Patterned silicon-on-insulator layers and methods for forming the same
    41.
    发明授权
    Patterned silicon-on-insulator layers and methods for forming the same 失效
    图案化的绝缘体上硅层及其形成方法

    公开(公告)号:US07566629B2

    公开(公告)日:2009-07-28

    申请号:US11155029

    申请日:2005-06-16

    IPC分类号: H01L21/76

    CPC分类号: H01L21/76243

    摘要: In an aspect, a method is provided for forming a silicon-on-insulator (SOI) layer. The method includes the steps of (1) providing a silicon substrate; (2) selectively implanting the silicon substrate with oxygen using a low implant energy to form an ultra-thin patterned seed layer; and (3) employing the ultra-thin patterned seed layer to form a patterned SOI layer on the silicon substrate. Numerous other aspects are provided.

    摘要翻译: 在一方面,提供了一种用于形成绝缘体上硅(SOI)层的方法。 该方法包括以下步骤:(1)提供硅衬底; (2)使用低注入能量用氧选择性地注入硅衬底以形成超薄图案种子层; 和(3)使用超薄图案种子层在硅衬底上形成图案化SOI层。 提供了许多其他方面。

    Storage Elements with Disguised Configurations and Methods of Using the Same
    44.
    发明申请
    Storage Elements with Disguised Configurations and Methods of Using the Same 审中-公开
    具有伪装配置的存储元件及其使用方法

    公开(公告)号:US20080067600A1

    公开(公告)日:2008-03-20

    申请号:US11533191

    申请日:2006-09-19

    IPC分类号: H01L23/62

    摘要: In a first aspect, a first apparatus is provided. The first apparatus is an element of an integrated circuit (IC) having (1) a metal-oxide-semiconductor field-effect transistor (MOSFET) having source/drain diffusion regions; (2) an electrical fuse (eFuse) coupled to the MOSFET such that a portion of the eFuse serves as a gate region of the MOSFET; and (3) an implanted region coupled to the source/drain diffusion regions of the MOSFET such that a path between the source/drain diffusion regions functions as a short circuit or an open circuit. Numerous other aspects are provided.

    摘要翻译: 在第一方面中,提供了一种第一装置。 第一装置是具有(1)具有源极/漏极扩散区域的金属氧化物半导体场效应晶体管(MOSFET)的集成电路(IC)的元件; (2)耦合到所述MOSFET的电熔丝(eFuse),使得所述eFuse的一部分用作所述MOSFET的栅极区域; 和(3)耦合到MOSFET的源极/漏极扩散区域的注入区域,使得源极/漏极扩散区域之间的路径用作短路或开路。 提供了许多其他方面。

    MOSFET with decoupled halo before extension
    46.
    发明授权
    MOSFET with decoupled halo before extension 失效
    扩展前分离光环的MOSFET

    公开(公告)号:US07253066B2

    公开(公告)日:2007-08-07

    申请号:US10785895

    申请日:2004-02-24

    IPC分类号: H01L21/336

    摘要: An inverse-T transistor is formed by a method that decouples the halo implant, the deep S/D implant and the extension implant, so that the threshold voltage can be set by adjusting the halo implant without being affected by changes to the extension implant that are intended to alter the series resistance of the device. Formation of the inverse-T structure can be made by a damascene method in which a temporary layer deposited over the layer that will form the cross bar of the T has an aperture formed in it to hold the gate electrode, the aperture being lined with vertical sidewalls that provide space for the ledges that form the T. Another method of gate electrode formation starts with a layer of poly, forms a block for the gate electrode, covers the horizontal surfaces outside the gate with an etch-resistant material and etches horizontally to remove material above the cross bars on the T, the cross bars being protected by the etch resistant material.

    摘要翻译: 反向T晶体管通过使晕轮注入,深S / D注入和延伸注入分离的方法形成,使得阈值电压可以通过调整晕轮植入来设定,而不受扩展植入物的变化的影响 旨在改变装置的串联电阻。 逆T结构的形成可以通过镶嵌方法来形成,其中沉积在层上的临时层将形成T的横杆,其中形成有形成在其中的孔以保持栅电极,孔径垂直排列 为形成T的壁架提供空间的侧壁。栅电极形成的另一种方法从多层开始,形成用于栅电极的块,用耐蚀刻材料覆盖栅极外的水平表面,并水平蚀刻 去除T上的横杆上方的材料,横杆由耐蚀刻材料保护。

    Autonomic thermal monitor and controller for thin film devices
    47.
    发明授权
    Autonomic thermal monitor and controller for thin film devices 失效
    用于薄膜器件的自动热监测器和控制器

    公开(公告)号:US07129557B2

    公开(公告)日:2006-10-31

    申请号:US10853800

    申请日:2004-05-25

    IPC分类号: H01L31/058

    摘要: A thermal monitor diode is provided that comprises a silicon thin film on an insulator mounted on a silicon substrate. An opening extends through the silicon thin film and through the insulator and partially into the silicon substrate and terminates at an end wall. A conductive material is disposed in the opening and extends to the end wall. The substrate has a P/N junction formed therein adjacent the end wall, and an insulating spacer material surrounds the conductive material and is sufficiently thin to allow temperature excursions in the silicon thin film to pass therethrough. The invention also contemplates a method of forming the diode.

    摘要翻译: 提供一种热监测二极管,其包括安装在硅衬底上的绝缘体上的硅薄膜。 开口延伸穿过硅薄膜并穿过绝缘体并部分地延伸到硅衬底中并终止于端壁。 导电材料设置在开口中并延伸到端壁。 衬底具有邻近端壁形成的P / N结,并且绝缘间隔物材料围绕导电材料并且足够薄以允许硅薄膜中的温度偏移通过。 本发明还考虑了形成二极管的方法。

    Method of closing an antifuse using laser energy
    48.
    发明授权
    Method of closing an antifuse using laser energy 失效
    使用激光能量封闭反熔丝的方法

    公开(公告)号:US07115968B2

    公开(公告)日:2006-10-03

    申请号:US10971238

    申请日:2004-10-22

    IPC分类号: H01L29/00

    摘要: A structure and method for providing an antifuse which is closed by laser energy with an electrostatic assist. Two or more metal segments are formed over a semiconductor structure with an air gap or a porous dielectric between the metal segments. Pulsed laser energy is applied to one or more of the metal segments while a voltage potential is applied between the metal segments to create an electrostatic field. The pulsed laser energy softens the metal segment, and the electrostatic field causes the metal segments to move into contact with each other. The electrostatic field reduces the amount of laser energy which must be applied to the semiconductor structure to close the antifuse.

    摘要翻译: 一种用于提供通过静电辅助由激光能量闭合的反熔丝的结构和方法。 在半导体结构之间形成两个或更多个金属段,在金属段之间具有气隙或多孔电介质。 将脉冲激光能量施加到一个或多个金属片段,同时在金属片段之间施加电压电位以产生静电场。 脉冲激光能量软化金属片段,静电场使金属片段彼此接触。 静电场减少必须施加到半导体结构以关闭反熔丝的激光能量的量。

    Method for integrating thermistor
    49.
    发明授权
    Method for integrating thermistor 失效
    热敏电阻集成方法

    公开(公告)号:US07078259B2

    公开(公告)日:2006-07-18

    申请号:US10707746

    申请日:2004-01-08

    IPC分类号: H01L21/00

    摘要: A structure and method are provided for forming a thermistor. Isolation structures are formed in a substrate including at least an upper layer of a single crystal semiconductor. A layer of salicide precursor is deposited over the isolation region and the upper layer. The salicide precursor is then reacted with the upper layer to form a salicide self-aligned to the upper layer. Finally, the unreacted portions of the salicide precursor are then removed while preserving a portion of the salicide precursor over the isolation region as a body of the thermistor. An alternative integrated circuit thermistor is formed from a region of thermistor material in an embossed region of an interlevel dielectric (ILD).

    摘要翻译: 提供了用于形成热敏电阻的结构和方法。 隔离结构形成在至少包括单晶半导体的上层的基板中。 一层自杀化合物前体沉积在隔离区和上层上。 然后将自对准硅化物前体与上层反应以形成与上层自对准的自对准硅化物。 最后,除去自对准硅胶前体的未反应部分,同时在作为热敏电阻体的隔离区域上保留一部分自杀化合物前体。 一种替代的集成电路热敏电阻由层间电介质(ILD)的压花区域中的热敏电阻材料的区域形成。