Abstract:
A system and a method for determining a delay time interval of components are provided. The system includes a delay chain of components having a plurality of components wherein each component of the delay chain of components has a first delay time interval. The system utilizes a reference clock signal to stimulate the delay change of components and monitors a delay clock signal output by the delay chain of components to determine a delay time interval associated with each component in the delay chain of components.
Abstract:
The on-chip power supply noise sensor detects high frequency overshoots and undershoots of the power supply voltage. By creating two identical current sources and attaching a time constant circuit to only one, the high frequency transient behavior differs while the low frequency behavior is equivalent. By comparing these currents, the magnitude of very high frequency power supply noise can be sensed and used to either set latches or add to a digital counter. This has the advantage of directly sensing the power supply noise in a manner that does not require calibration. Also, since the sensor requires only one power supply, it can be used anywhere on a chip. Finally, it filters out any lower frequency noise that is not interesting to the circuit designer and can be tuned to detect down to whatever frequency is needed.
Abstract:
A testable digital delay line that uses XOR gates as delay elements is provided. The use of XOR gates enables independent control of each input to the multiplexer. With test inputs that enable each delay element, the multiplexer inputs can be assigned any value during test, thus giving the delay line very robust pattern fault coverage. The XOR gate may consist of three current limiting inverters. A reference voltage generator generates constant voltages between a source voltage, bias voltages, and ground. These constant voltages decide the amount of current through the current limiting inverters. Selecting a different set of reference voltages programs a different current flowing in the current limiting inverters. This programmable current causes a programmable unit delay to be introduced by each XOR gate delay element.
Abstract:
A testable digital delay line that uses XOR gates as delay elements is provided. The use of XOR gates enables independent control of each input to the multiplexer. With test inputs that enable each delay element, the multiplexer inputs can be assigned any value during test, thus giving the delay line very robust pattern fault coverage. The XOR gate may consist of three current limiting inverters. A reference voltage generator generates constant voltages between a source voltage, bias voltages, and ground. These constant voltages decide the amount of current through the current limiting inverters. Selecting a different set of reference voltages programs a different current flowing in the current limiting inverters. This programmable current causes a programmable unit delay to be introduced by each XOR gate delay element.
Abstract:
A power supply voltage insensitive delay element is provided that enables a digital signal to be delayed without variation due to power supply vulnerabilities. Current is limited through the transistors of the delay element using bias voltages produced by a bias voltage generator coupled to the delay element. The bias voltage generator and the delay element are included in a delay line which facilitates the providing of a delay that is insensitive to voltage fluctuations.
Abstract:
CMOS circuitry used to multiplex between data inputs suffers from high sensitivity to power supply noise, resulting in delay variations. By utilizing current controlled inverters in a multiplexer structure, power supply insensitivity can be achieved with either of two multiplexing methods. The first method places switches on the data inputs while the second places the switches on the analog bias voltages inherent to a current controlled inverter.