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    MICROSCOPY OPTOELECTRIC DEVICE WITH FOCUS SCANNING
    43.
    发明申请
    MICROSCOPY OPTOELECTRIC DEVICE WITH FOCUS SCANNING 有权
    具有聚焦扫描的微结构光电器件

    公开(公告)号：US20140184779A1

    公开(公告)日：2014-07-03

    申请号：US14235868

    申请日：2012-07-31

    Applicant: CONSIGLIO NAZIONALE DELLE RICERCHE

    Inventor： Salvatore Siano ,  Andrea Azelio Mencaglia ,  Ilaria Cacciari

    IPC: G02B21/00

    CPC classification number: G02B21/0032 ,  G02B21/0008

    Abstract: A microscopy optoelectronic device for reconstructing a three-dimensional model of a sample, which can be connected to any PC in order to obtain three-dimensional surface micro-reliefs, includes a portable device body, having a casing and a frame supporting: a digital optical sensor; an optical group, coupled to the sensor including an objective lens directed towards a distal end of the device body, faceable towards the sample; a motor that translates the optical group and sensor with respect to said frame; a connector to connect the device body to an energy source and to a device that controls the position of the optical group and to transmit the digitalized images; and a light source that provides diffused lighting at the objective lens arranged to surround a front region with respect to the objective lens and also includes a luminescent and diffusing surface having a tubular portion coaxial to the optical group.

    Abstract translation: 用于重构可以连接到任何PC以获得三维表面微浮雕的样品的三维模型的显微光学装置包括具有壳体和框架支撑的便携式装置主体：数字 光学传感器; 耦合到所述传感器的光学组，包括朝向所述样品的朝向所述器件主体的远端的物镜; 使光学组和传感器相对于所述框架平移的电动机; 用于将设备主体连接到能量源的连接器以及控制光学组的位置并传送数字化图像的设备; 以及光源，其在物镜处提供相对于物镜围绕前区域的散射光，并且还包括具有与光学组同轴的管状部分的发光和扩散表面。

    CONVERTER OF ORBITAL MOMENTUM INTO SPIN MOMENTUM FOR THE POLARIZATION OF PARTICLE BEAMS
    44.
    发明申请
    CONVERTER OF ORBITAL MOMENTUM INTO SPIN MOMENTUM FOR THE POLARIZATION OF PARTICLE BEAMS 有权
    将圆形转换器转换为用于极化粒子的旋转元件

    公开(公告)号：US20130168577A1

    公开(公告)日：2013-07-04

    申请号：US13715662

    申请日：2012-12-14

    Applicant: CONSIGLIO NAZIONALE DELLE RICERCHE

    Inventor： Vincenzo GRILLO ,  Lorenzo MARRUCCI ,  Ebrahim KARIMI ,  Enrico SANTAMATO

    IPC: G21K1/16

    CPC classification number: H01J37/26 ,  G21K1/16 ,  H01J3/02 ,  H01J37/06 ,  H01J2203/0296 ,  H01J2237/06383

    Abstract: An apparatus for spin polarizing a particle beam is adapted to process an input particle beam in such a way as to generate an at least partially spin polarized output particle beam. A vortex beam generator for imparting orbital angular momentum to the input particle beam. An electromagnetic field generator generates a transverse magnetic field, space-variant and symmetric with respect to the axis of the input particle beam, in such a way as to change the spin of the particles and attach thereto different values of orbital angular momentum in dependence on their input spin values. A beam component separating group spatially separates the particles in dependence on their orbital angular momentum values, in such a way as to obtain the at least partially spin polarized output particle beam.

    Abstract translation: 用于自旋极化粒子束的装置适于处理输入粒子束，以便产生至少部分旋转偏振的输出粒子束。 用于将轨道角动量传递给输入粒子束的涡流束发生器。 电磁场发生器以相对于输入粒子束的轴线的空间变化和对称的方式产生横向磁场，以便改变粒子的旋转，并依附于其上附加不同的轨道角动量值 他们的输入自旋值。 光束分量分组基于其轨道角动量值空间上分离颗粒，以获得至少部分自旋极化输出粒子束。

    QUANTUM VARIABLES IMPLEMENTATION
    45.
    发明申请
    QUANTUM VARIABLES IMPLEMENTATION 有权

    公开(公告)号：US20250036997A1

    公开(公告)日：2025-01-30

    申请号：US18414507

    申请日：2024-01-17

    Applicant: International Business Machines Corporation ,  Consiglio Nazionale delle Ricerche

    Inventor： Gabriele Francesco Maria Agliardi ,  Enrico Prati

    IPC: G06N10/60 ,  G06F7/499

    Abstract: The present disclosure relates to a method comprising: providing a quantum register comprising a set of qubits defining a quantum system. The states of a computational basis of the quantum system may be represented by an ordered set of consecutive nonnegative integer numbers, referred to as a set of indexes. A random variable may be determined in accordance with a predefined classical-quantum format, wherein the random variable is valued in a finite domain of classical values such that each value of the domain is derived from a respective index of the set of indexes through an affine relationship, the affine relationship being defined by a scaling factor and an offset factor. The set of qubits may be encoded such that the probability of measuring a state of the quantum system in the computational basis is the probability of observing the domain value associated with the index representing said measured state when sampling the random variable.

    SCINTIGRAPHIC MEASUREMENT DEVICE WITH EXTENDED AREA
    47.
    发明公开
    SCINTIGRAPHIC MEASUREMENT DEVICE WITH EXTENDED AREA 审中-公开

    公开(公告)号：US20240230931A9

    公开(公告)日：2024-07-11

    申请号：US18546898

    申请日：2022-02-23

    Applicant: CONSIGLIO NAZIONALE DELLE RICERCHE

    Inventor： Alessandro SOLURI ,  Roberto MASSARI

    IPC: G01T1/20 ,  G01T1/202

    CPC classification number: G01T1/2018 ,  G01T1/202

    Abstract: Described is a scintigraphic measurement device with extended area, including a measurement structure having a matrix of scintillation crystals and an optoelectronic network for converting photons into electrical signals; a collimator with collimation channels; an electronic processing unit applied to the measurement structure processing the electrical signals generated by the measurement structure. The optoelectronic network has a matrix of optoelectronic conversion modules interconnected according to a two-dimensional distribution to cover the entire measurement area, each optoelectronic conversion module including a two-dimensional matrix of individual elements “Multi Pixel Photon Counter” or individual “Silicon PhotoMultiplier” elements electrically interconnected, and wherein the optoelectronic conversion modules are electrically connected to each other along rows and columns by channels for each row or column and the electronic processing unit is connected to the optoelectronic network for measuring a total electric current of each channel delivered by the optoelectronic conversion modules positioned on the channel.

    Optical device for controlling light from an external light source
    48.
    发明授权
    Optical device for controlling light from an external light source 有权

    公开(公告)号：US12001043B2

    公开(公告)日：2024-06-04

    申请号：US17756734

    申请日：2020-12-04

    Applicant: VitreaLab GmbH ,  CONSIGLIO NAZIONALE DELLE RICERCHE

    Inventor： Jonas Zeuner ,  Chiara Greganti ,  Roberto Osellame

    IPC: G02B6/00 ,  F21V8/00 ,  G02B6/12 ,  G03H1/00

    CPC classification number: G02B6/0036 ,  G02B6/0075 ,  G02B2006/12159 ,  G03H1/0005

    Abstract: An optical device for controlling light from an external light source including: at least a first and a second waveguide for guiding a light beam emitted from the external light source; and at least a first beam shaping structure with a first light emitting area for emitting a light beam and a second beam shaping structure with a second light emitting area for emitting a light beam, wherein the first waveguide guides the light beam emitted from the external light source to the first beam shaping structure and the second waveguide guides the light beam emitted from the external light source to the second beam shaping structure; wherein the first and the second beam shaping structure-are each configured such that the uniformity of the radiant density profile of a light beam emitted from the respective light emitting area of the respective beam shaping structure is higher than that of the light beam guided to the respective beam shaping structure by the respective waveguide. Backlight unit including such an optical device; and optical system, in particular holographic display, including such a backlight unit and a spatial light modulator.

    SCINTIGRAPHIC MEASUREMENT DEVICE WITH EXTENDED AREA
    49.
    发明公开
    SCINTIGRAPHIC MEASUREMENT DEVICE WITH EXTENDED AREA 审中-公开

    公开(公告)号：US20240134069A1

    公开(公告)日：2024-04-25

    申请号：US18546898

    申请日：2022-02-23

    Applicant: CONSIGLIO NAZIONALE DELLE RICERCHE

    Inventor： Alessandro SOLURI ,  Roberto MASSARI

    IPC: G01T1/20 ,  G01T1/202

    CPC classification number: G01T1/2018 ,  G01T1/202

    Abstract: Described is a scintigraphic measurement device with extended area, including a measurement structure having a matrix of scintillation crystals and an optoelectronic network for converting photons into electrical signals; a collimator with collimation channels; an electronic processing unit applied to the measurement structure processing the electrical signals generated by the measurement structure. The optoelectronic network has a matrix of optoelectronic conversion modules interconnected according to a two-dimensional distribution to cover the entire measurement area, each optoelectronic conversion module including a two-dimensional matrix of individual elements “Multi Pixel Photon Counter” or individual “Silicon PhotoMultiplier” elements electrically interconnected, and wherein the optoelectronic conversion modules are electrically connected to each other along rows and columns by channels for each row or column and the electronic processing unit is connected to the optoelectronic network for measuring a total electric current of each channel delivered by the optoelectronic conversion modules positioned on the channel.

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