公开(公告)号：US20020070336A1

公开(公告)日：2002-06-13

申请号：US09894694

申请日：2001-06-28

Applicant: Leopold Kostal GmbH & Co. KG

Inventor： Uwe Borgmann ,  Dirk Schmidt

IPC: H01J003/14

CPC classification number: B62D15/02 ,  G01D5/34715

Abstract: The invention pertains to an angle sensor with a fixed stator and a rotor rotating about an axis of rotation, where the stator has several optical-electronic sensor elements, each having the same design, being aligned in a plane vertical to the axis of rotation on a circular line in the perimeter direction concentric to the axis of rotation and being distributed across a range of perimeter angle, where said sensor elements cooperate with the coding provided on the rotor. The objective of the invention with regard to this kind of angle sensor is to solve the technical problem of ensuring that even greater mechanical tolerances, like those occurring in practice, e.g., in the integration of the sensor device into a higher-order structural unit, such as a steering column tube switch module, will not adversely impact dependable operation of the sensor. This problem is solved in that the longitudinal axes of the optical-electronic sensor elements are not aligned radial to the circle line on which these units are positioned in the perimeter direction, but rather are aligned parallel to each other.

Abstract translation: 本发明涉及具有固定定子和围绕旋转轴线转动的转子的角度传感器，其中定子具有几个光学电子传感器元件，每个具有相同的设计，在与旋转轴线垂直的平面中对准 在圆周方向上与旋转轴线同心的圆形线分布在周边范围内，其中所述传感器元件与设置在转子上的编码协调。 关于这种角度传感器的本发明的目的是解决技术问题，即确保甚至更大的机械公差，例如在实践中发生的机械公差，例如将传感器装置集成到高阶结构单元中， 例如转向柱管开关模块，不会不利地影响传感器的可靠操作。 这个问题的解决是，光学电子传感器元件的纵向轴线不与这些单元在周向上定位的圆线对准，而是彼此平行排列。

公开(公告)号：US20020066851A1

公开(公告)日：2002-06-06

申请号：US09312479

申请日：1999-05-17

Inventor： ROBERT J. HENNICK ,  COLLEEN P. GANNON ,  KLAUS KREMMIN SR.

IPC: H01L027/00 ,  H01J003/14

CPC classification number: H04N1/0303 ,  H04N1/03 ,  H04N1/107 ,  H04N2201/0241 ,  H04N2201/02412 ,  H04N2201/02429 ,  H04N2201/02431 ,  H04N2201/02449

Abstract: The invention is a method and associated apparatus for mounting an optical subassembly of an optical reading device onto an image sensor subassembly of an optical reading device with use of solder as a bonding material. In accordance with the invention, solderable surfaces are formed on either or both an optical subassembly and an image sensor subassembly. For mounting of the optical subassembly onto the image sensor subassembly, an assembly station worker aligns optical and imaging elements by observing indicia corresponding to electrical signals generated by the image sensor under controlled conditions, and then, when alignment is established, solders the subassemblies at any interfaces that are defined by the solderable surfaces. The solderable surfaces of either or both the optical or image sensor assemblies may be made in irregular configurations having increased surface areas per unit three dimensional space relative to that of a smooth surface. In one embodiment, the solderable surfaces include a pin on one of the subassemblies and a hole on the remaining subassembly.

Abstract translation: 本发明是一种用于将光学读取装置的光学子组件安装到光学读取装置的图像传感器子组件上的方法和相关装置，其使用焊料作为粘结材料。 根据本发明，可焊接表面形成在光学子组件和图像传感器子组件中的任一个或两者上。 为了将光学子组件安装到图像传感器子组件上，组装工作人员通过在受控条件下观察对应于由图像传感器产生的电信号的标记来对准光学元件和成像元件，然后当对准被建立时，将子组件焊接在任何 由可焊接表面限定的界面。 光学或图像传感器组件中的任一个或两者的可焊接表面可以制成具有相对于光滑表面的单位三维空间增加的表面积的不规则构造。 在一个实施例中，可焊接表面包括在一个子组件上的销和剩余子组件上的孔。

公开(公告)号：US20020063203A1

公开(公告)日：2002-05-30

申请号：US09993487

申请日：2001-11-27

Applicant: ASAHI KOGAKU KOGYO KABUSHIKI KAISHA

Inventor： Daisuke Koreeda

IPC: H01J003/14 ,  H01J005/16

CPC classification number: H04N1/053 ,  H04N1/113 ,  H04N1/1135 ,  H04N1/12 ,  H04N2201/0098 ,  H04N2201/04762

Abstract: Disclosed is a scanning optical system that includes a laser source for emitting a laser beam, a scanning deflector that deflects the laser beam, an imaging optical system that converges the scanning laser beam onto an object surface, first and second mirrors that bend the optical path of the scanning laser beam. The first and second mirrors are movable to adjust the optical path length between the deflector and the object surface for changing a width of the scanning range on the object surface. Since the optical path length is adjusted by moving the first and second mirror, which changes the width of the scanning range, correcting the size error of the printed image. When the size error of the printed image is detected, an operator moves the first and second mirrors to correct it.

Abstract translation: 公开了一种扫描光学系统，其包括用于发射激光束的激光源，使激光束偏转的扫描偏转器，将扫描激光束会聚到物体表面上的成像光学系统，使光路弯曲的第一和第二反射镜 的扫描激光束。 第一和第二反射镜可移动以调节偏转器和物体表面之间的光程长度，以改变物体表面上扫描范围的宽度。 由于通过移动改变扫描范围的宽度的第一和第二反射镜来调整光程长度，校正打印图像的尺寸误差。 当检测到打印图像的尺寸误差时，操作者移动第一和第二反射镜以对其进行校正。

公开(公告)号：US20020056807A1

公开(公告)日：2002-05-16

申请号：US09986012

申请日：2001-11-07

Applicant: JASCO CORPORATION

Inventor： Yoshihito Narita ,  Shigeyuki Kimura

IPC: H01J003/14 ,  H01J005/16

CPC classification number: G01Q60/22 ,  G01Q10/06 ,  G01Q30/06 ,  Y10S977/862

Abstract: A near-field microscope comprising: a probe for scattering a near-field light; light emitting device including a light source for emitting light to a sample or said probe; and light sampling device for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising: control device for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling device; inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling device; and computing device for computing a measurement result obtained by subtracting a noise from said light intensity

Abstract translation: 一种近场显微镜，包括：用于散射近场光的探针; 发光器件包括用于向样品或所述探针发射光的光源; 以及用于采样和检测包括由所述探针散射的样品的信息的光的光取样装置，所述显微镜包括：用于将所述样品或探针与由所述发光产生的近场光的场间隔开的控制装置， 在近场光场中的浅的位置处的样品或探针，从而通过所述光采样装置检测噪声; 将所述样品或探针深深地插入由所述发光产生的近场光的场中，从而由所述光采样装置检测光强度; 以及用于计算通过从所述光强减去噪声而获得的测量结果的计算装置

公开(公告)号：US20020050562A1

公开(公告)日：2002-05-02

申请号：US09928228

申请日：2001-08-10

Inventor： Masanori Yoshikawa ,  Akinobu Okuda

IPC: H01J003/14 ,  H01J005/16 ,  H01J040/14

CPC classification number: G02B26/127 ,  G02B26/126 ,  H04N1/047 ,  H04N1/1135 ,  H04N1/12 ,  H04N2201/0471 ,  H04N2201/04744

Abstract: A light scanner includes a semiconductor laser, a polygon mirror, a first imaging optical system for guiding a light beam from the semiconductor laser to the deflection surface of the polygon mirror, a second imaging optical system of a single curved mirror for guiding the light beam from the polygon mirror to a photosensitive drum, and a photodiode for detecting the light beam scanned by the polygon mirror. The first imaging optical system, the polygon mirror, and the second imaging optical system are located at different positions in the sub-scanning direction so that the light beam from the first imaging optical system enters obliquely with respect to a plane containing the normal to the deflection surface of the polygon mirror and being parallel to the main scanning direction, and the light beam from the polygon mirror enters obliquely with respect to a plane containing the normal to the curved mirror at its vertex and being parallel to the main scanning direction (i.e., a Y-Z plane). An angle nullM formed by the optical axis of the light beam traveling to the curved mirror and the Y-Z plane satisfies 10

Abstract translation: 光扫描器包括半导体激光器，多面镜，用于将来自半导体激光器的光束引导到多面镜的偏转表面的第一成像光学系统，用于引导光束的单个曲面镜的第二成像光学系统 从多面镜到感光鼓，以及用于检测由多面镜扫描的光束的光电二极管。 第一成像光学系统，多面镜和第二成像光学系统位于副扫描方向上的不同位置，使得来自第一成像光学系统的光束相对于含有 多边形反射镜的偏转面并且与主扫描方向平行，并且来自多棱镜的光束相对于在其顶点处包含弯曲镜的法线的平面倾斜地并且平行于主扫描方向（即， ，YZ平面）。 由传播到曲面镜的光束和Y-Z平面的光轴形成的角度θM满足10 <35°。 曲面镜也是检测光学系统的一部分。 因此，光扫描器可以将来自曲面镜的光束直接引导到待扫描的表面和扫描启动信号检测器而不使用反射镜。

公开(公告)号：US20020047090A1

公开(公告)日：2002-04-25

申请号：US09923550

申请日：2001-08-07

Inventor： Michihiko Sakurai ,  Kazuhito Hori ,  Takuya Makino

IPC: H01J003/14 ,  H01J005/16

CPC classification number: G02B26/105

Abstract: A structure in which first to third diodes cause signal beams which are produced by modulating image signals to be incident upon corresponding first to third light deflection scanning sections. The first to third light deflection scanning sections perform line scanning operations using the incident light signal beams. First to third light amplifiers amplify the light signal beams used for the line scanning to necessary brightnesses. A light-wave synthesizer synthesizes the amplified light signal beams into one light beam. A light post scanning section performs frame scanning using the synthesized light beam in order to project it onto a screen. Accordingly, it is possible to display a highly bright image at a low cost on a large screen that realizes high definition and color reproducibility.

Abstract translation: 一种结构，其中第一至第三二极管引起通过调制图像信号而入射到对应的第一至第三光偏转扫描部分而产生的信号光束。 第一至第三光偏转扫描部分使用入射光信号光束进行行扫描操作。 第一至第三光放大器将用于线扫描的光信号束放大到必要的亮度。 光波合成器将放大的光信号光束合成为一个光束。 光照扫描部使用合成光束进行帧扫描，将其投影到画面上。 因此，可以在实现高清晰度和颜色再现性的大屏幕上以低成本显示高亮度图像。

公开(公告)号：US20020040965A1

公开(公告)日：2002-04-11

申请号：US10011324

申请日：2001-10-22

Inventor： Loi Han

IPC: H01J003/14 ,  H01J005/16

CPC classification number: H04N1/0285 ,  H04N1/02815 ,  H04N1/0286 ,  H04N1/0287 ,  H04N1/0289 ,  H04N1/10 ,  H04N2201/0418

Abstract: A light diverting channel for use in a scanner. The channel is incorporated into the cover of a flat bed scanner and transmits light from the lamps positioned longitudinally along the scanner, up through the side of the channel, and through a central region or sheet of the channel, and then down through objects to be scanned. The light diverting channel thereby more efficiently uses the light generated by the lamps and more evenly disburses the light over and through the object to be scanned.

Abstract translation: 用于扫描仪的光转换通道。 通道被结合到平板扫描仪的盖子中，并且将透射来自沿着扫描器纵向定位的灯的光向上通过通道的侧面，并且穿过通道的中心区域或片材，然后通过物体向下 扫描。 因此，光转向通道更有效地使用由灯产生的光，并且更均匀地将光穿过并通过待扫描的物体。

公开(公告)号：US20020036258A1

公开(公告)日：2002-03-28

申请号：US09867399

申请日：2001-05-31

Inventor： Leonard Bergstein ,  Emanuel Marom ,  Yajun Li ,  Joseph Katz

IPC: H01J003/14

CPC classification number: G06K7/10801 ,  G06K7/10702 ,  Y10S359/90

Abstract: A beam generator, or beam shaping system, for example for use in an optical scanner, creates a non-Gaussian beam which provides improved indicia-reading characteristics. In one embodiment, diffractive optical elements are used to create a Bessel-Gaussian scanning beam, which comprises a coherent combination of a Gaussian beam and a Bessel beam.

Abstract translation: 例如用于光学扫描仪的光束发生器或光束整形系统产生提供改进的标记读取特性的非高斯光束。 在一个实施例中，衍射光学元件用于产生贝塞尔 - 高斯扫描光束，其包括高斯光束和贝塞尔光束的相干组合。

公开(公告)号：US20020030158A1

公开(公告)日：2002-03-14

申请号：US09912538

申请日：2001-07-26

Applicant: Fuji Photo Film Co., Ltd.

Inventor： Kenichi Kodama

IPC: H01J003/14

CPC classification number: G02B13/0005

Abstract: An f-null lens is composed of a negative lens element of a negative power, and second and third lens elements of a positive power, arranged in this order from the side of a optical deflection device, wherein at least one surface of the lens elements is a cylindrical surface that has a refractive power only in the deflecting direction. The f-null lens satisfies the conditions: N1>N2nullN3, null1

Abstract translation: f-theta透镜由负功率的负透镜元件和正光焦度的第二和第三透镜元件组成，其从光学偏转装置的侧面依次布置，其中透镜元件的至少一个表面 是仅在偏转方向上具有屈光力的圆柱形表面。 f-θ透镜满足条件：N1> N2 = N3，＆lt; 1＆lt; 2＆gt; 3和4 <= | f23 / f1.D0 | <= 16，其中N1，N2和N3表示折射率 第一透镜元件和第三透镜元件的折射率，第一和第二和第三阿贝常数分别为第一透镜元件的焦距，f23是第二和第三透镜元件的复合焦距，以及D0a 从光学偏转装置到第一透镜元件的透镜表面的距离。

公开(公告)号：US20020020817A1

公开(公告)日：2002-02-21

申请号：US09767615

申请日：2001-01-22

Inventor： W. Bruce Feller ,  James A. Hill ,  Paul L. White ,  James M. Abraham

IPC: G01K001/08 ,  H01J003/14 ,  H01J003/26

CPC classification number: H01J49/025 ,  H01J2237/24435

Abstract: Detection systems for mass spectrometry involving a combination of novel detector face coatings, repeller grid position and voltage, and in some embodiments employing tandem detectors, an interplate voltage. The mass spectra show improved sensitivities to high mass ions.

Abstract translation: 用于质谱的检测系统涉及新型检测器面涂层，排斥器栅格位置和电压的组合，并且在一些实施例中采用串联检测器，板间电压。 质谱显示出对高质量离子的改善的敏感性。