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    Alternative Near-Field Gradient Probe For The Suppression Of Radio Frequency Interference
    1.
    发明申请
    Alternative Near-Field Gradient Probe For The Suppression Of Radio Frequency Interference 有权

    公开(公告)号：US20220229101A1

    公开(公告)日：2022-07-21

    申请号：US17717270

    申请日：2022-04-11

    申请人： Tom Lavedas

    发明人： Tom Lavedas

    IPC分类号： G01R29/08 ,  G01R31/315

    摘要： A sensor probe. The probe includes a central loop and a plurality of peripheral loops disposed peripherally relative to the central loop. To maximize far-field suppression, current flows in a first direction through the central loop and in a second direction through each one of the plurality of peripheral loops, the first direction opposite to the second direction, and current through the central loop equals current through the plurality of peripheral loops.

    ALTERNATIVE NEAR-FIELD GRADIENT PROBE FOR THE SUPPRESSION OF RADIO FREQUENCY INTERFERENCE
    2.
    发明申请
    ALTERNATIVE NEAR-FIELD GRADIENT PROBE FOR THE SUPPRESSION OF RADIO FREQUENCY INTERFERENCE 审中-公开

    公开(公告)号：US20200264220A1

    公开(公告)日：2020-08-20

    申请号：US16697127

    申请日：2019-11-26

    申请人： Tom Lavedas

    发明人： Tom Lavedas

    IPC分类号： G01R29/08 ,  G01R31/315

    摘要： A sensor probe. The probe includes a central loop and a plurality of peripheral loops disposed peripherally relative to the central loop. To maximize far-field suppression, current flows in a first direction through the central loop and in a second direction through each one of the plurality of peripheral loops, the first direction opposite to the second direction, and current through the central loop equals current through the plurality of peripheral loops.

    High speed magnetic flux sampling
    6.
    发明授权
    High speed magnetic flux sampling 失效

    公开(公告)号：US6118284A

    公开(公告)日：2000-09-12

    申请号：US943218

    申请日：1997-10-06

    申请人： Uttam S. Ghoshal ,  Snigdha Ghoshal

    发明人： Uttam S. Ghoshal ,  Snigdha Ghoshal

    IPC分类号： G01R33/02 ,  G01R31/315 ,  G01R31/28

    CPC分类号： G01R33/02

    摘要： A system for measuring magnetic fields produced by an integrated circuit device-under-test includes a clock generator configured to generate a clock signal, a delay circuit configured to generate a delayed clock signal having a known delay relative to the clock signal, a pulse generator configured to generate a series of pulses having a frequency corresponding to a frequency of the clock signal, the pulses of the series of pulses being offset from the clock signal by the known delay, and a sensor having a property that varies in response to a magnetic field at the sensor. A sampling circuit connected to the sensor and to the pulse generator is configured to measure the property of the sensor at times corresponding to pulses of the series of pulses, and to produce a sampling signal having, for each pulse, a first value (e.g., a logical one) when the property of the sensor indicates that the magnetic field at the sensor exceeds a threshold amount and a second value (e.g., a logical zero) when the property of the sensor indicates that the magnetic field at the sensor does not exceed the threshold amount. A digital filter is connected to the sampling circuit and configured to produce a first indicator when a number of first values in the sampling signal exceeds a predetermined amount and to produce a second indicator when a number of first values in the sampling signal does not exceed a predetermined amount. A counter connected to the digital filter is configured to increment an output signal in response to one of the first and second indicators and to decrement the output signal in response the other of the first and second indicators. A feedback loop including a digital-to-analog converter is connected to the counter and configured to produce an electrical signal proportional to the output signal, the electrical signal causing the feedback loop to produce a feedback magnetic field in proportion to the output signal, the feedback magnetic field being a component of the magnetic field at the sensor. The output signal of the counter corresponds to a magnetic field produced by the device-under-test.

    On-wafer Hall-effect measurement system
    7.
    发明授权
    On-wafer Hall-effect measurement system 失效
    片上霍尔效应测量系统

    公开(公告)号：US5150042A

    公开(公告)日：1992-09-22

    申请号：US763736

    申请日：1991-09-23

    申请人： David C. Look ,  Philip D. Mumford

    发明人： David C. Look ,  Philip D. Mumford

    IPC分类号： G01R31/28 ,  G01R31/315

    CPC分类号： G01R31/315 ,  G01R31/2831

    摘要： A non-destructive measurement system for producing whole wafer maps of sheet Hall concentration and Hall mobility in a GaAs wafer. The wafer need only have van der Pauw patterns available for the wafer measurements to be made. The measurement system includes an automatic test prober apparatus modified to incorporate a powerful permanent magnet providing a magnetic field to produce a Hall effect in the GaAs wafer. A parametric measurement system coupled through test probes to the van der Pauw patterns is programmed to measure sheet resistivity, Hall voltage and magnetic field strength, from which are derived values of sheet Hall concentration and mobility that are stored and mapped.

    摘要翻译： 一种用于在GaAs晶片中生产片状霍尔浓度和霍尔迁移率的整个晶片图的非破坏性测量系统。 晶片只需要可以进行晶圆测量的范德堡模式。 该测量系统包括一个自动测试探针设备，经修改以结合强大的永磁体，提供磁场，以在GaAs晶片中产生霍尔效应。 通过测试探针耦合到范德堡模式的参数测量系统被编程为测量片电阻率，霍尔电压和磁场强度，从中获取存储和映射的片材霍尔浓度和迁移率的导出值。

    Fault location methods and apparatus using current pulse injection
    8.
    发明授权
    Fault location methods and apparatus using current pulse injection 失效
    故障定位方法和装置采用电流脉冲注入

    公开(公告)号：US4377782A

    公开(公告)日：1983-03-22

    申请号：US161485

    申请日：1980-06-20

    申请人： Eric Metcalf ,  Jack Woollven ,  Stephen N. Spens ,  Brian L. A. Kett

    发明人： Eric Metcalf ,  Jack Woollven ,  Stephen N. Spens ,  Brian L. A. Kett

    IPC分类号： G01R31/08 ,  G01R31/28 ,  G01R31/302 ,  G01R31/315 ,  G06F11/22

    CPC分类号： G01R31/088 ,  G01R31/28 ,  G01R31/2806 ,  G01R31/315 ,  G06F11/2273

    摘要： A probe for sensing direction of flow of an injected current pulse along a conductor of a circuit under test is linked to an ATE, to be triggered to inject the pulse during a test sequence at a step previously found by the ATE to establish a faulty state in the circuit. Thus, the faulty one of several components connected to a circuit node can be identified. The probe itself can also be used independently, and injects an approximately triangular-waveform current pulse which has a steep rising edge and a less steep falling edge, thereby inducing a voltage pulse which is asymmetric about the zero voltage level and thus permits discrimination of the direction of current flow. The probe may have a single current injection contact disposed between the limbs of a bifurcated core for the pick-up coil.

    摘要翻译： 用于感测沿着被测电路的导体的注入电流脉冲的流动方向的探针被连接到ATE，以被触发以在ATE先前发现的步骤的测试序列期间注入脉冲以建立故障状态 在电路中。 因此，可以识别连接到电路节点的多个组件中的故障之一。 探头本身也可以独立使用，并且注入大约三角波形的电流脉冲，其具有陡峭的上升沿和较不陡峭的下降沿，从而产生在零电压电平上不对称的电压脉冲，从而允许区分 电流方向。 探针可以具有设置在用于拾取线圈的分叉芯的四肢之间的单电流注入接触。

    Fault location system with enhanced noise immunity
    9.
    发明授权
    Fault location system with enhanced noise immunity 失效
    故障定位系统具有增强的抗噪声能力

    公开(公告)号：US4345201A

    公开(公告)日：1982-08-17

    申请号：US161484

    申请日：1980-06-20

    申请人： Brett A. Thompson ,  John A. Webb ,  Martin B. White

    发明人： Brett A. Thompson ,  John A. Webb ,  Martin B. White

    IPC分类号： G01R31/08 ,  G01R31/28 ,  G01R31/315

    CPC分类号： G01R31/088 ,  G01R31/28 ,  G01R31/2806 ,  G01R31/315

    摘要： A probe for sensing the direction of flow of an injected current pulse along a conductor of a circuit under test. The probe is linked to automatic test equipment (ATE), and is triggered to inject the pulse during a test sequence at a step previously found by the ATE to establish a faulty state in the circuit so that the faulty one of several components connected to a circuit node can be identified. The probe injects an approximately triangular-waveform current pulse which has a steep rising edge and a less steep falling edge, thereby inducing a voltage level and thus permits discrimination of the direction of current flow. To detect low level current pulses in the presence of masking noise, the output of the probe is connected to the series combination of a filter, an integrator and an A/D converter. The circuit under test is set to its faulty state, and then the probe is repeatedly operated, first with the injection of the current pulses inhibited and then with current pulses being injected. An average noise level is calculated, and then compared with the average signal level obtained while pulses are being injected to determine the direction of flow of the injected current pulses.

    摘要翻译： 用于感测沿着被测电路的导体的注入电流脉冲的流动方向的探头。 探头连接到自动测试设备（ATE），并且被触发以在ATE先前发现的步骤期间在测试序列期间注入脉冲，以在电路中建立故障状态，使得几个组件中的有缺陷的一个连接到 电路节点可以被识别。 探头注入近似三角波形的电流脉冲，其具有陡峭的上升沿和较不陡峭的下降沿，从而引起电压电平，从而允许区分电流方向。 为了在存在掩蔽噪声的情况下检测低电平电流脉冲，探头的输出连接到滤波器，积分器和A / D转换器的串联组合。 被测电路设置为故障状态，然后重复操作探头，首先注入电流脉冲，然后注入电流脉冲。 计算平均噪声电平，然后与注入脉冲时获得的平均信号电平进行比较，以确定注入电流脉冲的流向。

    Alternative Near-Field Gradient Probe For The Suppression Of Radio Frequency Interference
    10.
    发明公开
    Alternative Near-Field Gradient Probe For The Suppression Of Radio Frequency Interference 审中-公开

    公开(公告)号：US20240019472A1

    公开(公告)日：2024-01-18

    申请号：US18351564

    申请日：2023-07-13

    申请人： Tom Lavedas

    发明人： Tom Lavedas

    IPC分类号： G01R29/08 ,  G01R31/315

    CPC分类号： G01R29/0878 ,  G01R31/315

    摘要： A sensor probe. The probe includes a central loop and a plurality of peripheral loops disposed peripherally relative to the central loop. To maximize far-field suppression, current flows in a first direction through the central loop and in a second direction through each one of the plurality of peripheral loops, the first direction opposite to the second direction, and current through the central loop equals current through the plurality of peripheral loops.