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公开(公告)号:US11191469B2
公开(公告)日:2021-12-07
申请号:US15988378
申请日:2018-05-24
Applicant: Analog Devices, Inc.
Inventor: Shrenik Deliwala
IPC: A61B5/0408 , H03F3/00 , H03F1/10 , A61B5/00 , A61B5/25 , H03F1/26 , H03F3/45 , H03F3/08 , A61B5/053 , A61B5/369 , A61B5/389
Abstract: System and apparatus for measuring biopotential and implementation thereof. A device for mitigating electromagnetic interference (EMI) thereby increasing signal-to-noise ratio is disclosed. Specifically, the present disclosure relates to an elegant, novel circuit for measuring a plurality of biopotentials in useful in a variety of medical applications. This allows for robust, portable, low-power, higher S/N devices which have historically required a much bigger footprint.
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公开(公告)号:US20210045643A1
公开(公告)日:2021-02-18
申请号:US16933396
申请日:2020-07-20
Applicant: Analog Devices, Inc.
Inventor: Shrenik Deliwala
Abstract: A novel, modified MEMS accelerometer with additional ability to measure optical radiation due to integration of silicon photodiode in the silicon cap. The silicon cap is used to protect the MEMS based accelerometer from the environment. The function of the cap is enhanced to include optical measurement. The entire sensor element including accelerometer and photodiode (XL+PD) occupies no more space than the XL alone.
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公开(公告)号:US10884551B2
公开(公告)日:2021-01-05
申请号:US14276238
申请日:2014-05-13
Applicant: ANALOG DEVICES, INC.
Inventor: Dipak Sengupta , Shrenik Deliwala , Ying Zhao , Bruce Fried , William Schoppee , Woodrow Beckford
Abstract: An integrated gesture sensor module includes an optical sensor die, an application-specific integrated circuit (ASIC) die, and an optical emitter die disposed in a single package. The optical sensor die and ASIC die can be disposed in a first cavity of the package, and the optical emitter die can be disposed in a second cavity of the package. The second cavity can be conical or step-shaped so that the opening defining the cavity increases with distance from the upper surface of the optical emitter die. The upper surface of the optical emitter die may be higher than the upper surface of the optical sensor die. An optical barrier positioned between the first and second cavities can include a portion of a pre-molded, laminate, or ceramic package, molding compound, and/or metallized vias.
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公开(公告)号:US10663325B2
公开(公告)日:2020-05-26
申请号:US16136223
申请日:2018-09-19
Applicant: Analog Devices, Inc.
Inventor: Shrenik Deliwala
IPC: G02B6/42 , G01D5/353 , G02B6/02 , H01L31/167 , G02B6/293
Abstract: Fiber Bragg grating interrogation and sensing used for strain and temperature measurements. A simple, broadband light source is used to interrogate one or more fiber Bragg grating (FBG). Specifically, a packaged LED is coupled to fiber, the light therefrom is reflected off a uniform FBG. The reflected light is subsequently analyzed using a filter and a plurality of Si photodetectors. In particular, the filter is a chirped FBG or an optically coated filter, in accordance with some embodiments. Measurement analysis is performed by ratio of intensities at the plurality of detectors, at least in part.
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公开(公告)号:USD874964S1
公开(公告)日:2020-02-11
申请号:US29692092
申请日:2019-05-22
Applicant: Analog Devices, Inc.
Designer: Jiawen Bai , Ryan Frazier , Ying Zhao , Shrenik Deliwala
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公开(公告)号:US10070237B2
公开(公告)日:2018-09-04
申请号:US15157750
申请日:2016-05-18
Applicant: ANALOG DEVICES, INC.
Inventor: Christopher M. Hanna , Miguel A. Chavez , Shrenik Deliwala
Abstract: Speakers do not always operate linearly. Linearity of the speaker can affect the quality of the sound produced by the speaker, i.e., causing distortions in the sound, if the nonlinearites are not accounted for. To determine nonlinearities of the speaker, the speaker is often modeled and measurements are made to estimate the characteristics of the speaker based on the model. By using an angle sensor and a light source, a speaker manager can make a direct measurement of excursion or displacement of the speaker. Moreover, when the angle sensor, the light source, and the light beam are configured appropriately with respect to the moving cone of the speaker, the measurement can be substantially linear with respect to the amount of excursion or displacement. Such measurements are far simpler to use and in some cases more accurate than measurements made by other types of systems.
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公开(公告)号:US09983355B1
公开(公告)日:2018-05-29
申请号:US15685605
申请日:2017-08-24
Applicant: Analog Devices, Inc.
Inventor: Scott Robert Davis , Shrenik Deliwala , Michael Ziemkiewicz , Derek Gann , Andrew William Sparks , Michael Howard Anderson
CPC classification number: G02B6/262 , G02B6/26 , G02B6/27 , G02B6/2713 , G02B6/35 , G02B6/3536 , G02F1/365
Abstract: An optical coupler can be provided for coupling a light beam into a waveguide. The optical coupler can include a stepped structure, such as to reduce difficulties during manufacture, reduce expenses associated with manufacture, and additionally, to provide an increased acceptance angle of the optical coupler. The waveguide can include a guiding region where a cladding thickness can be increased relative to a coupling region, such as to reduce losses due to evanescent outcoupling in the guiding region.
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公开(公告)号:US20160035914A1
公开(公告)日:2016-02-04
申请号:US14612649
申请日:2015-02-03
Applicant: ANALOG DEVICES, INC.
Inventor: Shrenik Deliwala
IPC: H01L31/0232 , H01L31/18 , H01L31/028
CPC classification number: H01L31/02327 , G02B5/28 , H01L31/02165 , H01L31/103
Abstract: A silicon-based sensor with an integrated multilayer metal-dielectric filter coating for providing a UV transmission curve of interest is disclosed. The sensor includes a silicon-based photodiode and a filter coating integrated with the silicon-based photodiode and comprising a plurality of filter pairs stacked over the silicon-based photodiode. Each filter pair comprises a dielectric layer and a metal layer. The dielectric layers and the metal layers of the plurality of filter pairs are stacked in an alternating fashion. A thickness of the metal layer in at least one filter pair is different from a thickness of the metal layer in at least one other filter pair. A thickness of the dielectric layer in at least one filter pair is different from a thickness of the dielectric layer in at least one other filter pair.
Abstract translation: 公开了一种具有集成的多层金属 - 介质滤波器涂层的硅基传感器,用于提供感兴趣的UV透射曲线。 传感器包括硅基光电二极管和与硅基光电二极管集成的滤光器涂层,并且包括堆叠在硅基光电二极管上的多个滤光片对。 每个滤波器对包括电介质层和金属层。 多个滤波器对的电介质层和金属层以交替的方式堆叠。 至少一个过滤器对中的金属层的厚度与至少一个其它过滤器对中的金属层的厚度不同。 至少一个滤波器对中的电介质层的厚度与至少一个其它滤波器对中的电介质层的厚度不同。
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