光照射装置或加热构件基于测量装置的输出由控制装置控制。 因此，结温保持在设定的结温范围内，能够提高筛选精度。

公开(公告)号：US5396280A

公开(公告)日：1995-03-07

申请号：US023768

申请日：1993-02-26

申请人： Vincent Caiozza ,  Donald H. Canfield ,  Todd C. Fellows ,  Norman E. Rittenhouse ,  Peter J. Yablonsky

发明人： Vincent Caiozza ,  Donald H. Canfield ,  Todd C. Fellows ,  Norman E. Rittenhouse ,  Peter J. Yablonsky

IPC分类号： G01N21/88 ,  G01R31/309 ,  H04N1/403 ,  H04N7/18

CPC分类号： G01N21/8851 ,  G01R31/309 ,  H04N1/403 ,  H04N7/18

摘要： An optical inspection system is provided in which the background video component of an analog video source which limits imaging integrity is removed enhancing the system's ability to process a wider range of image sources with increase digitizing sensitivity. The overall effects of background and background variations are nulled stabilizing the effective signal to noise ratio, thereby increasing inspection capability of the system and improving the system's process window for effective and efficient inspection.

摘要翻译： 提供了一种光学检查系统，其中去除了限制成像完整性的模拟视频源的背景视频分量，增强了系统以更高的数字化灵敏度处理更宽范围的图像源的能力。 背景和背景变化的整体影响无效，稳定了有效的信噪比，从而提高了系统的检测能力，并改进了系统的过程窗口，从而进行有效和高效的检测。

公开(公告)号：US5197105A

公开(公告)日：1993-03-23

申请号：US706801

申请日：1991-05-29

申请人： Haruo Uemura ,  Tetsuo Hoki

发明人： Haruo Uemura ,  Tetsuo Hoki

IPC分类号： G01N21/956 ,  G01R31/309 ,  G06K9/00

CPC分类号： G01N21/956 ,  G01R31/309 ,  G01N2021/8845 ,  G01N2021/95638 ,  G01N2021/95653

摘要： A set of red light sources (111-113) are provided above a printed board (20). One (111) of the light sources located in the angular aperture of an imaging lens system (140). The red light is applied to the printed board and reflected on a wiring pattern (22) provided thereon. Another light source (120) is provided under the printed board, and emits infrared light to the back surface of the printed board. The infrared light passes through a through hole (25) formed in the printed board and then enters the imaging lens system together with the red light reflected. Compound light consisting of the red light and the infrared light passes through the imaging lens system and is then splitted into the red light and the infrared light at a cold mirror (150). The respective lights are detected by image sensors (161, 162), to thereby obtain respective images of the wiring pattern and the through hole.

公开(公告)号：US5093797A

公开(公告)日：1992-03-03

申请号：US143084

申请日：1988-01-12

申请人： Teruhisa Yotsuya ,  Shigeki Kobayashi ,  Yasuaki Tanimura

发明人： Teruhisa Yotsuya ,  Shigeki Kobayashi ,  Yasuaki Tanimura

IPC分类号： G01R31/28 ,  G01R31/309

CPC分类号： G01R31/309 ,  G01R31/2806

摘要： A printed circuit board inspecting apparatus, in which image data of a packaged circuit board under inspection obtained by picking up the image of the circuit board are processed through predetermined processing procedure for examining packaged states of parts mounted on the packaged cicuit board. The apparatus comprises an imaging unit for picking up the image of a packaged circuit board, a decision unit for deciding the state of the parts mounted on the packaged circuit board, and a visualizing unit for displaying visibly the result of the decision and position of the relevant part in correspondence with each other. The apparatus can further include a land extracting unit for extracting lands from the image obtained through the imaging of the packaged circuit board under inspection, an alarm condition setting unit for setting the condition for generating an alarm, and an alarm generating unit for generating the alarm when the alarm condition is met by the result of decision made by the decision unit.

公开(公告)号：US5060065A

公开(公告)日：1991-10-22

申请号：US483882

申请日：1990-02-23

申请人： Harold Wasserman

发明人： Harold Wasserman

IPC分类号： G01B11/24 ,  G01B11/245 ,  G01N21/88 ,  G01N21/956 ,  G01R31/309 ,  H05K13/08

CPC分类号： G01R31/309 ,  G01N21/8806 ,  G01N21/95684

摘要： A printed circuit board inspection device includes a lighting system for use with the series of cameras associated with the printed circuit board inspection device which is essentially domed in configuration, and which incorporates a plurality of selectively controllable light emitting diodes for developing desired lighting patterns. The light emitting diodes are arranged within the domed fixture to form an array of defined latitudes and longitudes, and are capable of selective activation to develop the particular lighting patterns which are desired. This permits an acquisition of images useful in developing a "topographical display" of the acquired image, which is useful in enhancing the subsequent inspections which are to be performed.

公开(公告)号：US4814621A

公开(公告)日：1989-03-21

申请号：US143059

申请日：1988-01-12

申请人： Henry J. Soth ,  Christopher J. Scarinzi

发明人： Henry J. Soth ,  Christopher J. Scarinzi

IPC分类号： G01N21/88 ,  G01R31/309 ,  H01L21/66 ,  H05K13/08 ,  G01N21/86

CPC分类号： G01R31/309 ,  Y10T29/53183

摘要： Presence, absence, and adequacy of length of component leads are detectable by engaging each lead with a corresponding interposer and monitoring the amount of displacement of each interposer or plunger in response to the lead. Each plunger is provided with an optic fiber for guiding and directing a light beam from a transmitter to a receiver of a sensor when a lead is missing or too short. The lead engaging portion of the plunger is interchangeable to accommodate different lengths of leads and heights of cut and clinch anvils. For DIP components, each half of the inventive device receives all of the leads on one side of the component, with an individual piston for each lead. Thus, mirror image devices may be used for oppositely spaced rows of leads of a DIP, with the spacing between the mirrored halves of the device being adjustable according to the center-to-center (CTC) spacing between leads on opposite sides of the component body. Each plunger of one of the mirror halves is simultaneously engaged by a fluid common to the remaining pistons thereof for extension, as well as retraction, of the lead engaging portions.

公开(公告)号：US4776022A

公开(公告)日：1988-10-04

申请号：US721477

申请日：1985-04-09

申请人： David G. Fox ,  John R. Mann, III

发明人： David G. Fox ,  John R. Mann, III

IPC分类号： G01R31/28 ,  G01R31/309 ,  G06T7/00 ,  G06K9/00

CPC分类号： G06T7/0006 ,  G01R31/2806 ,  G01R31/309 ,  G06T2207/30141

摘要： An apparatus for automatic printed wiring board (PWB) defect detection comprises an array of optical sensors for optically inspecting a printed wire circuit. The array forms a binary image pattern of the PWB which is tested for compliance with logical rules of correctly printed PWB's regarding unterminated conductors; a set of minimum and maximum specified line widths; line spacing width; presence of insulators on conductors and vice versa; presence of pinholes, flecks of copper, and Vees and neck-downs.A method employs an inner enable pattern of pixel bits formed to determine if a feature being viewed is possibly on a conductor line or insulator space. A set of same-state patterns is formed around the center of the matrix with each pattern being progressively larger. The state of opposite pixel points on the same-state patterns is progressively examined to determine the first inner pattern in which opposite pixel points are ot in the same state. Measurement and verification patterns are selected based upon which same-state pattern meets the above test. The measurement pattern is used to determine if the feature is centered in the matrix and the dimensions of the measurement pattern are checked against stored dimensions of acceptable size. The verification pattern is used to ascertain feature characteristics by counting the number of opposite verification pattern pixels, both on conductor, both on insulator and in opposite states and the number of transitions.

摘要翻译： 一种用于自动印刷线路板（PWB）缺陷检测的装置，包括用于光学检查印刷线路的光学传感器阵列。 该阵列形成PWB的二进制图像模式，其被测试符合正确印刷的PWB关于未终止导体的逻辑规则; 一组最小和最大指定线宽; 行距宽度; 导体上存在绝缘子，反之亦然; 针孔，铜斑，Vees和颈缩的存在。 一种方法采用形成的像素位的内部使能模式来确定被观察的特征是否可能在导线或绝缘体空间上。 围绕矩阵的中心形成一组相同状态的图案，每个图案逐渐变大。 逐步检查相同状态图案上的相对像素点的状态，以确定相同像素点处于相同状态的第一内部图案。 基于相同状态模式符合上述测试来选择测量和验证模式。 测量图案用于确定特征是否在矩阵中心，并且针对可接受尺寸的存储尺寸来检查测量图案的尺寸。 验证模式用于通过对导体，绝缘体上和相反状态以及转换次数的对数验证图案像素的数量进行计数来确定特征特征。

公开(公告)号：US4758782A

公开(公告)日：1988-07-19

申请号：US905922

申请日：1986-09-10

申请人： Kouji Kobayashi

发明人： Kouji Kobayashi

IPC分类号： H05K3/00 ,  G01N21/956 ,  G01R31/28 ,  G01R31/309 ,  G06T1/00 ,  G01R31/02

CPC分类号： G01N21/956 ,  G01N21/95607 ,  G01R31/2806 ,  G01R31/309 ,  G01N2021/95638

摘要： Method and apparatus for inspecting a printed circuit board wherein scanned image data are digitized and analyzed according to a feature extraction method and a mutual comparison method. The result of both of the analysis methods is combined with predetermined conditions to control output devices including a CRT display or a marking device. The two complementary methods compensate each others drawbacks so that the reliability of inspection can be improved.

摘要翻译： 根据特征提取方法和相互比较方法对扫描图像数据进行数字化和分析的印刷电路板的检查方法和装置。 两种分析方法的结果与预定条件相结合，以控制包括CRT显示器或标记装置的输出装置。 这两种互补方法相互补偿的缺点，从而可以提高检查的可靠性。

公开(公告)号：US3991302A

公开(公告)日：1976-11-09

申请号：US526301

申请日：1974-11-22

申请人： Frederick G. Danner

发明人： Frederick G. Danner

IPC分类号： G01N25/72 ,  G01R31/08 ,  G01R31/309 ,  G01J5/10 ,  G01R31/28

CPC分类号： G01R31/309 ,  G01N25/72 ,  G01R31/08

摘要： A method for detecting faults in digital and analog circuits including the steps of thermally stabilizing the circuit, applying electrical stimulus to the circuit for a predetermined time period, scanning the circuit to determine the infrared response, applying another desired electrical stimulus to the circuit for a predetermined time period, scanning the circuit to determine the infrared response, repeating the applying and scanning sequence as desired, and comparing the resulting infrared responses with normal infrared profiles to detect and isolate faults in the circuit.

摘要翻译： 一种用于检测数字和模拟电路中的故障的方法，包括以下步骤：热稳定电路，对电路施加电刺激预定时间段，扫描电路以确定红外响应，将另一所需的电刺激应用于电路 扫描电路以确定红外线响应，根据需要重复施加和扫描序列，并将得到的红外响应与正常红外分布进行比较，以检测和隔离电路中的故障。