公开(公告)号：US20080062826A1

公开(公告)日：2008-03-13

申请号：US11579127

申请日：2005-04-27

申请人： Osamu Miyazaki ,  Keiji Sakai ,  Yukio Watanabe

发明人： Osamu Miyazaki ,  Keiji Sakai ,  Yukio Watanabe

IPC分类号： G11B7/00

CPC分类号： G11B7/1353 ,  G11B7/0903 ,  G11B7/0943 ,  G11B7/131 ,  G11B2007/0013

摘要： An optical pickup device includes: a splitting section for splitting a beam; a light-receiving section for receiving the split beams. The light-receiving section includes: a tracking-use main light-receiving region and tracking-use sub light-receiving regions, and auxiliary light-receiving regions. Each of the auxiliary light-receiving regions receives only a light beam reflected off a recording layer other than a recording layer subjected to an information writing/reading process. A light-receiving area of each of the auxiliary light-receiving area is smaller than a light-receiving area of each tracking-use light-receiving region. Further, an optical pickup device includes: a splitting section for splitting a beam; and a light-receiving section for receiving the split beams. The light-receiving section includes a sub light-receiving regions for receiving tracking-use sub beams. The tracking-use sub beams are arranged so as not to allow entering of a focusing-use main beam reflected off a non-targeted recording layer.

摘要翻译： 一种光学拾取装置，包括：用于分割光束的分离部分; 用于接收分束的光接收部分。 光接收部分包括：跟踪用主光接收区域和跟踪用子光接收区域以及辅助光接收区域。 每个辅助光接收区域仅接收经过信息写入/读取处理的记录层以外的记录层反射的光束。 每个辅助光接收区域的光接收区域小于每个跟踪用光接收区域的光接收区域。 此外，光学拾取装置包括：用于分割光束的分离部分; 以及用于接收分束的光接收部分。 光接收部分包括用于接收跟踪用子束的子光接收区域。 跟踪使用子光束被布置成不允许进入从非目标记录层反射的聚焦用主光束。

公开(公告)号：US20080018969A1

公开(公告)日：2008-01-24

申请号：US10586021

申请日：2005-01-11

申请人： Keiji Sakai ,  Renzaburoh Miki ,  Yukio Watanabe ,  Osamu Miyazaki

发明人： Keiji Sakai ,  Renzaburoh Miki ,  Yukio Watanabe ,  Osamu Miyazaki

IPC分类号： G02B5/32

CPC分类号： G11B7/1365 ,  G11B7/123 ,  G11B7/1275 ,  G11B7/1353 ,  G11B7/1372 ,  G11B7/1381 ,  G11B2007/0006

摘要： An optical integrated unit includes a light-emitting portion for emitting a plurality of laser beams having different wavelengths, a wave plate, a polarization hologram element for diffracting a first laser beam emitted from a light source, and a non-polarization hologram element for diffracting a second laser beam emitted from a light source. Wave plate is formed to act as a λ/4 plate for the first laser beam and act as a λ plate or a λ/2 plate for the second laser beam.

摘要翻译： 光学集成单元包括用于发射具有不同波长的多个激光束的发光部分，波片，用于衍射从光源发射的第一激光束的偏振全息元件和用于衍射的非偏振全息元件 从光源发射的第二激光束。 波片形成为用作第一激光束的λ/ 4板，并用作第二激光束的λ板或λ/ 2板。

公开(公告)号：US07315502B2

公开(公告)日：2008-01-01

申请号：US10478263

申请日：2002-11-05

申请人： Keiji Sakai ,  Takahiro Miyake ,  Tetsuo Ueyama ,  Renzaburo Miki ,  Hiroshige Makioka ,  Noboru Fujita ,  Osamu Miyazaki

发明人： Keiji Sakai ,  Takahiro Miyake ,  Tetsuo Ueyama ,  Renzaburo Miki ,  Hiroshige Makioka ,  Noboru Fujita ,  Osamu Miyazaki

IPC分类号： G11B7/135

CPC分类号： G11B7/1353 ,  G11B7/0901 ,  G11B7/094 ,  G11B7/123 ,  G11B7/131

摘要： An object of the present invention is to attain stable tracking servo performance by suppressing an offset caused by a shift of an object lens or a tilt of a disk, despite the one-beam method which does not cause reduction in light quantity of the main beam. A diffraction grating is provided between a hologram and a light receiving section, and a diffraction efficiency of the diffraction grating is varied in a grating longitudinal direction. For example, if an incident light beam on the diffraction grating is shifted in the grating longitudinal direction, the quantity of received light in each light receiving section varies to cause offset. By performing tracking servo so as to cancel the change, it is possible to correct the offset, thereby attaining stable tracking servo performance.

摘要翻译： 本发明的目的是通过抑制由于物镜的偏移引起的偏移或盘的倾斜而获得稳定的跟踪伺服性能，尽管不会导致主光束的光量的减小的单光束方法 。 在全息图和光接收部之间设置衍射光栅，衍射光栅的衍射效率在光栅长度方向上变化。 例如，如果衍射光栅上的入射光束在光栅长度方向上移动，则每个光接收部分中的接收光量变化，导致偏移。 通过执行跟踪伺服以消除变化，可以校正偏移，从而获得稳定的跟踪伺服性能。

公开(公告)号：US20070159954A1

公开(公告)日：2007-07-12

申请号：US10589739

申请日：2005-01-28

申请人： Keiji Sakai ,  Renzaburoh Miki ,  Yukio Watanabe ,  Osamu Miyazaki

发明人： Keiji Sakai ,  Renzaburoh Miki ,  Yukio Watanabe ,  Osamu Miyazaki

IPC分类号： G11B7/00

CPC分类号： G11B7/1275 ,  G11B7/123

摘要： In a light-emitting section (2) for emitting semiconductor laser for CD (4) and semiconductor laser for DVD (5), a radiation angle width θ2 of the DVD semiconductor laser (5) is at least 1.3 times a radiation angle width θ1 of the CD semiconductor laser (4), said radiation angle width being defined as a width of an angle created by two straight lines, which extend respectively from a laser-emitting point to two points where a radiation intensity of laser becomes half of an intensity of the center of laser, which points reside within a plane parallel to a pn junction plane.

摘要翻译： 在用于发射用于CD（4）的半导体激光器和DVD（5）的半导体激光器的发光部分（2）中，DVD半导体激光器（5）的辐射角宽度θ2至少为辐射角宽度的1.3倍 所述辐射角宽度被定义为由两条直线产生的角度的宽度，所述两条直线分别从激光发射点延伸到两点，其中激光的辐射强度变为 激光中心的强度位于平行于pn结面的平面内。

公开(公告)号：US20070146697A1

公开(公告)日：2007-06-28

申请号：US11681996

申请日：2007-03-05

申请人： Minori Noguchi ,  Yoshimasa Ohshima ,  Hidetoshi Nishiyama ,  Shunichi Matsumoto ,  Yukio Kembo ,  Ryouji Matsunaga ,  Keiji Sakai ,  Takanori Ninomiya ,  Tetsuya Watanabe ,  Hisato Nakamura ,  Takahiro Jingu ,  Yoshio Morishige ,  Shuichi Chikamatsu

发明人： Minori Noguchi ,  Yoshimasa Ohshima ,  Hidetoshi Nishiyama ,  Shunichi Matsumoto ,  Yukio Kembo ,  Ryouji Matsunaga ,  Keiji Sakai ,  Takanori Ninomiya ,  Tetsuya Watanabe ,  Hisato Nakamura ,  Takahiro Jingu ,  Yoshio Morishige ,  Shuichi Chikamatsu

IPC分类号： G01N21/88

CPC分类号： B82Y15/00 ,  G01N21/94 ,  G01N21/95623 ,  G01N21/95684 ,  G01N2021/8822 ,  G01R31/308 ,  H01J37/00 ,  H01J2237/022 ,  H01J2237/0225 ,  H01L21/67253 ,  H01L21/67288 ,  H01L21/681 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

摘要： A defect inspection apparatus includes an illumination optical unit for obliquely illuminating an object with a slit-like shaped laser, a first detection optical unit for detecting a first image formed by light reflected from the object by the illumination of the slit-like shaped laser and reflected in a first direction substantially normal to a surface of the object, a second detection optical unit for detecting a second image formed by light reflected from the object by the illumination of the slit-like shaped laser and reflected in a second direction inclined to the normal direction to the surface of the object, an image signal processing unit which processes a signal outputted from the first detection optical unit and a signal outputted from the second detection optical unit, and an output unit which outputs information processed by the image signal processing unit.

摘要翻译： 缺陷检查装置包括：用狭缝状激光器对物体进行倾斜照明的照明光学单元;第一检测光学单元，用于检测由所述狭缝状激光的照射而从物体反射的光形成的第一图像;以及 反射在基本上垂直于物体的表面的第一方向上;第二检测光学单元，用于检测由通过照射狭缝状激光而从物体反射的光形成的第二图像，并以与第二方向倾斜的第二方向反射 对象物的表面的正常方向，处理从第一检测光学单元输出的信号的图像信号处理单元和从第二检测光学单元输出的信号，以及输出单元，其输出由图像信号处理单元处理的信息 。

公开(公告)号：US20070146696A1

公开(公告)日：2007-06-28

申请号：US11681981

申请日：2007-03-05

申请人： Minori Noguchi ,  Yoshimasa Ohshima ,  Hidetoshi Nishiyama ,  Shunichi Matsumoto ,  Yukio Kembo ,  Ryouji Matsunaga ,  Keiji Sakai ,  Takanori Ninomiya ,  Tetsuya Watanabe ,  Hisato Nakamura ,  Takahiro Jingu ,  Yoshio Morishige ,  Shuichi Chikamatsu

发明人： Minori Noguchi ,  Yoshimasa Ohshima ,  Hidetoshi Nishiyama ,  Shunichi Matsumoto ,  Yukio Kembo ,  Ryouji Matsunaga ,  Keiji Sakai ,  Takanori Ninomiya ,  Tetsuya Watanabe ,  Hisato Nakamura ,  Takahiro Jingu ,  Yoshio Morishige ,  Shuichi Chikamatsu

IPC分类号： G01N21/88

CPC分类号： B82Y15/00 ,  G01N21/94 ,  G01N21/95623 ,  G01N21/95684 ,  G01N2021/8822 ,  G01R31/308 ,  H01J37/00 ,  H01J2237/022 ,  H01J2237/0225 ,  H01L21/67253 ,  H01L21/67288 ,  H01L21/681 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

摘要： A method for detecting defects on a specimen includes mounting a specimen on a table with which is movable, obliquely projecting a laser as a line onto a surface of the specimen, detecting with an image sensor an image of light formed by light reflected from the specimen and passed through a filter which blocks scattered light resulting from repetitive patterns formed on the specimen, processing a signal outputted from the image sensor to extract defects of the specimen, and a displaying information of defects extracted by the signal processor.

摘要翻译： 一种检测试样缺陷的方法，其特征在于，将试样安装在可移动的台面上，将作为线的激光线倾斜投射到试样的表面上，用图像传感器检测由试样反射的光形成的光的图像 通过滤波器，该滤波器阻挡由样本上形成的重复图案产生的散射光，处理从图像传感器输出的信号，提取样本的缺陷，以及由信号处理器提取的缺陷的显示信息。

公开(公告)号：US07136409B2

公开(公告)日：2006-11-14

申请号：US10812317

申请日：2004-03-30

申请人： Masahiro Ikehara ,  Katsushige Masui ,  Kazuhiro Tsuchida ,  Keiji Sakai

发明人： Masahiro Ikehara ,  Katsushige Masui ,  Kazuhiro Tsuchida ,  Keiji Sakai

IPC分类号： H01S3/08 ,  G11B7/12

CPC分类号： G11B7/1353 ,  G02B27/106 ,  G02B27/1086 ,  G02B27/145 ,  G02B27/283 ,  G11B7/123 ,  G11B7/131 ,  G11B7/1381 ,  H01S5/02212 ,  H01S5/02248 ,  H01S5/02296

摘要： In this semiconductor laser device, a polarization hologram transmits an outgoing beam directed from a semiconductor laser chip to an optical disk as a forward beam without diffracting the beam, and diffracts a backward beam of the laser beam, which is a return beam of the forward beam that has been reflected by the optical disk, so that the backward beam is deflected from a direction directed toward the semiconductor laser chip part and further directed toward first, second photoreception parts. Therefore, optical loss on the forward way from the semiconductor laser chip to the optical disk can be reduced, and return light to the semiconductor laser chip can be suppressed, so that a high-power, high-sensitivity semiconductor laser device can be realized.

摘要翻译： 在该半导体激光器件中，偏振全息图将来自半导体激光器芯片的出射光束作为前向光束传输到光盘而不衍射光束，并且衍射作为向前的返回光束的激光束的反向光束 光束被反射的光束，使得反射光束从朝向半导体激光器芯片部分的方向偏转并进一步朝向第一，第二光接收部分。 因此，可以减少从半导体激光器芯片向光盘的正向移动的光损耗，并且可以抑制向半导体激光器芯片的返回光，从而可以实现高功率，高灵敏度的半导体激光器件。

公开(公告)号：US07098055B2

公开(公告)日：2006-08-29

申请号：US11244078

申请日：2005-10-06

申请人： Minori Noguchi ,  Yoshimasa Ohshima ,  Hidetoshi Nishiyama ,  Shunichi Matsumoto ,  Yukio Kembo ,  Ryouji Matsunaga ,  Keiji Sakai ,  Takanori Ninomiya ,  Tetsuya Watanabe ,  Hisato Nakamura ,  Takahiro Jingu ,  Yoshio Morishige ,  Shuichi Chikamatsu

发明人： Minori Noguchi ,  Yoshimasa Ohshima ,  Hidetoshi Nishiyama ,  Shunichi Matsumoto ,  Yukio Kembo ,  Ryouji Matsunaga ,  Keiji Sakai ,  Takanori Ninomiya ,  Tetsuya Watanabe ,  Hisato Nakamura ,  Takahiro Jingu ,  Yoshio Morishige ,  Shuichi Chikamatsu

IPC分类号： H01L21/66 ,  G01R31/26

CPC分类号： B82Y15/00 ,  G01N21/94 ,  G01N21/95623 ,  G01N21/95684 ,  G01N2021/8822 ,  G01R31/308 ,  H01J37/00 ,  H01J2237/022 ,  H01J2237/0225 ,  H01L21/67253 ,  H01L21/67288 ,  H01L21/681 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

摘要： A defect inspection method includes radiating an illumination slit-shaped beam having lights substantially parallel to a longitudinal direction to a substrate having circuit patterns in a direction inclined at a predetermined gradient relative to the direction of a line normal to the substrate and inclined at a predetermined gradient on a surface with respect to a group of main straight lines of the circuit patterns with its longitudinal direction oriented almost perpendicularly to a direction of a movement of the substrate. Scattered light reflected by a defect such as a foreign particle existing on the illuminated substrate is received and converted into a detection signal by using an image sensor, and defect judging is effected of an extracted a signal indicating a defect such as a foreign particle on the basis of the detection signal output.

公开(公告)号：US06428632B1

公开(公告)日：2002-08-06

申请号：US09889907

申请日：2001-07-24

申请人： Toshiro Fujiyama ,  Keiji Sakai

发明人： Toshiro Fujiyama ,  Keiji Sakai

IPC分类号： H01F1147

CPC分类号： C22C38/06 ,  C22C38/004 ,  C22C38/02 ,  C22C38/04 ,  C22C38/34 ,  C22C38/42 ,  C22C38/58 ,  C22C38/60

摘要： According to the invention, a nonoriented electromagnetic steel sheet being small in the magnetic anisotropy in a high frequency zone and thus excellent in the magnetic properties as a rotating machine and having an excellent press formability such as punching property or the like can be obtained stably by adjusting a chemical composition of the oriented electromagnetic steel sheet to a given range, and establishing the following equation (1) between L, C average iron loss W15/50(L+C)[W/kg] and L, C average magnetic flux density B50(L+C)[T] with respect to measured values of magnetic properties using Epstein test pieces: B50(L+C)≧0.03·W15/50(L+C)+1.63  (1) and satisfying a ratio of D iron loss W10/400(D)[W/kg] to L, C average iron loss W10/400(L+C)[W/kg] by the following equation (2): W10/400(D)/W10/400(L+C)≦1.2  (2) and defining a hardness of the steel sheet in accordance with a sheet thickness and W15/50(L+C).

摘要翻译： 根据本发明，可以通过以下方式稳定地获得在高频区域中的磁各向异性小的非定向电磁钢板，因此作为旋转机械的磁性能优异并且具有优异的冲压成形性如冲压性能等。 将取向电磁钢板的化学成分调整到规定范围，在L，C平均铁损W15 / 50（L + C）[W / kg]和L，C平均磁通量之间建立下列公式（1） 密度B50（L + C）[T]相对于使用爱泼斯坦试验片的磁特性的测量值：并且满足D铁损W10 / 400（D）[W / kg]与L，C的平均铁损W10 / 400（L + C）[W / kg]，根据板厚度W15 / 50（L + C）确定钢板的硬度。

公开(公告)号：US06339562B1

公开(公告)日：2002-01-15

申请号：US09367002

申请日：1999-08-03

申请人： Keiji Sakai

发明人： Keiji Sakai

IPC分类号： G11B712

CPC分类号： G11B7/131 ,  G11B7/0908 ,  G11B7/0916 ,  G11B7/094 ,  G11B7/0943 ,  G11B7/133 ,  G11B7/1353 ,  G11B2007/0013

摘要： A light receiving element (7) receiving return light from an optical disk has main light receiving sections (7a, 7b) and sub light receiving sections (7e, 7f). A focus error signal is found by computing (Sa+Sf )−(Sb+Se), where Sa, Sb, Se, and Sf represent output signals of the light receiving sections (7a, 7b, 7e, 7f), respectively. Each of the sub light receiving sections (7e, 7f) has a smaller area than each of the main light receiving sections (7a, 7b) has. With the foregoing arrangement, upon access to a multilaminate optical disk in which distances between recording layers are small, respective focus error signals from the recording layers do not interfere with each other, and occurrence of an offset can be suppressed even in the case where an assembly error of the optical element or the like exists.

摘要翻译： 从光盘接收返回光的光接收元件（7）具有主光接收部分（7a，7b）和子光接收部分（7e，7f）。 通过计算（Sa + Sf） - （Sb + Se）发现聚焦误差信号，其中Sa，Sb，Se和Sf分别表示光接收部分（7a，7b，7e，7f）的输出信号。 每个子光接收部分（7e，7f）具有比每个主光接收部分（7a，7b）具有更小的面积。 通过上述的配置，当访问记录层之间的距离很小的多层光盘时，来自记录层的各个聚焦误差信号彼此不会相互干扰，甚至可以抑制偏移的发生，即使在 存在光学元件等的装配误差。