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公开(公告)号：US20050073688A1
公开(公告)日：2005-04-07
申请号：US10880361
申请日：2004-06-29
申请人： Uwe Sperling
发明人： Uwe Sperling
IPC分类号： G01N21/892 , G01N21/47 , G01N21/88
CPC分类号： G01N21/8806 , G01N21/474
摘要： A device for determining the properties of surfaces comprising at least one first radiation means (1) having at least one radiation source which emits radiation, at least one radiation detector means (20) which captures at least a portion of the radiation emitting from the at least one radiation source (1) and then diffused and/or reflected off a measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, an optical divider means (11) having a specified thickness positioned in the optical path between the radiation means (1) and the radiation detector means (20). Said optical divider means (11) comprises at least one aperture (15) extending at least in sections at a specified angle different from 0 degrees to the thickness of said optical divider means (11).
摘要翻译： 用于确定包括至少一个具有发射辐射的至少一个辐射源的至少一个第一辐射装置（1）的表面的性质的装置，至少一个辐射检测器装置（20），其捕获从所述辐射源发射的辐射的至少一部分 至少一个辐射源（1），然后从测量表面扩散和/或反射，并且发射出被反射和/或扩散的辐射的特征的至少一个测量信号;具有指定厚度的光学分离器装置（11） 辐射装置（1）和辐射检测装置（20）之间的光路。 所述光分路器装置（11）包括至少一个孔（15），所述至少一个孔（15）以与所述分光装置（11）的厚度不同于0度的规定角度至少部分地延伸。
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公开(公告)号：US06842250B2
公开(公告)日：2005-01-11
申请号：US09736110
申请日：2000-12-13
申请人： Peter Schwarz
发明人： Peter Schwarz
IPC分类号： G01J3/10 , G01J3/50 , G01J3/51 , G01N21/01 , G01N21/25 , G01N21/27 , G01N21/55 , G01N21/57 , G01N21/64 , G01N21/95 , G01N21/00
CPC分类号： G01J3/02 , G01J3/027 , G01J3/0272 , G01J3/0286 , G01J3/10 , G01J3/50 , G01J3/501 , G01J3/502 , G01J3/51 , G01N21/251 , G01N21/57
摘要： The present invention relates to a device and a method for determining the quality of surface. An illuminating light source radiates light at a predetermined angle onto the measurement surface. An optical detecting device receives the light reflected from said measurement surface and converts same into an electrical measurement signal. A processor controls the measurement sequence and evaluates the measurement results, which are emitted via an output device. The illuminating light source comprises at least one light-emitting diode. The light emitted comprises at least blue, green and red spectral components in the visible range of the spectrum. A filter is provided in the path of radiation between the light source and the photosensor.
摘要翻译： 本发明涉及一种用于确定表面质量的装置和方法。 照明光源将预定角度的光照射到测量表面上。 光学检测装置接收从所述测量表面反射的光并将其转换成电测量信号。 处理器控制测量序列并评估通过输出设备发射的测量结果。 照明光源包括至少一个发光二极管。 所发出的光在光谱的可见范围内至少包括蓝色，绿色和红色光谱分量。 在光源和光电传感器之间的辐射路径中提供滤光器。
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43.发明授权Device and process for measuring and analysing spectral radiation, in particular for measuring and analysing color characteristics 失效用于测量和分析光谱辐射的装置和过程，特别是用于测量和分析色彩特性
公开(公告)号：US5844680A
公开(公告)日：1998-12-01
申请号：US809511
申请日：1997-06-03
申请人： Uwe Sperling
发明人： Uwe Sperling
CPC分类号： G01N21/251 , G01J3/50 , G01J3/501 , G01J3/524 , G01J2003/467 , G01J2003/507 , G01J3/513
摘要： A device and process for measuring and analyzing spectral radiation within a desired wavelength range. A number of radiation sources are provided, in combination with a sensor for detecting radiation within the desired wavelength range. The radiation sources are selected to have spectral characteristics that are linearly independent from one another, but overlap so that, in combination, the radiation sources generate radiation over the entire desired wavelength range. Alternatively, a single radiation source generating radiation over the entire desired wavelength range is provided in combination with a plurality of sensors that have spectral sensing characteristics that are linearly independent from one another, but overlap so that, in combination, the sensors sense radiation over the entire desired wavelength range. Further provided is a control unit that stores a number of calibration functions with linearly independent spectral characteristics, the control unit further receiving output values from the sensors to determine the spectral characteristics of the object being measured.
摘要翻译： PCT No.PCT / EP95 / 03789第 371日期：1997年6月3日 102（e）日期1997年6月3日PCT 1995年9月24日PCT PCT。 第WO96 / 09524号公报 日期1996年3月28日用于测量和分析期望波长范围内的光谱辐射的装置和过程。 与用于检测期望波长范围内的辐射的传感器组合提供了许多辐射源。 辐射源被选择为具有彼此线性独立的光谱特征，但重叠，使得辐射源组合在整个所需波长范围内产生辐射。 或者，在整个所需波长范围内产生辐射的单个辐射源与具有彼此线性独立但具有重叠的光谱感测特性的多个传感器组合提供，使得传感器组合地感测在 整个所需的波长范围。 还提供了一种控制单元，其存储具有线性独立频谱特性的多个校准函数，所述控制单元还接收来自传感器的输出值，以确定被测量物体的光谱特性。
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公开(公告)号：US20240183788A1
公开(公告)日：2024-06-06
申请号：US18568994
申请日：2022-05-24
申请人： BYK-GARDNER GMBH
发明人： Uwe SPERLING
CPC分类号： G01N21/8422 , G01N21/29 , G01N21/4738 , G01N21/93 , G01N2021/4783 , G01N2021/8427
摘要： A method for inspecting lacquered surfaces is provided, wherein radiation being irradiated by a first radiation device onto a surface to be inspected at a first predetermined irradiation angle, and a color image recording device recording a spatially resolved image of the surface irradiated by the irradiation direction at a first observation angle, this image recording device having a first predetermined sensitivity dependent on a wavelength of the radiation impinging on the image recording device, wherein an image evaluation device carries out a section-by-section and desirably pixel-by-pixel evaluation of the image recorded by the image recording device.
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公开(公告)号：US11300406B2
公开(公告)日：2022-04-12
申请号：US14749281
申请日：2015-06-24
申请人： BYK-GARDNER GMBH
发明人： Christopher Groh
IPC分类号： G01B11/30
摘要： A multiple-stage method of determining surface properties, with the steps: determining at least one topographical property of at least one region of a surface to be investigated, determining an optical property of at least this region of the surface to be investigated and emitting at least one value which is characteristic of this optical property. When the value which is characteristic of this optical property is determined, the topographical property of the region is taken into consideration.
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公开(公告)号：US09581546B2
公开(公告)日：2017-02-28
申请号：US13538284
申请日：2012-06-29
申请人： Peter Schwarz , Uwe Sperling
发明人： Peter Schwarz , Uwe Sperling
CPC分类号： G01N21/474 , G01N21/55 , G01N21/8806 , G01N2021/1765
摘要： Radiation is irradiated by an irradiation device at a pre-set angle of incidence with respect to the surface onto the surface to be investigated, and the radiation scattered and/or reflected by this surface arrives at a radiation detector device arranged at a pre-set detection angle with respect to the surface and having an image-recording unit which records black-and-white images, wherein this radiation detector device permits a spatially resolved detection of the radiation reaching it. The irradiation device directs radiation in a first wavelength range onto the surface and the image-recording unit records a first spatially resolved image of this radiation scattered and/or reflected from the surface and the irradiation device directs radiation in a second wavelength range onto the surface and the image-recording unit records a second spatially resolved image of this radiation scattered and/or reflected from the surface.
摘要翻译： 照射装置以相对于要被研究的表面上的表面的预定入射角照射辐射，并且由该表面散射和/或反射的辐射到达布置在预定位置的辐射检测器装置 相对于表面的检测角度并具有记录黑白图像的图像记录单元，其中该放射线检测器装置允许对到达其的辐射的空间分辨检测。 照射装置将第一波长范围的辐射引导到表面上，并且图像记录单元记录从表面散射和/或反射的该辐射的第一空间分辨图像，并且照射装置将第二波长范围内的辐射引导到表面上 并且图像记录单元记录从表面散射和/或反射的该辐射的第二空间分辨图像。
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49.发明授权Apparatus and method for measuring optical properties of transparent materials 有权用于测量透明材料的光学性质的装置和方法公开(公告)号：US08749791B2
公开(公告)日：2014-06-10
申请号：US13571210
申请日：2012-08-09
申请人： Severin Wimmer , Peter Schwarz
发明人： Severin Wimmer , Peter Schwarz
CPC分类号： G01N21/553 , G01J1/04 , G01N21/274 , G01N21/55 , G01N21/5907 , G01N2201/065
摘要： An apparatus for measuring optical properties of transparent materials with a first illumination device which illuminates the material to be investigated along a pre-set illumination path with a pre-set radiation, with a radiation recording space which records radiation passed on by the material to be investigated. The radiation recording space is arranged so that radiation emitted by the first illumination device first strikes the material and then at least for a time an inner wall of the radiation recording space. A radiation detector device is arranged to record radiation reflected and/or scattered essentially only from the inner wall. A second illumination device suitable for emitting modulated radiation also illuminates the inner wall.
摘要翻译： 一种用于利用第一照明装置测量透明材料的光学性质的装置，其利用预设辐射沿着预设照明路径照射待研究的材料，其中辐射记录空间将所述材料传播的辐射记录为 调查。 放射线记录空间被布置成使得由第一照明装置发射的辐射首先撞击材料，然后至少在一段时间内辐射辐射记录空间的内壁。 放射线检测器装置被布置成基本上只记录从内壁反射和/或散射的辐射。 适于发射调制辐射的第二照明装置也照亮内壁。
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公开(公告)号：US08355141B2
公开(公告)日：2013-01-15
申请号：US12833709
申请日：2010-07-09
申请人： Peter Schwarz , Uwe Sperling
发明人： Peter Schwarz , Uwe Sperling
IPC分类号： G01B11/24
CPC分类号： G01N21/898 , G01J3/50
摘要： A method for optical investigation of textured surfaces involves the steps of irradiation of radiation onto the surface to be investigated; reception of an image from at least part of the radiation irradiated onto the surface and reflected by the surface; location-resolved evaluation of the image recorded and determination of at least one value K which is characteristic of this image. A parameter G which is characteristic of the surface is determined while using the characteristic value K and while using at least one further property E known beforehand or determined of the surface.
摘要翻译： 纹理表面的光学研究方法涉及将辐射照射到待研究的表面上的步骤; 从辐射到表面上并被表面反射的辐射的至少一部分接收图像; 记录的图像的位置解析评价和作为该图像的特征的至少一个值K的确定。 在使用特征值K的同时，使用预先知道或确定的表面的至少一个其他性质E来确定表面特性的参数G。
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