DEBUG METHOD IMPLEMENTED BY AN NFC DEVICE

    公开(公告)号:US20250061301A1

    公开(公告)日:2025-02-20

    申请号:US18800891

    申请日:2024-08-12

    Abstract: A debug method implemented by a first near field communication (NFC) device includes a step of storing, in a memory of the first NFC device, one or more parameters which are associated with the operation of the first NFC device during a communication with a second distant NFC device. The first NFC device then uses an answer to select (ATS) communication, sent in response to receipt of an answer to select (ATS) communication, to send the stored one or more parameters to the second distant NFC device.

    MEMORY SYSTEM
    32.
    发明申请

    公开(公告)号:US20250053478A1

    公开(公告)日:2025-02-13

    申请号:US18798040

    申请日:2024-08-08

    Inventor: Raphael CLAUSS

    Abstract: A memory system includes a memory with memory blocks. A first logic circuit performs an XOR combinational logic function of a current value of a data addressing mode and of at least one bit of a first data packet including an error correction code of a data element to be written. A second data packet, generated by the first logic circuit, is stored into one of the memory blocks. A second logic circuit performs an XOR combinational logic function of at least one bit of the second packet (such as read from one of the memory blocks) and of the current value of the addressing mode. A weight of the bit of the first data packet corresponds to a weight of the at least one bit of the second read data packet.

    SYSTEMS, APPARATUSES, AND METHODS FOR ON CHIP DYNAMIC IR DROP OSCILLOSCOPE

    公开(公告)号:US20250052788A1

    公开(公告)日:2025-02-13

    申请号:US18788967

    申请日:2024-07-30

    Abstract: Systems, apparatuses, and methods for an on chip dynamic IR oscilloscope are provided. An oscilloscope circuitry may comprise sensor circuitry, voltage generator circuitry, finite state machine, and latch circuitry. The sensor circuitry may include digital logic circuitry, sample and hold circuitry, and sense amplifier circuitry. The voltage generator circuitry may include a voltage generator, analog buffers, switches, and high speed buffer. The finite state machine may control the sensor circuitry to sample a voltage waveform and the voltage generator circuitry to generate a reference voltage that may change over time. The sensing amplifier circuitry may compare the samples to the reference voltage to generate flags when a sample exceeds a reference voltage. The flags may be used to stored the voltages associated with the flags, which may be used to redraw the waveform sampled.

    IN-MEMORY COMPUTATION DEVICE WITH AT LEAST AN IMPROVED DIGITAL DETECTOR FOR A MORE ACCURATE CURRENT MEASUREMENT

    公开(公告)号:US20250046371A1

    公开(公告)日:2025-02-06

    申请号:US18790867

    申请日:2024-07-31

    Abstract: An in-memory computation device receives an input signal and provides an output signal. The device includes a memory array with memory cells coupled to word lines that receive word line activation signals indicative of the input signal and coupled to bit lines that generate bit line currents; and a digital detector for sampling the bit line current and, in response, providing the output signal. A digital detector includes: a control stage that compares the bit line current with at least one reference current and generates corresponding control signals; a selection stage that generates a total selection current based on the first bit line current and on the control signals; an integration stage that samples the total selection current; and a charge counter stage that generates the output signal on the basis of a sampled first total selection current and the control signals.

    MANUFACTURING PROCESS OF A SEMICONDUCTOR ELECTRONIC DEVICE INTEGRATING DIFFERENT ELECTRONIC COMPONENTS AND SEMICONDUCTOR ELECTRONIC DEVICE

    公开(公告)号:US20250040163A1

    公开(公告)日:2025-01-30

    申请号:US18776146

    申请日:2024-07-17

    Inventor: Riccardo DEPETRO

    Abstract: For manufacturing a semiconductor electronic device a wafer is provided which has a substrate layer of semiconductor material having a first portion and a second portion distinct from the first portion. An epitaxial region of a single semiconductor material is grown on the first portion of the substrate layer. An epitaxial multilayer having a heterostructure is grown on the second portion of the substrate layer. A first electronic component based on the single semiconductor material is formed from the epitaxial region and a second electronic component based on heterostructure is formed from the heterostructure. Forming a first electronic component comprises forming a plurality of doped regions in the epitaxial region, after the step of growing an epitaxial multilayer.

    NINETY DEGREE HYBRID COUPLER
    36.
    发明申请

    公开(公告)号:US20250038391A1

    公开(公告)日:2025-01-30

    申请号:US18785654

    申请日:2024-07-26

    Inventor: Vincent KNOPIK

    Abstract: Provided is a coupler including a first assembly of an input unit element, an intermediate unit element, and an output unit element. Each unit element includes a first coil and a second coil arranged in a cross having a general “H” shape. A first input terminal and a second input terminal of the intermediate unit element are coupled to a first output terminal and to a second output terminal of the input unit element, a first output terminal and a second output terminal of the intermediate unit element are coupled to a first input terminal and to a second input terminal of the output unit element, and the input unit element is spatially positioned between the intermediate unit element and the output unit element.

    SCAN-SHIFT BUFFER ISOLATOR FOR DYNAMIC POWER REDUCTION

    公开(公告)号:US20250035703A1

    公开(公告)日:2025-01-30

    申请号:US18770967

    申请日:2024-07-12

    Abstract: An integrated circuit is provided. For example, an integrated circuit comprises a functional data path and a scan-data path. At least a portion of the scan-data path is separate from the functional data path. The portion of the scan-data path which is separate from the functional data path comprises a combined gating/delay element for preventing a scan-data signal from reaching any elements downstream of the combined gating/delay element during a scan mode and for providing some or all of a desired signal delay in the portion of the scan-data path which is separate from the functional data path.

    SPIKING MAXPOOLING NEURON
    39.
    发明申请

    公开(公告)号:US20250028944A1

    公开(公告)日:2025-01-23

    申请号:US18355767

    申请日:2023-07-20

    Abstract: According to an embodiment, a max-pooling neuron with first and second integrator circuits, a comparator circuit, a Schmitt trigger circuit, and a pair of switches is provided. The first and second integrator circuits, respectively filter a first and a second input train from a first and a second neuron of a previous layer to generate a corresponding first and second filtered input train. The comparator circuit amplifies a difference between the first and second filtered input trains and generates an amplified differential signal. The Schmitt trigger circuit generates a binary output signal based on the amplified differential signal. The pair of switches have a common first terminal coupled to an output node of the max-pooling neuron and a common control terminal coupled to the output terminal of the Schmitt trigger circuit. The other terminals of the pair of switches are coupled to respective input trains.

    TEST-TIME OPTIMIZATION WITH FEW SLOW SCAN PADS

    公开(公告)号:US20250027994A1

    公开(公告)日:2025-01-23

    申请号:US18222535

    申请日:2023-07-17

    Abstract: An integrated circuit improves scan testing efficiency by addressing slow Scan-OUT pins. The integrated circuit shifts data through high-frequency Scan-OUT pins every cycle and through low-frequency Scan-OUT pins every other cycle. Data that cannot be shifted through low-frequency pins is stored in an accumulator and later shifted out through high-frequency pins. Despite changing the scan-out data pattern, the tester used for testing the integrated circuit anticipates the resulting pattern, providing for the testing to not be negatively impacted.

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