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公开(公告)号：US20230384245A1
公开(公告)日：2023-11-30
申请号：US18311558
申请日：2023-05-03
Applicant: Sigray, Inc.
Inventor： David Vine , Wenbing Yun , Janos Kirz , Sheraz Gul , Sylvia Jia Yun Lewis , Richard Ian Spink
IPC: G01N23/046 , G01N23/083
CPC classification number: G01N23/046 , G01N2223/204 , G01N2223/309 , G01N23/083
Abstract: A three-dimensional x-ray imaging system includes at least one detector and an x-ray source including an x-ray transmissive vacuum window. The x-ray source is configured to produce diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending through a region of interest of an object to the at least one detector. The diverging x-rays have propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis. The system further includes at least one sample motion stage configured to rotate the object about a rotation axis. The system further includes a sample mount configured to hold the object and comprises a first portion in the propagation paths of at least some of the diverging x-rays and having an x-ray transmission greater than 30% for x-rays having energies greater than 50% of a maximum x-ray energy of an x-ray spectrum of the diverging x-rays.
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公开(公告)号：US20230349842A1
公开(公告)日：2023-11-02
申请号：US18309021
申请日：2023-04-28
Applicant: Sigray, Inc.
Inventor： Wenbing Yun , Ruimin Qiao , Sylvia Jia Yun Lewis , Srivatsan Seshadri , Janos Kirz , Benjamin Donald Stripe
IPC: G01N23/20008
CPC classification number: G01N23/20008 , G01N2223/316
Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.
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公开(公告)号：US20220082516A1
公开(公告)日：2022-03-17
申请号：US17533568
申请日：2021-11-23
Applicant: Sigray, Inc.
Inventor： Wenbing Yun , Srivatsan Seshadri , Ruimin Qiao , Janos Kirz , Sylvia Jia Yun Lewis
IPC: G01N23/223 , G01N23/085
Abstract: A fluorescence mode x-ray absorption spectroscopy apparatus includes an electron bombardment source of x-rays, a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R), a detector, and at least one stage configured to position a sample at a focal point of the Rowland circle with the detector facing the sample.
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公开(公告)号：US11152183B2
公开(公告)日：2021-10-19
申请号：US16920520
申请日：2020-07-03
Applicant: Sigray, Inc.
Inventor： Janos Kirz , William Henry Hansen , Wenbing Yun
Abstract: An x-ray source includes an anode assembly having at least one surface configured to rotate about an axis, the at least one surface in a first region. The x-ray source further includes an electron-beam source configured to emit at least one electron beam configured to bombard the at least one surface of the anode assembly. The electron-beam source includes a housing, a cathode assembly, and a window. The housing at least partially bounds a second region and comprises an aperture. The cathode assembly is configured to generate the at least one electron beam within the second region. The window is configured to hermetically seal the aperture, to maintain a pressure differential between the first region and the second region, and to allow the at least one electron beam to propagate from the second region to the first region.
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公开(公告)号：US10989822B2
公开(公告)日：2021-04-27
申请号：US16427148
申请日：2019-05-30
Applicant: Sigray, Inc.
Inventor： Wenbing Yun , Janos Kirz , Benjamin Donald Stripe
IPC: G01T1/36
Abstract: An x-ray spectrometer includes at least one x-ray optic configured to receive x-rays having an incident intensity distribution as a function of x-ray energy and at least one x-ray detector configured to receive x-rays from the at least one x-ray optic and to record a spatial distribution of the x-rays from the at least one x-ray optic. The at least one x-ray optic includes at least one substrate having at least one surface extending at least partially around and along a longitudinal axis. A distance between the at least one surface and the longitudinal axis in at least one cross-sectional plane parallel to the longitudinal axis varies as a function of position along the longitudinal axis. The at least one x-ray optic further includes at least one mosaic crystal structure and/or a plurality of layers on or over at least a portion of the at least one surface. The plurality of layers has a first plurality of first layers comprising a first material and a second plurality of second layers comprising a second material. The first layers and the second layers alternate with one another in a direction perpendicular to the at least one surface.
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Patent Agency Ranking
公开(公告)号：US20210020398A1
公开(公告)日：2021-01-21
申请号：US16920520
申请日：2020-07-03
Applicant: Sigray, Inc.
Inventor： Janos Kirz , William Henry Hansen , Wenbing Yun
Abstract: An x-ray source includes an anode assembly having at least one surface configured to rotate about an axis, the at least one surface in a first region. The x-ray source further includes an electron-beam source configured to emit at least one electron beam configured to bombard the at least one surface of the anode assembly. The electron-beam source includes a housing, a cathode assembly, and a window. The housing at least partially bounds a second region and comprises an aperture. The cathode assembly is configured to generate the at least one electron beam within the second region. The window is configured to hermetically seal the aperture, to maintain a pressure differential between the first region and the second region, and to allow the at least one electron beam to propagate from the second region to the first region
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公开(公告)号：US20200035440A1
公开(公告)日：2020-01-30
申请号：US16518713
申请日：2019-07-22
Applicant: Sigray, Inc.
Inventor： Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz , William Henry Hansen
Abstract: An x-ray target, x-ray source, and x-ray system are provided. The x-ray target includes a thermally conductive substrate comprising a surface and at least one structure on or embedded in at least a portion of the surface. The at least one structure includes a thermally conductive first material in thermal communication with the substrate. The first material has a length along a first direction parallel to the portion of the surface in a range greater than 1 millimeter and a width along a second direction parallel to the portion of the surface and perpendicular to the first direction. The width is in a range of 0.2 millimeter to 3 millimeters. The at least one structure further includes at least one layer over the first material. The at least one layer includes at least one second material different from the first material. The at least one layer has a thickness in a range of 2 microns to 50 microns. The at least one second material is configured to generate x-rays upon irradiation by electrons having energies in an energy range of 0.5 keV to 160 keV
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公开(公告)号：US10466185B2
公开(公告)日：2019-11-05
申请号：US16276036
申请日：2019-02-14
Applicant: Sigray, Inc.
Inventor： Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz
IPC: G01N23/223 , G01N23/20025 , G01N23/2204 , G01N23/2055
Abstract: An x-ray interrogation system having one or more x-ray beams interrogates an object (i.e., object). A structured source producing an array of x-ray micro-sources can be imaged onto the object. Each of the one or more beams may have a high resolution, such as for example a diameter of about 15 microns or less, at the surface of the object. The illuminating one or more micro-beams can be high resolution in one dimension and/or two dimensions, and can be directed at the object to illuminate the object. The incident beam that illuminates the object has an energy that is greater than the x-ray fluorescence energy.
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公开(公告)号：US10416099B2
公开(公告)日：2019-09-17
申请号：US15927520
申请日：2018-03-21
Applicant: Sigray, Inc.
Inventor： Wenbing Yun , Srivatsan Seshadri , Sylvia Jia Yun Lewis , Janos Kirz , Alan Francis Lyon , Benjamin Donald Stripe
Abstract: A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density. The coatings of the optical train may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.
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公开(公告)号：US10401309B2
公开(公告)日：2019-09-03
申请号：US15173711
申请日：2016-06-05
Applicant: Sigray, Inc.
Inventor： Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz
IPC: G01N23/20 , H01J35/08 , A61B6/00 , G01N23/201 , G21K1/02 , G01N23/223
Abstract: This invention discloses a method and apparatus for x-ray techniques using structured x-ray illumination for examining material properties of an object. In particular, an object with one or more regions of interest (ROIs) having a particular shape, size, and pattern may be illuminated with an x-ray beam whose cross sectional beam profile corresponds to the shape, size and pattern of the ROIs, so that the x-rays of the beam primarily interact only with the ROIs. This allows a greater x-ray flux to be used, enhancing the signal from the ROI itself, while reducing unwanted signals from regions not in the ROI, improving signal-to-noise ratios and/or measurement throughput. This may be used with a number of x-ray measurement techniques, including x-ray fluorescence (XRF), x-ray diffraction (XRD), small angle x-ray scattering (SAXS), x-ray absorption fine-structure spectroscopy (XAFS), x-ray near edge absorption spectroscopy, and x-ray emission spectroscopy.
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