Abstract:
The contact opening through an insulating layer is formed having a straight sidewall portion and a bowl shaped sidewall portion. The bowl shaped sidewall portion is near the top of the insulation layer to provide an enlarged diameter of the contact opening at the top relative to the bottom. A conductive material is then formed in the contact opening in electrical contact with a lower conductive layer. The conductive material forms a plug having an enlarged head, such as a nail head or a flat heat screw shape. The enlarged head protects the silicon and a barrier layer, if present, within the contact from being etched by any subsequent anisotropic etches. Thus, when an electrical interconnection layer such as aluminum is formed overlying the contact plug, the plug acts as an etch stop to prevent etching of a barrier layer of the barrier layer within the contact opening.
Abstract:
A one-time programmable circuit uses forced BJT hFE degradation to permanently store digital information as a logic zero or logic one state. The forced degradation is accomplished by applying a voltage or current to the BJT for a specific time to the reversed biased base-emitter junction, allowing a significant degradation of the junction without destroying it.
Abstract:
An E2PR4 Viterbi detector includes a recovery circuit and receives a signal that represents a sequence of values, the sequence having a potential state. The recovery circuit recovers the sequence from the signal by identifying a surviving path to the potential state and, after identifying the surviving path, adding a modified branch metric to the path metric of the surviving path to generate an updated path metric for the potential state. Updating the path metric of the surviving path after the surviving path is selected allows the E2PR4 Viterbi detector to be smaller and/or faster than an E2PR4 Viterbi detector that updates the path metric before selecting the surviving path.
Abstract translation:PR2维特比检测器包括恢复电路并且接收表示值序列的信号,该序列具有潜在状态。 恢复电路通过识别到潜在状态的幸存路径来恢复序列,并且在识别存活路径之后,将修改的分支度量添加到幸存路径的路径度量以生成用于潜在状态的更新的路径度量。 在存活路径被选择后更新幸存路径的路径度量允许E 2 SUPER PR4维特比检测器比第2个PR4维特比检测器更小和/或更快, 在选择幸存路径之前更新路径度量。
Abstract:
A method for creating and maintaining semi-dynamic frequency hopping communities. Each community is a set of neighboring cells, such as wireless regional area networks (WRANs) according to IEEE 802.22, that follow a protocol defining coordinated frequency hopping operations, e.g., hopping is performed by community members according to a leader-defined hopping pattern rather than to channels selected in the prior operation period. Each community has one leader base station and one or more community member base stations. The leader determines membership, calculates hopping patterns for all members, and distributes the hopping information to the community members. Members provide their neighborhood and channel availability information, e.g., information about their sensing results and channel usage of neighboring WRANs. In exemplary communities, the community members are one-hop neighbors, each community member is configured to perform sensing concurrently with data transmissions, and the number of available channels is greater than the number of members.
Abstract:
A threshold personalization circuit for a reset or supervisor chip includes personalization fuses, which shift a resistor divider to provide a variety of selectable voltage thresholds. The personalization fuses may provide hundreds of millivolts of adjustment. The threshold personalization circuit further includes trim fuses to fine tune the threshold to within a few millivolts of the target threshold voltage. The threshold personalization circuit includes a test mode to cycle through to a particular personalization trim, such that at prelaser testing the personalized value is found (the fuse blow for personalization is emulated) and then the trim fuse amount can be based on the actual final personalized voltage. This results in very accurate threshold voltages for all personalized values.
Abstract:
A reset circuit includes a power supply supplying a power supply voltage, and a band-gap reference that generates a voltage reference signal. A resistor start-up circuit is responsive to the voltage reference signal, and further responsive to an increase in the power supply voltage. The resistor start-up circuit generates a first current when the power supply voltage increases to a first predetermined voltage, and further generates a second current when the power supply voltage increases to a second predetermined voltage. When the second current generated by the resistor start-up circuit is supplied to a resistor divider, the resistor diver delivers an output voltage that is a predetermined portion of the power supply voltage. A comparator compares the voltage reference signal with the resistor divider output voltage, and generates a reset signal when the resistor divider output voltage equals the voltage reference signal.
Abstract:
An apparatus includes a display panel capable of displaying content. The apparatus also includes a light sensor having an integrated circuit and a photo-sensitive device. The photo-sensitive device is capable of measuring an amount of ambient light. The integrated circuit is capable of performing one or more functions associated with the display of the content on the display panel. The apparatus further includes a controller capable of adjusting one or more characteristics of the display panel based on the amount of ambient light measured by the light sensor. The integrated circuit and the photo-sensitive device may be formed on one side of a semiconductor wafer, and the photo-sensitive device may be exposed to the ambient light through an opening in an opposing side of the semiconductor wafer.
Abstract:
An apparatus for a Universal Serial Bus (USB) and wireless smart card is provided. The apparatus includes a mode detection circuit, a switching block, a controller, an antenna, and a wired interface. Furthermore, an apparatus for a triple-mode smart card is also provided herein. The apparatus for the triple mode smart card includes a mode detection circuit, a switching block, a controller, an antenna, and a wired interface. The apparatus for the triple mode smart card operates in one of a wireless mode, a USB mode and an International Standards Organization 7816 mode or other wired mode. Furthermore, the apparatus for any of these smart cards could operate in both the wireless and wired mode(s) without conflict, and without switching power off and on to change configuration.
Abstract:
An apparatus for a Universal Serial Bus (USB) and wireless smart card is provided. The apparatus includes a mode detection circuit, a switching block, a controller, an antenna, and a wired interface. Furthermore, an apparatus for a triple-mode smart card is also provided herein. The apparatus for the triple mode smart card includes a mode detection circuit, a switching block, a controller, an antenna, and a wired interface. The apparatus for the triple mode smart card operates in one of a wireless mode, a USB mode and an International Standards Organization 7816 mode or other wired mode. Furthermore, the apparatus for any of these smart cards could operate in both the wireless and wired mode(s) without conflict, and without switching power off and on to change configuration.
Abstract:
An integrated circuit temperature sensor includes a sensing circuit operable to determine whether the integrated circuit is currently exposed to one of a relatively low temperature or a relatively high temperature. A selection circuit operates to select a measured voltage across the base-emitter of a bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively low temperature or, alternatively, select a measured delta voltage across the base-emitter of the bipolar transistor of the integrated circuit if the sensing circuit indicates that the integrated circuit is currently exposed to the relatively high temperature. A comparator then compares the selected measured voltage across the base-emitter of the bipolar transistor against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage across the base-emitter of the bipolar transistor against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to one of either a too cold or too hot temperature.