Locator with apparent depth indication
    41.
    发明申请
    Locator with apparent depth indication 有权
    具有明显深度指示的定位器

    公开(公告)号:US20060232259A1

    公开(公告)日:2006-10-19

    申请号:US11106894

    申请日:2005-04-15

    IPC分类号: G01R19/00

    摘要: A human-portable utility locator system for locating and tracing a buried utility line characterized by an electromagnetic field emission. The locator may include a horizontal spaced sensor pair for detecting the horizontal field asymmetry of the emitted field in one or more independent frequency bands, which is employed to assist in determining an accurate “virtual depth” measurement for producing detection events. An event detector may be disposed to detect events corresponding to extremum in the B-field gradient with respect to time and a user interface (UI) coupled to the event detector signals the detected event to a user. In a preferred embodiment, one pair of spaced-apart 3D magnetic sensor arrays is disposed substantially orthogonal to another intermediate spaced-apart pair of sensors.

    摘要翻译: 一种人造便携式实用定位系统,用于定位和跟踪以电磁场发射为特征的埋地公用事业线。 定位器可以包括用于检测一个或多个独立频带中的发射场的水平场不对称性的水平间隔传感器对,其用于帮助确定用于产生检测事件的精确“虚拟深度”测量。 可以设置事件检测器以相对于时间检测对应于B场梯度中的极值的事件,并且耦合到事件检测器的用户界面(UI)将检测到的事件发信号给用户。 在优选实施例中,一对间隔开的3D磁传感器阵列基本上与另一中间间隔开的传感器对正交设置。

    Heterocyclic reverse transcriptase inhibitors
    42.
    发明申请
    Heterocyclic reverse transcriptase inhibitors 审中-公开
    杂环逆转录酶抑制剂

    公开(公告)号:US20060223874A1

    公开(公告)日:2006-10-05

    申请号:US11388541

    申请日:2006-03-23

    IPC分类号: A61K31/4196 C07D249/12

    CPC分类号: C07D249/12

    摘要: The present invention provides compounds for treating or preventing an HIV infection, or treating AIDS or ARC comprising administering a compound according to formula I where R1, R2 and R3, are as defined herein.

    摘要翻译: 本发明提供了用于治疗或预防HIV感染或治疗AIDS或ARC的化合物,包括给予式I化合物,其中R 1,R 2和R 2 > 3 ,如本文所定义。

    System for implanting a replacement valve

    公开(公告)号:US20060206192A1

    公开(公告)日:2006-09-14

    申请号:US11432838

    申请日:2006-05-12

    IPC分类号: A61F2/06

    摘要: A system for percutaneously inserting a prosthesis containing a biological replacement for a defective valve into an implantation site through a body lumen. The system contains a balloon catheter upon which a collapsable stent containing a venous valvular replacement is mounted. A protective shield is slidably mounted upon the catheter that is movable between a closed position over the balloon and an open position wherein the balloon can be inflated to expand the stent. A central lumen runs through the catheter that is formed of stainless steel. The central lumen provides a one to one torque ratio between the proximal end of the catheter and the distal end to enhance the steerability of the catheter. The vein of the replacement is reduced in thickness between 50% and 90% of its original size thereby considerably reducing the size of the replacement package when the stem is collapsed upon the balloon of the catheter.

    Planarity diagnostic system, E.G., for microelectronic component test systems
    44.
    发明申请
    Planarity diagnostic system, E.G., for microelectronic component test systems 有权
    平面诊断系统,E.G.,用于微电子元件测试系统

    公开(公告)号:US20060125471A1

    公开(公告)日:2006-06-15

    申请号:US11343502

    申请日:2006-01-30

    IPC分类号: G01R31/28

    摘要: Maintaining proper planarity of elements of a microelectronic component test system helps ensure reliable operation of the test system. Aspects of the invention provide test systems and methods for verifying planarity of, for example, a head and a support surface of a microelectronic component test system. In one exemplary method, a probe card is mounted to and electrically coupled to a head of a microelectronic component test system. The probe card has an array of probes. A contact surface of the support is moved with respect to the head and a change in contact condition of each of the probes is recorded in a first data set. The orientation of the probe card with respect to the contact surface is changed, the contact surface is moved with respect to the head again and a change in contact condition of each of the probes is recorded in a second data set.

    摘要翻译: 保持微电子元件测试系统元件的正确平面性有助于确保测试系统的可靠运行。 本发明的方面提供了用于验证例如微电子部件测试系统的头部和支撑表面的平坦度的测试系统和方法。 在一个示例性方法中,探针卡安装到电耦合到微电子部件测试系统的头部。 探针卡有一个探针阵列。 支撑件的接触表面相对于头移动,并且每个探针的接触状态的变化记录在第一数据集中。 探针卡相对于接触表面的方向改变,接触表面再次相对于头部移动,并且每个探针的接触状态的变化被记录在第二数据组中。

    Dynamic render algorithm selection
    45.
    发明申请

    公开(公告)号:US20060066621A1

    公开(公告)日:2006-03-30

    申请号:US11229800

    申请日:2005-09-20

    IPC分类号: G06T1/00 G06F15/00

    摘要: A method of rendering a sequence of graphical objects, where two or more different renderers are available and one of the renderers is designated as a currently-used renderer, includes the steps of receiving a current object in the sequence of graphical objects, adding the current object to a set of recently-received objects, and checking whether any one of a predetermined group of patterns of objects is present in the set, each pattern having an associated indication of the suitability of the available renderers for the pattern, the suitability being dependent on a time taken to render the pattern. The method further includes the steps of determining a suitable renderer from the available renderers using a pattern and associated indication identified in the checking step, and switching from the currently-used renderer to the suitable renderer if the suitable renderer is different from the currently-used renderer.

    Methods of determining usage of components by different transaction types and data processing system readable media for carrying out the methods
    46.
    发明申请
    Methods of determining usage of components by different transaction types and data processing system readable media for carrying out the methods 审中-公开
    通过不同的事务类型确定组件的使用的方法和用于执行方法的数据处理系统可读介质

    公开(公告)号:US20060010239A1

    公开(公告)日:2006-01-12

    申请号:US10880212

    申请日:2004-06-29

    IPC分类号: G06F15/16

    CPC分类号: G06F9/54 H04L43/0817

    摘要: Methods of determining which components and their capacities within a distributed computing environment are used for a transaction type can be performed faster and more accurately compared to conventional methods. In one embodiment by separating the transaction types into groups, regression can be performed faster on data collected because the data is less “polluted” by some or all other transactions types. Also, selection of transaction types within each group can reduce or eliminate colinearities in data between different transaction types. In still another embodiment, the distributed computing environment can be allowed to catch up between running each group of transaction types. Alternatively, if multiple instances of a component are present, transactions may be routed based on transaction type to reduce the impact. Data processing system readable media can include code that includes instructions for carrying out the methods.

    摘要翻译: 与传统方法相比,可以更快更准确地确定分配计算环境中哪些组件及其容量用于事务类型的方法。 在一个实施例中,通过将事务类型分成组,可以更快地对所收集的数据执行回归,因为数据被某些或所有其他事务类型的“污染”较少。 此外,每个组内的事务类型的选择可以减少或消除不同事务类型之间的数据中的共线性。 在另一个实施例中,可以允许分布式计算环境在运行每组事务类型之间追赶。 或者,如果组件的多个实例存在,则可以基于事务类型路由事务以减少影响。 数据处理系统可读介质可以包括包括用于执行方法的指令的代码。

    Methods and systems for generating models of application environments for applications and portions thereof
    47.
    发明申请
    Methods and systems for generating models of application environments for applications and portions thereof 审中-公开
    用于生成应用程序的应用环境模型及其部分的方法和系统

    公开(公告)号:US20060009954A1

    公开(公告)日:2006-01-12

    申请号:US10889570

    申请日:2004-07-12

    IPC分类号: G06F17/10

    CPC分类号: G06Q10/10

    摘要: An application or a portion thereof can be thought of as a container having a set of instruments with mathematical descriptions of relationships between the instruments and other portions of the application infrastructure. The set of instruments may include only those instruments determined to significantly affect or be significantly affected by an application or a portion thereof running within a distributed computing environment. Models can be generated to include those instruments that significantly affect or are significantly affected by the application or a portion thereof and their mathematical descriptions of relationships between those instruments. By using the models, portions of an application environment across tiers can be controlled in a more coherent manner to better achieve the business objectives of an organization. The methods and systems can also help to identify and correct potential problems that may not be seen when examining tiers or sub-tiers individually.

    摘要翻译: 应用或其一部分可以被认为是具有一组仪器的容器,其具有仪器与应用基础设施的其它部分之间的关​​系的数学描述。 该组仪器可以仅包括确定为在分布式计算环境中运行的应用或其部分显着影响或显着影响的仪器。 可以生成模型以包括显着影响或受应用程序或其一部分的显着影响的仪器及其对这些仪器之间的关系的数学描述。 通过使用模型,跨层的应用程序环境的一部分可以以更一致的方式进行控制,以更好地实现组织的业务目标。 这些方法和系统还可以帮助识别和纠正在单独检查层次或子层时可能看不到的潜在问题。

    Caulk saver system
    48.
    发明申请
    Caulk saver system 审中-公开
    填缝系统

    公开(公告)号:US20050236441A1

    公开(公告)日:2005-10-27

    申请号:US11112587

    申请日:2005-04-22

    申请人: Michael Martin

    发明人: Michael Martin

    IPC分类号: B05B15/02 B65D47/00 B67D3/00

    CPC分类号: B05B15/5225

    摘要: The present invention relates generally to closures for nozzles. More particularly, the present invention relates to a stopper which may be used to seal a caulk tube. The stopper includes a handle and a stem extending from the handle.

    摘要翻译: 本发明一般涉及喷嘴的封盖。 更具体地说,本发明涉及一种可用于密封填缝管的塞子。 止动器包括从手柄延伸的把手和杆。

    Planarity diagnostic system, e.g., for microelectronic component test systems
    50.
    发明申请
    Planarity diagnostic system, e.g., for microelectronic component test systems 失效
    平面诊断系统,例如用于微电子部件测试系统

    公开(公告)号:US20050024040A1

    公开(公告)日:2005-02-03

    申请号:US10930647

    申请日:2004-08-31

    IPC分类号: G01R1/073 G01R31/02

    摘要: Maintaining proper planarity of elements of a microelectronic component test system helps ensure reliable operation of the test system. Aspects of the invention provide test systems and methods for verifying planarity of, for example, a head and a support surface of a microelectronic component test system. In one exemplary method, a probe card is mounted to and electrically coupled to a head of a microelectronic component test system. The probe card has an array of probes. A contact surface of the support is moved with respect to the head and a change in contact condition of each of the probes is recorded in a first data set. The orientation of the probe card with respect to the contact surface is changed, the contact surface is moved with respect to the head again and a change in contact condition of each of the probes is recorded in a second data set.

    摘要翻译: 保持微电子元件测试系统元件的正确平面性有助于确保测试系统的可靠运行。 本发明的方面提供了用于验证例如微电子部件测试系统的头部和支撑表面的平坦度的测试系统和方法。 在一个示例性方法中,探针卡安装到电耦合到微电子部件测试系统的头部。 探针卡有一个探针阵列。 支撑件的接触表面相对于头移动,并且每个探针的接触状态的变化记录在第一数据集中。 探针卡相对于接触表面的方向改变,接触表面再次相对于头部移动,并且每个探针的接触状态的变化被记录在第二数据组中。