Abstract:
The bank active signal generation circuit comprises a decoded signal generator and an active signal generator. The decoded signal generator generates decoded signals from a first bank access signal, a second bank access signal and a row address signal in response to when a prefetch signal at a first mode. The decoded signal generator also generates decoded signals from the first bank access signal, the second bank access signal, and a third bank access signal in response when the prefetch signal at a second mode. The active signal generator generates bank active signals in response to receiving the decoded signals, an active pulse and a precharge pulse.
Abstract:
A precharge control circuit includes a precharge control unit and a precharge unit. The precharge control unit controls and outputs a precharge signal in response to a read command signal, a write command signal, and a first signal. The precharge unit precharges local input/output lines in response to a signal output from the precharge control unit.
Abstract:
A circuit for outputting data of a semiconductor memory apparatus is provided. A circuit for outputting data of a semiconductor memory apparatus according to an embodiment of the present invention includes a data clock generating unit that generates a data clock, a delayed clock generating unit that receives the data clock and outputs a delayed clock according to a change in an external voltage level, and a clock synchronizing unit that outputs data synchronized with the delayed clock as output data.
Abstract:
A circuit for outputting data of a semiconductor memory apparatus is provided. A circuit for outputting data of a semiconductor memory apparatus according to an embodiment of the present invention includes a data clock generating unit that generates a data clock, a delayed clock generating unit that receives the data clock and outputs a delayed clock according to a change in an external voltage level, and a clock synchronizing unit that outputs data synchronized with the delayed clock as output data.
Abstract:
A semiconductor memory device including a first edge region for receiving a write command through a first pad portion to generate a column enable signal used in creation of a column selection signal; a second edge region including a data transmission control circuit capable of receiving an input data and a data strobe signal through a second pad portion and capable of receiving an address signal from the first pad portion to generate and output transmission data, the data transmission control circuit capable of outputting the column enable signal transmitted from the first edge region; and a core region including a column control portion that is capable of processing the transmission data in response to the column enable signal outputted from the second edge region to send the transmission data to bit lines electrically connected to memory cells.
Abstract:
The bank active signal generation circuit comprises a decoded signal generator and an active signal generator. The decoded signal generator generates decoded signals from a first bank access signal, a second bank access signal and a row address signal in response to when a prefetch signal at a first mode. The decoded signal generator also generates decoded signals from the first bank access signal, the second bank access signal, and a third bank access signal in response when the prefetch signal at a second mode. The active signal generator generates bank active signals in response to receiving the decoded signals, an active pulse and a precharge pulse.
Abstract:
A semiconductor memory includes an address converting circuit which latches an address and a bank signal and generates a latch address for activating a data access path of a second bank group, and converts the latch address according to a level of the bank signal and generates a variable address for activating a data access path of a first bank group, a first column decoder which decodes the variable address and generates a first output enable signal for activating the data access path of the first bank group, and a second column decoder which decodes the latch address and generates a second output enable signal for activating the data access path of the second bank group.
Abstract:
A self-refresh period measurement circuit of a semiconductor device is disclosed, herein which includes a shift register configured to receive an oscillation signal that is periodically enabled after a self-refresh signal is enabled, to allow a self-refresh operation to be performed, and delay the received oscillation signal by a unit self-refresh period to output a delayed oscillation signal, a period measurement start signal generator configured to receive the self-refresh signal and the oscillation signal and generate a period measurement start signal for setting a time that the oscillation signal is enabled for the first time as a start time for measurement of a self-refresh period, and a refresh period output unit configured to receive the period measurement start signal and the delayed oscillation signal from the shift register and generate a refresh period output signal that is enabled for a period from a time that the period measurement start signal is enabled to a time that the delayed oscillation signal is enabled for the first time.
Abstract:
A precharge control circuit includes a precharge control unit and a precharge unit. The precharge control unit controls and outputs a precharge signal in response to a read command signal, a write command signal, and a first signal. The precharge unit precharges local input/output lines in response to a signal output from the precharge control unit.
Abstract:
An apparatus for detecting a refresh period of a semiconductor memory includes a signal generating unit that generates a plurality of signal pairs, each of which includes one among a plurality of first reference signals that are respectively generated with the same timing as first to (N−1)-th pulses of a refresh period signal of order N, and one among a plurality of second reference signals that correspond to the plurality of first reference signals and are respectively generated with the same timing as second to N-th pulses of the refresh period signal. A refresh period detecting unit detects the period of the refresh period signal using one among the plurality of signal pairs.