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    Catalyst separation system
    41.
    发明授权
    Catalyst separation system 有权
    催化剂分离系统

    公开(公告)号：US09139779B2

    公开(公告)日：2015-09-22

    申请号：US12998217

    申请日：2009-09-25

    Applicant: Yasuhiro Onishi ,  Yuzuru Kato ,  Eiichi Yamada ,  Kentarou Morita

    Inventor： Yasuhiro Onishi ,  Yuzuru Kato ,  Eiichi Yamada ,  Kentarou Morita

    IPC: B01J8/22 ,  C10G2/00 ,  B01J8/00

    CPC classification number: C10G2/342 ,  B01J8/006 ,  B01J8/22 ,  C10G2/32

    Abstract: A catalyst separation system which separates catalyst particles from liquid hydrocarbons synthesized by a chemical reaction of a synthesis gas including a hydrogen and a carbon monoxide as the main components, and a slurry having solid catalyst particles suspended in a liquid, the catalyst separation system is provided with: a reactor; a storage tank which stores the slurry drawn from the reactor; a plurality of filters which filters the slurry; and a filtrate recovery vessel which recovers a filtrate which has passed through the plurality of filters, wherein the plurality of filters is disposed in series in a flow line for the slurry from the storage tank to the filtrate recovery vessel.

    Abstract translation: 一种催化剂分离系统，其将催化剂颗粒与通过包含氢和一氧化碳的合成气作为主要组分的化学反应合成的液体烃和具有悬浮在液体中的固体催化剂颗粒的浆料分离，提供催化剂分离系统 与：反应堆; 存储从反应器抽出的浆料的储存罐; 多个过滤浆料的过滤器; 以及滤液回收容器，其回收已经通过所述多个过滤器的滤液，其中所述多个过滤器串联设置在用于从所述储存罐到所述滤液回收容器的浆料的流动管线中。

    Synthesis reaction system
    42.
    发明授权
    Synthesis reaction system 有权
    合成反应体系

    公开(公告)号：US08758692B2

    公开(公告)日：2014-06-24

    申请号：US12733784

    申请日：2008-09-26

    Applicant: Yasuhiro Onishi

    Inventor： Yasuhiro Onishi

    IPC: B01J8/20 ,  C07C27/00

    CPC classification number: C10G2/32 ,  B01J8/007 ,  B01J8/1818 ,  B01J8/226 ,  B01J8/228 ,  B01J2208/00132 ,  B01J2208/003

    Abstract: There is provided a synthesis reaction system which synthesizes a hydrocarbon compound by a chemical reaction of a synthesis gas including hydrogen and carbon monoxide as main components, and a slurry having solid catalyst particles suspended in liquid and which extracts the hydrocarbon compound from the slurry. The synthesis reaction system includes a reactor main body which accommodates the slurry, a separator which separates the hydrocarbon compound included in the slurry from the slurry, a first flow passage which allows the slurry including the hydrocarbon compound to flow to the separator from the reactor main body, a second flow passage which allows the slurry to flow to the reactor main body from the separator, and a fluid supply nozzle which supplies a fluid toward at least any one of the separator, the first flow passage, and the second flow passage.

    Abstract translation: 提供了通过包含氢和一氧化碳作为主要成分的合成气的化学反应合成烃化合物的合成反应体系，以及悬浮在液体中的固体催化剂颗粒的浆料，并从浆料中提取烃化合物。 合成反应系统包括容纳浆料的反应器主体，将浆料中包含的烃化合物与浆料分离的分离器，允许包含烃化合物的浆料从反应器主体流到分离器的第一流动通道 主体，允许浆料从分离器流向反应器主体的第二流动通道，以及朝向分离器，第一流动通道和第二流动通道中的至少任一个提供流体的流体供应喷嘴。

    Hydrocarbon compound synthesis reaction unit and operating method thereof
    43.
    发明授权
    Hydrocarbon compound synthesis reaction unit and operating method thereof 失效
    烃类化合物合成反应单元及其操作方法

    公开(公告)号：US08569387B2

    公开(公告)日：2013-10-29

    申请号：US12998216

    申请日：2009-09-25

    Applicant: Yasuhiro Onishi ,  Yuzuru Kato ,  Eiichi Yamada ,  Atsushi Murata ,  Osamu Wakamura ,  Kentarou Morita

    Inventor： Yasuhiro Onishi ,  Yuzuru Kato ,  Eiichi Yamada ,  Atsushi Murata ,  Osamu Wakamura ,  Kentarou Morita

    IPC: C07C27/00 ,  B01D61/00 ,  B01J8/18 ,  B01J10/00

    CPC classification number: C10G2/34 ,  B01J8/006 ,  B01J8/1836 ,  B01J8/22 ,  B01J2219/00006 ,  C10G2/32

    Abstract: A hydrocarbon compound synthesis reaction unit which synthesizes a hydrocarbon compound by a chemical reaction of a synthesis gas including a hydrogen and a carbon monoxide as the main components, and a slurry having a solid catalyst suspended in liquid hydrocarbons, the hydrocarbon compound synthesis reaction unit is provided with: a reactor which contains the slurry inside, into which the synthesis gas is introduced, and from which the gas after the reaction is discharged from the top thereof; an internal separation device provided inside the reactor to separate the catalyst and the synthesized liquid hydrocarbons in the slurry; and an external separation device provided outside the reactor to separate the catalyst and the liquid hydrocarbons in the slurry which is extracted from the reactor.

    Abstract translation: 一种烃化合物合成反应单元，其通过包含氢和一氧化碳的合成气作为主要成分的化学反应合成烃化合物，以及具有悬浮在液体烃中的固体催化剂的浆料，烃化合物合成反应单元是 设置有：反应器，其内部含有合成气的浆料，反应后的气体从该反应器的顶部排出; 内部分离装置，设置在反应器内部以分离催化剂和浆料中合成的液体烃; 以及设置在反应器外部以分离从反应器中提取的浆料中的催化剂和液体烃的外部分离装置。

    Solder material test apparatus, and method of controlling the same
    48.
    发明授权
    Solder material test apparatus, and method of controlling the same 失效
    焊料测试装置及其控制方法

    公开(公告)号：US07660643B2

    公开(公告)日：2010-02-09

    申请号：US11501240

    申请日：2006-08-09

    Applicant: Yasuhiro Onishi ,  Masanobu Horino ,  Katsumi Ohashi

    Inventor： Yasuhiro Onishi ,  Masanobu Horino ,  Katsumi Ohashi

    IPC: G06F19/00

    CPC classification number: H05K3/1233 ,  H05K3/3484 ,  H05K2203/162 ,  H05K2203/163

    Abstract: A solder material test apparatus includes a control unit and a storage unit which stores master data in advance in which a printing process time when a printing process is performed by using a test-sample solder material is associated with deterioration degree data of the test-sample solder material at the printing process time. The control unit includes a deterioration degree data acquiring unit which acquires deterioration degree data for indicating a deterioration degree of a test-sample solder material, a reading unit which reads a printing process time associated with deterioration degree data set as a limit value with reference to master data and reads a printing process time associated with the deterioration degree data acquired by the deterioration degree data acquiring unit, an operating unit which operates an available remaining time that indicates difference between the printing process times, and a display control unit which informs the available remaining time to a user.

    Abstract translation: 焊料测试装置包括控制单元和存储单元，其预先存储主数据，其中通过使用测试样品焊料进行打印处理的打印处理时间与测试样品的劣化程度数据相关联 焊料在印刷过程中的时间。 控制单元包括劣化度数据获取单元，其获取用于指示测试样品焊料材料的劣化程度的劣化度数据，读取单元，其读取与设置为极限值的劣化度数据相关联的打印处理时间，参考 读取与恶化度数据获取单元获取的劣化度数据相关联的打印处理时间，操作指示打印处理时间之间的差异的可用剩余时间的操作单元和通知可用的显示控制单元 留给用户的时间。

    Solder Material Inspecting Device
    49.
    发明申请
    Solder Material Inspecting Device 审中-公开
    焊料检测设备

    公开(公告)号：US20090122306A1

    公开(公告)日：2009-05-14

    申请号：US12084980

    申请日：2006-11-09

    Applicant: Katsumi Ohashi ,  Masanobu Horino ,  Yasuhiro Onishi

    Inventor： Katsumi Ohashi ,  Masanobu Horino ,  Yasuhiro Onishi

    IPC: G01N21/35

    CPC classification number: G01N21/95684 ,  G01N21/3563 ,  G01N21/55 ,  H05K1/0269 ,  H05K3/1216 ,  H05K3/3484

    Abstract: Before an electronic component is mounted on a board 2, only a cream solder 3 printed on the board 2 is irradiated with a light beam which the board 2 is scanned based on printing position information obtained by printing position obtaining means such as CAD data, and thereby inspection object intensity of an infrared ray having a specific wave number, which is reflected from the cream solder 3, is detected by the irradiation of the cream solder 3 with the light beam. The cream solder 3 printed on the board 2 is set to an inspection object, and a deterioration parameter indicating a relative degree of deterioration of the cream solder 3 of the inspection object to a cream solder 3 of a comparison object is computed based on comparison object intensity of the infrared ray having the specific wave number and the inspection object intensity. The comparison object intensity of the infrared ray is detected as a reflected light beam when the cream solder 3 of the comparison object is irradiated with the light beam.

    Abstract translation: 在将电子部件安装在基板2上之前，基于通过CAD数据等打印位置取得单元得到的打印位置信息，仅对印刷在基板2上的膏状焊料3照射基板2被扫描的光束， 从而通过用光束照射膏状焊膏3来检测从膏状焊料3反射的具有特定波数的红外线的检测对象强度。 将印刷在板2上的膏状焊料3设定为检查对象，并且根据比较对象计算表示检查对象的膏状焊膏3与比较对象的膏状焊膏3的相对退化程度的劣化参数 具有特定波数的红外线的强度和检查对象强度。 当比较对象的膏状焊料3被光束照射时，红外线的比较对象强度被检测为反射光束。

    Semiconductor Memory Device
    50.
    发明申请
    Semiconductor Memory Device 审中-公开
    半导体存储器件

    公开(公告)号：US20090077432A1

    公开(公告)日：2009-03-19

    申请号：US12273270

    申请日：2008-11-18

    Applicant: Toshikazu Nakamura ,  Akira Kikutake ,  Kuninori Kawabata ,  Yasuhiro Onishi ,  Satoshi Eto

    Inventor： Toshikazu Nakamura ,  Akira Kikutake ,  Kuninori Kawabata ,  Yasuhiro Onishi ,  Satoshi Eto

    IPC: G06F11/00 ,  G11C29/04 ,  G06F11/07

    CPC classification number: G11C29/42 ,  G11C11/41

    Abstract: Disclosed is a semiconductor memory device capable of arbitrarily setting an upper limit of the number of error corrections during a test operation. The semiconductor memory device has a counter, a register, and a comparison circuit. The counter counts the number of error corrections. The register, when an upper limit setting signal (in the case shown in FIG. 1, an external upper limit fetch signal) is externally inputted to change the upper limit of the number of error corrections, changes the upper limit. The comparison circuit compares the number of error corrections with the changed upper limit.

    Abstract translation: 公开了一种半导体存储器件，其能够任意地设定检验动作时的误差修正量的上限。 半导体存储器件具有计数器，寄存器和比较电路。 计数器对错误更正次数进行计数。 当外部输入上限设定信号（在图1所示的情况下为外部上限获取信号）以改变误差修正次数的上限时，该寄存器改变上限值。 比较电路将误差校正次数与改变的上限进行比较。

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