Sample analysis method
    41.
    发明授权
    Sample analysis method 有权
    样品分析方法

    公开(公告)号:US08514403B2

    公开(公告)日:2013-08-20

    申请号:US13086759

    申请日:2011-04-14

    IPC分类号: G01B11/02

    CPC分类号: G01N21/3581 G01N21/3563

    摘要: A sample analysis method is provided for analyzing a sample having a permeability to terahertz radiation and accurately measure the composition, physical properties, mass and dimensions of a very small sample or a minute amount of sample by irradiating the sample with terahertz radiation. In the method, a reflective member is provided adjoining a first principal surface of the sample, an entrance member is provided adjoining a second principal surface of the sample, terahertz radiation is delivered from outside of entrance member towards the sample, and the sample is analyzed using an interference wave generated from a first-surface reflected wave at the interface between the first principal surface of the sample and the reflective member and a second-surface reflected wave at the interface between the second principal surface of the sample and the entrance member.

    摘要翻译: 提供样品分析方法,用于分析具有太赫兹辐射渗透性的样品,并通过用太赫兹辐射照射样品来精确测量非常小样品或微量样品的组成,物理性质,质量和尺寸。 在该方法中,邻接样品的第一主表面设置反射构件,邻接样品的第二主表面设置入口构件,将太赫兹辐射从入口构件的外部朝向样品传送,并分析样品 使用从样品的第一主表面和反射构件之间的界面处的第一表面反射波产生的干涉波和在样品的第二主表面与入口构件之间的界面处的第二表面反射波。

    REFLECTIVE IMAGING DEVICE AND IMAGE ACQUISITION METHOD
    42.
    发明申请
    REFLECTIVE IMAGING DEVICE AND IMAGE ACQUISITION METHOD 有权
    反射成像装置和图像采集方法

    公开(公告)号:US20130076912A1

    公开(公告)日:2013-03-28

    申请号:US13701701

    申请日:2011-05-20

    IPC分类号: H04N5/33

    CPC分类号: H04N5/33 G01N21/3581

    摘要: In order to generate a two-dimensional image of a sample in a short time using THz waves, provided is a reflective imaging device including a sample holder, a THz wave light source, a THz wave camera, a rotation mechanism for rotating the holder and the camera, and a processing unit. A sample unit includes an incidence member, a sample, and a reflection member. The sample includes a first region of only a membrane and a second region including a biopolymer. The camera detects, with regard to respective incident angles, a THz wave in which interference occurs between a component reflected at an interface between the incidence member and the sample and a component reflected at an interface between the sample and the reflection member, of each portion of the sample unit, and outputs a signal. The processing unit specifies an incident angle at which a signal of a first THz wave that interferes in the first region is relatively small and a signal of a second THz that interferes in the second region is relatively large, and generates a two-dimensional image of the sample based on the signal from the camera with regard to the specified incident angle.

    摘要翻译: 为了使用太赫兹波在短时间内产生样本的二维图像,提供了一种反射成像装置,其包括样本保持器,太赫兹波光源,太赫兹波相机,用于旋转支架的旋转机构和 相机和处理单元。 样品单元包括入射构件,样品和反射构件。 样品包括只有膜的第一区域和包括生物聚合物的第二区域。 摄像机检测相对于入射角度的THz波,其中在入射构件和样品之间的界面处反射的分量与在样品与反射构件之间的界面处反射的分量之间发生干涉, 并输出信号。 处理单元指定在第一区域中干扰的第一THz波的信号相对较小并且在第二区域中干扰的第二THz的信号相对较大的入射角,并且生成二维图像 该样本基于来自摄像机的信号对于指定的入射角度。

    Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring device
    43.
    发明授权
    Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring device 有权
    用于测量待测物体的特性的方法,引起衍射现象的结构和测量装置

    公开(公告)号:US08269967B2

    公开(公告)日:2012-09-18

    申请号:US13239830

    申请日:2011-09-22

    IPC分类号: G01J3/28

    CPC分类号: G01N21/4788 G01N33/54373

    摘要: A method of attaching an object to be measured to a structure causing a diffraction phenomenon; irradiating the structure to which the object to be measured is attached and which causes the diffraction phenomenon with an electromagnetic wave; detecting the electromagnetic wave scattered by the structure causing the diffraction phenomenon; and measuring a characteristic of the object to be measured from the frequency characteristic of the detected electromagnetic wave. The object to be measured is attached directly to the surface of the structure causing the diffraction phenomenon. Thus, the method for measuring the characteristic of an object to be measured exhibits an improved measurement sensitivity and high reproducibility. A structure causing a diffraction phenomenon and used for the method, and a measuring device are provided.

    摘要翻译: 将测量对象附着到引起衍射现象的结构的方法; 照射被测定对象物的结构,并用电磁波引起衍射现象; 检测由结构散射的电磁波引起的衍射现象; 并根据检测到的电磁波的频率特性来测量待测物体的特性。 要测量的物体直接附着在结构的表面,引起衍射现象。 因此,用于测量待测物体的特性的方法具有改进的测量灵敏度和高再现性。 提供引起衍射现象并用于该方法的结构和测量装置。

    Terahertz wave measuring apparatus having space arrangement structure and measuring method
    44.
    发明授权
    Terahertz wave measuring apparatus having space arrangement structure and measuring method 有权
    具有空间排列结构和测量方法的太赫兹波测量装置

    公开(公告)号:US08253103B2

    公开(公告)日:2012-08-28

    申请号:US12511016

    申请日:2009-07-28

    IPC分类号: G01J1/00 G01J5/00

    摘要: There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electromagnetic wave detector that measures the electromagnetic waves that have passed through the space arrangement structure. Here, characteristics of the object are measured by measuring the electromagnetic waves that have passed through the space arrangement structure. The electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle, and the electromagnetic waves that have passed through the space arrangement structure are measured.

    摘要翻译: 提供了一种测量装置,包括:空间布置结构,包括由平面内的导体包围的空间区域;朝向由所述空间布置结构保持的物体发射电磁波的电磁波发射器;以及测量电磁波的电磁波检测器 已经通过了空间布置结构。 这里,通过测量已经通过空间排列结构的电磁波来测量物体的特性。 从电磁波发射器朝向空间配置结构发射的电磁波以一定角度入射在包含空间区域的平面上,并且测量已经通过空间布置结构的电磁波。

    IMAGE FORMING APPARATUS
    46.
    发明申请
    IMAGE FORMING APPARATUS 有权
    图像形成装置

    公开(公告)号:US20110243582A1

    公开(公告)日:2011-10-06

    申请号:US13075584

    申请日:2011-03-30

    IPC分类号: G03G15/00

    摘要: An image forming apparatus executes banding correction at a level determined according to variation of the density characteristic of the image forming apparatus to achieve a high quality image. In the image forming apparatus, a banding correction unit acquires information about a cause of density variation that may occur in a sub scanning direction of a rotation member, which is used for forming a toner image on an image carrier based on input image information and sets, based on the acquired information, the level of the density correction, which is determined according to the density variation cause information.

    摘要翻译: 图像形成装置以根据图像形成装置的浓度特性的变化确定的水平执行条带校正,以实现高质量图像。 在图像形成装置中,条带校正单元基于输入图像信息获取关于在图像载体上形成调色剂图像的旋转构件的副扫描方向上可能发生的浓度变化的原因的信息,并且设置 基于获取的信息,根据密度变化确定的浓度校正的水平导致信息。

    SAMPLE ANALYSIS METHOD
    47.
    发明申请
    SAMPLE ANALYSIS METHOD 有权
    样本分析方法

    公开(公告)号:US20110205528A1

    公开(公告)日:2011-08-25

    申请号:US13086759

    申请日:2011-04-14

    IPC分类号: G01N21/55

    CPC分类号: G01N21/3581 G01N21/3563

    摘要: A sample analysis method is provided for analyzing a sample having a permeability to terahertz radiation and accurately measure the composition, physical properties, mass and dimensions of a very small sample or a minute amount of sample by irradiating the sample with terahertz radiation. In the method, a reflective member is provided adjoining a first principal surface of the sample, an entrance member is provided adjoining a second principal surface of the sample, terahertz radiation is delivered from outside of entrance member towards the sample, and the sample is analyzed using an interference wave generated from a first-surface reflected wave at the interface between the first principal surface of the sample and the reflective member and a second-surface reflected wave at the interface between the second principal surface of the sample and the entrance member.

    摘要翻译: 提供样品分析方法,用于分析具有太赫兹辐射渗透性的样品,并通过用太赫兹辐射照射样品来精确测量非常小样品或微量样品的组成,物理性质,质量和尺寸。 在该方法中,邻接样品的第一主表面设置反射构件,邻接样品的第二主表面设置入口构件,将太赫兹辐射从入口构件的外部朝向样品传送,并分析样品 使用从样品的第一主表面和反射构件之间的界面处的第一表面反射波产生的干涉波和在样品的第二主表面与入口构件之间的界面处的第二表面反射波。

    PELLET FOR USE IN SPECTROMETRY, METHOD OF PREPARING THE SAME, AND METHOD OF SPECTROMETRY
    48.
    发明申请
    PELLET FOR USE IN SPECTROMETRY, METHOD OF PREPARING THE SAME, AND METHOD OF SPECTROMETRY 有权
    用于光谱分析的颗粒,其制备方法和光谱测定方法

    公开(公告)号:US20100243901A1

    公开(公告)日:2010-09-30

    申请号:US12733788

    申请日:2008-09-25

    IPC分类号: G01N21/35 B27N3/02 G01N21/01

    摘要: A pellet 4 for use in spectrometry includes a first powder 41 of a light transmitting material in a compression-molded form, and a second powder 42 which is hydrophilic and water-insoluble and is dispersedly mixed in the first powder. A sample 40 to be subjected to spectrometry is e.g. in a powdery form and dispersedly mixed in the first and the second powders 41 and 42. When the sample 40 is a hydrate, the second powder 42 exerts the effect of accelerating dehydration of the sample 40, so that stable spectrum data on the sample in the dehydrated state is obtained early. This makes it possible to perform a processing such as identification of the sample 40 early and precisely.

    摘要翻译: 用于光谱测定的颗粒4包括压缩模制形式的透光材料的第一粉末41和亲水性和水不溶性并分散混合在第一粉末中的第二粉末42。 要进行光谱测定的样品40是例如。 粉末形式并分散混合在第一和第二粉末41和42中。当样品40是水合物时,第二粉末42发挥加速样品40脱水的效果,使得样品上的稳定的光谱数据 早期获得脱水状态。 这使得可以提前和精确地执行诸如样品40的鉴定的处理。

    System and method to enable parallel text search using in-charge index ranges
    49.
    发明授权
    System and method to enable parallel text search using in-charge index ranges 失效
    系统和方法,可以使用使用索引范围启用并行文本搜索

    公开(公告)号:US07689545B2

    公开(公告)日:2010-03-30

    申请号:US11185733

    申请日:2005-07-21

    IPC分类号: G06F7/00

    摘要: In registering operation of a document to be searched for, a document identifier management table for managing a range of a document identifier stored for each page and a page identifier of the page is created, and an individual-search-server's search range management table for managing the range of the document identifier in charge of each search server is created. In searching operation of each search server of the document to be searched for, the individual-search-server's search range management table is referred to acquire a range of the allocated document identifier. For each index key forming a query term specified as a query condition, the document identifier management table is referred to to acquire the page identifier storing the document identifier of the allocated range. The searching operation is carried out by referring to a page shown by the acquired page identifier.

    摘要翻译: 在记录要搜索的文档的操作中,创建用于管理为每个页面存储的文档标识符的范围的文档标识符管理表和页面的页面标识符,以及个人搜索服务器的搜索范围管理表 创建管理每个搜索服务器的文档标识符的范围。 在搜索要搜索的文档的每个搜索服务器的搜索操作中,参考个人搜索服务器的搜索范围管理表来获取所分配的文档标识符的范围。 对于形成作为查询条件指定的查询项的每个索引关键字,参考文档标识符管理表来获取存储分配范围的文档标识符的页面标识符。 通过参考由所获取的页面标识符示出的页面来执行搜索操作。

    AMORPHOUS TRANSFORMER FOR ELECTRIC POWER SUPPLY
    50.
    发明申请
    AMORPHOUS TRANSFORMER FOR ELECTRIC POWER SUPPLY 审中-公开
    用于电力供应的非变压器

    公开(公告)号:US20090189728A1

    公开(公告)日:2009-07-30

    申请号:US12280810

    申请日:2007-02-27

    IPC分类号: H01F17/04 C22C45/02 H01F1/04

    摘要: This invention provides an amorphous transformer for electric power supply, using a magnetic core formed of an amorphous alloy material, which, as compared with the conventional amorphous alloy material, has a lower annealing temperature and a higher level of magnetic properties. The amorphous transformer for electric power supply is provided with a magnetic core of a thin band of an amorphous alloy and a winding wire. The iron core has been annealed under such conditions that the iron core center part temperature during annealing after iron core molding is 300 to 340° C. and the holding time is not less than 0.5 hr. Further, for the iron core, the magnetic field intensity during annealing after the iron core molding is not less than 800 A/m.

    摘要翻译: 本发明提供了一种使用由非晶态合金材料形成的磁芯的电力供应用非晶变压器,其与传统的非晶合金材料相比具有较低的退火温度和较高的磁性能。 用于电力供应的非晶变压器设置有非晶合金薄带和绕组线的磁芯。 在铁芯成型后退火时的铁心中心部温度为300〜340℃,保持时间不低于0.5小时的条件下,将铁芯退火。 此外,对于铁芯,铁芯成型后的退火时的磁场强度为800A / m以上。