Fiber optic light guide for measurement of illumination devices
    31.
    发明授权
    Fiber optic light guide for measurement of illumination devices 失效
    用于测量照明装置的光纤光导

    公开(公告)号:US6018607A

    公开(公告)日:2000-01-25

    申请号:US837837

    申请日:1997-04-22

    申请人: Peter Schwarz

    发明人: Peter Schwarz

    IPC分类号: F21V8/00 G01N21/47 G02B6/10

    CPC分类号: G01N21/474 G02B6/0008

    摘要: A fiber optic light guide for a measurement or illumination system is described, in which an inside space left free in a fiber optic light guide unit is bounded laterally by a closed wall formed by the fiber optic light guide unit.

    摘要翻译: 描述了一种用于测量或照明系统的光纤光导,其中在光纤导光单元中留下的内部空间由光纤光导单元形成的封闭壁横向限定。

    Device for measuring optical characteristic quantities of transparent
materials
    32.
    发明授权
    Device for measuring optical characteristic quantities of transparent materials 失效
    用于测量透明材料的光学特征量的装置

    公开(公告)号:US5760890A

    公开(公告)日:1998-06-02

    申请号:US707993

    申请日:1996-07-12

    CPC分类号: G01N21/5907 G01N21/474

    摘要: The invention provides a device for measuring characteristic quantities of an at least partially transparent sample, comprising: an illumination component including a light source (1) which emits light in a predetermined wavelength range and which is arranged such within this illumination component that the light substantially propagates along a predetermined optical axis, a sample reception space provided between this illumination component and a measuring component and arranged such with respect to this optical axis that the light which emerges from the light source first passes a sample located within that sample reception space and then enters this measuring means, a measuring component including a substantially closed measuring space having an opening through which this optical axis extends and through which the light enters after having passed the sample, and which also includes a photodetector component (2) being sensitive at least within this predetermined wavelength range, including at least two detectors, namely a first detector (4) arranged in the optical axis (3) of the illumination component and a second detector (5) arranged in a predetermined radial distance from this optical axis.

    摘要翻译: 本发明提供了一种用于测量至少部分透明样品的特征量的装置,包括:照明部件,包括发射预定波长范围内的光并且在该照明部件内布置的光源(1),其基本上 沿着预定的光轴传播,在该照明部件和测量部件之间设置的样本接收空间,并且相对于该光轴布置,使得从光源出射的光首先通过位于该样本接收空间内的样本,然后 进入该测量装置,测量部件包括基本上封闭的测量空间,该测量空间具有该光轴延伸穿过的开口,并且光在通过样品之后通过该开口进入,并且还包括至少在内部敏感的光电检测器部件(2) 这个预定的波长范围 至少两个检测器,即布置在照明部件的光轴(3)中的第一检测器(4)和从该光轴以预定的径向距离布置的第二检测器(5)。

    Method and apparatus for the quantitative determination of surface properties
    35.
    发明授权
    Method and apparatus for the quantitative determination of surface properties 有权
    用于定量测定表面性质的方法和装置

    公开(公告)号:US08260004B2

    公开(公告)日:2012-09-04

    申请号:US12053518

    申请日:2008-03-21

    申请人: Konrad Lex

    发明人: Konrad Lex

    IPC分类号: G06K9/00 G01N21/00

    摘要: The present disclosure relates to a method for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analysed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analysed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analyzing the image. According to the disclosure, the result value is displayed against the size of the determined surface areas.

    摘要翻译: 本公开涉及一种用于定量测定表面性质的方法,其中记录了包含大量测量值的待分析表面的空间分辨图像。 在第一种方法步骤中,分析测量值以确定具有特定物理性质的那些表面积。 然后确定该物理性质的结果值,其中该结果值是通过分析图像确定的图像的所有这些表面积的物理性质的值的特征。 根据本公开,结果值相对于确定的表面积的大小显示。

    Apparatus for determining optical surface properties of workpieces
    36.
    发明授权
    Apparatus for determining optical surface properties of workpieces 有权
    用于确定工件的光学表面性质的装置

    公开(公告)号:US07973932B2

    公开(公告)日:2011-07-05

    申请号:US12400610

    申请日:2009-03-09

    申请人: Konrad Lex

    发明人: Konrad Lex

    摘要: The invention relates to an apparatus for determining optical surface properties of workpieces, comprising a housing, in the interior of which there is provided a carrier on which the workpiece be arranged, and comprising a radiation device which directs radiation onto the workpiece in a predefined emission direction (E). According to the invention, the housing has in at least one wall an observation opening, through which a region of the workpiece illuminated by the radiation device can be observed in a predefined observation direction (B).

    摘要翻译: 本发明涉及一种用于确定工件的光学表面性质的装置,包括壳体,其内部设置有载体,工件布置在该载体上,并且包括辐射装置,其以预定义的排放将辐射引导到工件上 方向(E)。 根据本发明,壳体在至少一个壁上具有观察开口,通过该观察开口可以沿预定的观察方向(B)观察由辐射装置照射的工件的区域。

    Apparatus for the determination of surface properties
    37.
    发明授权
    Apparatus for the determination of surface properties 有权
    用于测定表面性能的装置

    公开(公告)号:US07659994B2

    公开(公告)日:2010-02-09

    申请号:US11230295

    申请日:2005-09-19

    申请人: Uwe Sperling

    发明人: Uwe Sperling

    IPC分类号: G01B11/30

    摘要: A device for determining properties of surfaces having at least one first radiation device having at least one radiation source emitting radiation, having at least one first radiation detector having a first radiation detector element which captures at least a portion of the radiation emitted from the radiation device and subsequently diffused and/or reflected off a measuring surface and emits at least one measuring signal characteristic of the reflected/diffused radiation, and at least one second radiation detector having a second radiation detector element capturing a portion of the radiation from the radiation device and diffused/reflected off a measuring surface and outputs a measuring signal characteristic of the reflected and/or diffused radiation, and at least one filter device which is placeable both in the optical path between the radiation device and the first radiation detector and in the optical path between the radiation device and the second radiation detector.

    摘要翻译: 一种用于确定具有至少一个具有至少一个发射辐射源的辐射源的第一辐射装置的表面的特性的装置,具有至少一个具有第一辐射检测器元件的第一辐射检测器,该第一辐射检测器捕获从辐射装置发射的辐射的至少一部分 并且随后从测量表面扩散和/或反射并且发射反射/扩散辐射的特征的至少一个测量信号,并且至少一个第二辐射检测器具有捕获来自辐射装置的辐射的一部分的第二辐射检测器元件,以及 从测量表面扩散/反射并输出反射和/或扩散辐射特征的测量信号,以及至少一个可放置在辐射装置和第一辐射检测器之间的光路中以及在光路中的滤光器装置 在辐射装置和第二辐射检测器之间。

    Device for examining the optical properties of surfaces
    38.
    发明授权
    Device for examining the optical properties of surfaces 有权
    用于检查表面光学性能的装置

    公开(公告)号:US07626709B2

    公开(公告)日:2009-12-01

    申请号:US12207214

    申请日:2008-09-09

    IPC分类号: G01B11/30

    摘要: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to and reflected back from the surface wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface, and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

    摘要翻译: 用于检查表面的光学性质的装置包括至少一个第一辐射装置,其以第一预定的空间角度向待检测的表面发射辐射;至少一个第一检测器装置,用于捕获从该表面发射到和反射的辐射 其中允许检测到的辐射的局部分辨率的第一检测器装置相对于该表面至少定位在第二预定的空间角度,以及至少一个另外的辐射装置或第二检测器装置,其在一 检测发射到表面并从表​​面反射回的辐射的第三预定空间角度。

    Method and apparatus for the evaluation of the local servers properties of surfaces
    39.
    发明授权
    Method and apparatus for the evaluation of the local servers properties of surfaces 有权
    用于评估本地服务器表面性能的方法和装置

    公开(公告)号:US07567348B2

    公开(公告)日:2009-07-28

    申请号:US11230316

    申请日:2005-09-19

    IPC分类号: G01N21/55

    CPC分类号: G01N21/57

    摘要: A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

    摘要翻译: 用于空间分辨检查和评估表面性质的方法和装置,特别是影响表面所产生的光学印象的表面的这种特性。 被限定的辐射被引导到被检查表面的第一预定立体角。 此外,特别是通过扩散和反射影响被检查表面的辐射的至少一部分以第二预定义立体角检测。 捕获的至少一个测量变量被空间分辨,其表征受检查表面影响的辐射的至少一个预定特性。 至少在空间分辨测量值的一部分上,确定用于表征表面的至少一个统计参数。

    Device and method for measuring transmission and reflection properties of objects and surfaces

    公开(公告)号:US07027160B2

    公开(公告)日:2006-04-11

    申请号:US09834241

    申请日:2001-04-12

    申请人: Uwe Sperling

    发明人: Uwe Sperling

    IPC分类号: G01N21/47

    摘要: The present invention relates to a device for measuring transmission and reflection properties of objects and surfaces and a method for operating said device. The device is equipped with a housing, an optical measuring base unit and preferably a source of radiation for emitting radiation at a predetermined angle onto a measurement surface, as well as a detecting means for detecting the radiation reflected from said measurement surface. An elastic retaining means serves to elastically support the optical measuring base unit in the housing such that a touchdown surface for setting down said optical measuring base unit on the measurement surface is disposed external the housing and assumes a predetermined stressed position relative the housing in the unpositioned state.