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    Ultrasonic contrast medium imaging apparatus and method
    41.
    发明授权
    Ultrasonic contrast medium imaging apparatus and method 有权
    超声造影介质成像装置及方法

    公开(公告)号：US07198601B2

    公开(公告)日：2007-04-03

    申请号：US10392612

    申请日：2002-02-01

    Applicant: Hiroshi Kanda ,  Tatsuya Hayashi ,  Tsuyoshi Mitake ,  Minoru Yoshida

    Inventor： Hiroshi Kanda ,  Tatsuya Hayashi ,  Tsuyoshi Mitake ,  Minoru Yoshida

    IPC: A61B8/00

    CPC classification number: A61B8/481 ,  A61B8/463 ,  G01S7/52038 ,  G01S15/8952

    Abstract: An ultrasonic enhanced-contrast imager includes an ultrasonic probe for transmitting an ultrasonic wave to an organism and receiving an ultrasonic wave from the organism, a transmitting section for transmitting an ultrasonic signal to the ultrasonic probe, a receiving section for processing a response signal ultrasonic wave received by the ultrasonic probe, a filter for extracting a specific frequency component from the processed response signal, a setting control section for setting a pass frequency band of the filter on the basis of a frequency band of the response signal from a contrast medium injected to the organism, and a control section for controlling the operation of the filter in the set pass band.

    Abstract translation: 一种超声波增强对比成像器包括：超声波探头，用于将超声波发送到生物体并从生物体接收超声波;发送部，用于向超声波探头发送超声波信号;接收部，用于处理响应信号超声波 由所述超声波探头接收的滤波器，用于从所述经处理的响应信号中提取特定频率分量的滤波器;设置控制部分，用于根据所述响应信号的频带来设置所述滤波器的通过频带， 生物体，以及用于控制设定通带中的过滤器的操作的控制部。

    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected
    42.
    发明申请
    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected 失效
    半导体基板的制造方法以及检查被检查体的图案的缺陷的方法和装置

    公开(公告)号：US20070070336A1

    公开(公告)日：2007-03-29

    申请号：US11605242

    申请日：2006-11-29

    Applicant: Shunji Maeda ,  Yasuhiko Nakayama ,  Minoru Yoshida ,  Hitoshi Kubota ,  Kenji Oka

    Inventor： Shunji Maeda ,  Yasuhiko Nakayama ,  Minoru Yoshida ,  Hitoshi Kubota ,  Kenji Oka

    IPC: G01N21/00

    CPC classification number: G01N21/95607 ,  G01N21/8806 ,  G01N21/9501 ,  G01N21/956 ,  G01N2021/95615 ,  G01N2201/0618 ,  G01N2201/0634

    Abstract: A method of inspecting a specimen, including: emitting a light from a lamp of a light source; illuminating a specimen on which plural patterns are formed with the light emitted from the light source and, passed through an objective lens; forming an optical image of the specimen by collecting light reflected from the specimen by the illuminating and passed through the objective lens and a image forming lens; detecting the optical image with a TDI image sensor; and processing a signal outputted from the TDI image sensor and detecting a defect of a pattern among the plural patterns formed on the specimen, wherein the image detected by the TDI image sensor is formed with light having a wavelength selected from the wavelengths of the light emitted from the light source.

    Abstract translation: 一种检查样本的方法，包括：从光源的灯发射光; 用从光源发射的光照射形成有多个图案的样本，并通过物镜; 通过照射通过收集从样本反射的光并通过物镜和成像透镜来形成样本的光学图像; 用TDI图像传感器检测光学图像; 并处理从TDI图像传感器输出的信号，并且检测在样本上形成的多个图案之间的图案的缺陷，其中由TDI图像传感器检测到的图像由具有选自发射的光的波长的波长的光形成 从光源。

    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected
    43.
    发明授权
    Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected 失效
    半导体基板的制造方法以及检查被检查体的图案的缺陷的方法和装置

    公开(公告)号：US07180584B2

    公开(公告)日：2007-02-20

    申请号：US10686584

    申请日：2003-10-17

    Applicant: Shunji Maeda ,  Yasuhiko Nakayama ,  Minoru Yoshida ,  Hitoshi Kubota ,  Kenji Oka

    Inventor： Shunji Maeda ,  Yasuhiko Nakayama ,  Minoru Yoshida ,  Hitoshi Kubota ,  Kenji Oka

    IPC: G01N21/00

    CPC classification number: G01N21/8806 ,  G01N21/9501 ,  G01N21/956 ,  G01N21/95607 ,  G01N2021/95615 ,  G01N2201/0618 ,  G01N2201/0634

    Abstract: A pattern detection method and apparatus thereof for inspecting with high resolution a micro fine defect of a pattern on an inspected object and a semiconductor substrate manufacturing method and system for manufacturing semiconductor substrates such as semiconductor wafers with a high yield. A micro fine pattern on the inspected object is inspected by irradiating an annular-looped illumination through an objective lens onto a wafer mounted on a stage, the wafer having micro fine patterns thereon. The illumination light may be circularly or elliptically polarized and controlled according to an image detected on the pupil of the objective lens and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect so that simultaneously, a micro fine defect or defects on the micro fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect which occurs on the pattern.

    Abstract translation: 一种用于以高分辨率检查被检查物体上的图案的微细缺陷的图案检测方法及其装置以及以高产率制造半导体晶片等半导体基板的半导体基板的制造方法和系统。 通过将通过物镜的环形照明照射到安装在台架上的晶片上，检查被检查物体上的微细图案，晶片上具有微细精细图案。 照明光可以根据在物镜的光瞳上检测到的图像而被圆形或椭圆偏振并且被控制，并且通过检测来自晶片的反射光来获得图像信号。 将图像信号与参考图像信号进行比较，并且检测出显示不一致的图案的一部分作为缺陷，从而同时以高分辨率检测微细微图案或微细图案上的缺陷。 此外，通过分析缺陷的原因和在图案上发生的缺陷因素来控制生产线的工艺条件。

    Image forming apparatus and method for forming image
    44.
    发明申请
    Image forming apparatus and method for forming image 有权
    用于形成图像的图像形成装置和方法

    公开(公告)号：US20060291902A1

    公开(公告)日：2006-12-28

    申请号：US11166157

    申请日：2005-06-27

    Applicant: Shoko Shimmura ,  Minoru Yoshida ,  Takeshi Watanabe

    Inventor： Shoko Shimmura ,  Minoru Yoshida ,  Takeshi Watanabe

    IPC: G03G15/06 ,  G03G15/30

    CPC classification number: G03G15/06 ,  G03G9/0819 ,  G03G9/0821 ,  G03G2215/0119 ,  G03G2221/0005

    Abstract: The ratio of the particles of developing agent having a particle diameter of not more than A×0.5(μm) (wherein A is a 50% average particle diameter (μm)) and the ratio of the particles of developing agent having a particle diameter of not less than A×1.5(μm) (wherein A is a 50% average particle diameter (μm)) are both confined to not more than 5% by number in a number particle size distribution, the ratio of the developing agent having an adhesive strength of not more than 1.3×10−8(N) is confined to 10% by weight or less and the ratio of the developing agent having an adhesive strength of not less than 3×10−7(N) is confined to 5% by weight or less in a distribution of adhesive strength to the surface of the image carrier.

    Abstract translation: 粒径不大于Ax0.5（母体）（其中A为50％平均粒径（母体））的显影剂颗粒与颗粒直径的显影剂颗粒的比例 不小于Ax1.5（母体）（其中A为50％平均粒径（母体））在数量粒度分布中均被限制在不超过5数量％，具有粘合剂的显影剂的比例 不大于1.3×10 -8（N）的强度限制在10重量％以下，并且具有不小于3×10 -7（N）的粘合强度的显影剂的比例， / N S（N）在图像载体的表面的粘合强度分布中被限制在5重量％以下。

    Image forming apparatus and control method
    45.
    发明申请
    Image forming apparatus and control method 有权
    图像形成装置及控制方法

    公开(公告)号：US20060062602A1

    公开(公告)日：2006-03-23

    申请号：US10945427

    申请日：2004-09-21

    Applicant: Takashi Hatakeyama ,  Shoko Shimmura ,  Toshihiro Kasai ,  Minoru Yoshida ,  Takeshi Watanabe ,  Masashi Takahashi

    Inventor： Takashi Hatakeyama ,  Shoko Shimmura ,  Toshihiro Kasai ,  Minoru Yoshida ,  Takeshi Watanabe ,  Masashi Takahashi

    IPC: G03G15/08

    CPC classification number: G03G15/0893 ,  G03G15/0877 ,  G03G15/0886 ,  G03G2215/0607 ,  G03G2215/0822

    Abstract: A CPU controls a shutter of a developing device so as to enable movement of a developer between a first chamber and a second chamber that store the developer. The CPU rotates a developing roller and mixers of the first and second chambers for a predetermined time T, and stirs and conveys the developer. Thereby, the developer is moved from the first chamber into the second chamber. The amount of movement of the developer is understandable from the rotational speed and shape of each mixer. Hence, the amount of developer, which is moved from the first chamber to the second chamber, is estimated in advance, and about half the developer in the first chamber is replaced.

    Abstract translation: CPU控制显影装置的快门，以便能够在存储显影剂的第一室和第二室之间移动显影剂。 CPU将显影辊和第一和第二室的混合器旋转预定时间T，并搅拌并传送显影剂。 由此，显影剂从第一室移动到第二室。 显影剂的移动量可以从每个混合器的旋转速度和形状来理解。 因此，预先估计从第一室移动到第二室的显影剂的量，并且更换第一室中大约一半的显影剂。

    Image forming apparatus
    46.
    发明授权
    Image forming apparatus 失效
    图像形成装置

    公开(公告)号：US06970666B2

    公开(公告)日：2005-11-29

    申请号：US10804119

    申请日：2004-03-19

    Applicant: Masashi Takahashi ,  Takeshi Watanabe ,  Minoru Yoshida ,  Shoko Shimmura

    Inventor： Masashi Takahashi ,  Takeshi Watanabe ,  Minoru Yoshida ,  Shoko Shimmura

    IPC: G03G15/16 ,  G03G15/00 ,  G03G15/06 ,  G03G15/14 ,  G03G21/00

    CPC classification number: G03G15/168

    Abstract: An image forming apparatus comprises an image carrier which retains an electrostatic latent image corresponding to an original image, a developing device which sticks a toner to the electrostatic latent image to develop a toner image on the image carrier, an intermediate transferrer to which the toner image on the image carrier is transferred, a secondary transfer roller which transfers the toner image on the intermediate transferrer onto paper, and a cleaning member which cleans the secondary transfer roller. The secondary transfer roller can move to a first position to contact the intermediate transferrer, and to a second position to be separated from the intermediate transferrer, and the secondary transfer roller contacts the cleaning member at the second position.

    Abstract translation: 图像形成装置包括保持对应于原始图像的静电潜像的图像载体，将调色剂粘附到静电潜像以在图像载体上显影调色剂图像的显影装置，调色剂图像的中间转印器 传送图像载体上的二次转印辊，其将中间转印器上的调色剂图像转印到纸上，以及清洁二次转印辊的清洁部件。 二次转印辊可以移动到第一位置以接触中间转印器，并且移动到与中间转印器分离的第二位置，并且二次转印辊在第二位置处接触清洁部件。

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