Abstract:
A method of operating a non-volatile memory device includes maintaining a write voltage at a predetermined voltage level for programming and/or erasing a memory cell of the non-volatile memory device during a time between execution of consecutive write operations. For example, the write voltage may be activated at the predetermined voltage level responsive to an initial write command, and discharge of the write voltage may be prevented responsive to a signal indicating consecutive write commands. Related devices are also discussed.
Abstract:
The present invention relates to a tilt device for a vehicular steering column, which permits a lock slider cooperating with an operating lever to regulate pivoting of a movable gear by simplifying the engagement structure between the movable gear and a fixed gear to reduce the number of parts and enhance assembling ability, thereby reducing manufacturing cost. The tilt device of the invention also minimizes the operating force of the operating lever while elevating the coupling force between the operating lever and a lock slider so as to improve convenience of users.
Abstract:
A redundancy circuit embedded in the semiconductor memory device includes a sector selector and a bit line selector. The bit line selector repairs defective bit lines and the sector selector repairs defective global bit lines and selectively repairs defective bit lines. The sector selector includes a fixed address cell storage box for storing addresses of the defective bit lines and a flexible address cell storage box for storing addresses of the defective global bit lines. The circuit area is minimized since the coding unit corresponding to a sector address is not included in the bit line selector. The repair rate of defective bit lines is improved since the sector selector operates selectively as the bit line selector.
Abstract:
A charge pump circuit includes a plurality of serially connected pump stages. Each pump stage includes current paths connected between a gate terminal of a charge transfer transistor and a drain terminal thereof. One of the charge transfer paths allows charges to be transferred from the drain terminal to the gate terminal while the other path allows charges to be transferred from the gate terminal to the drain terminal. The charge pump circuit can generate a high target voltage using a very low power supply voltage (e.g., 2V or lower).
Abstract:
Semiconductor memory device row decoder structures have reduced layout area. A structure for erasing memory cells coupled to a single bitline includes a single bias driver for these cells, and a plurality of local voltage level converters coupled to the bias driver. At least one word line driver is coupled to each local level converter, to erase at least one of the memory cells. A global word line is also coupled to the word line driver. A method for erasing these memory cells includes biasing the local level converter, for powering in turn a component of the word line driver. In addition, an existing global word line driver powers another component of the word line driver, thus resulting in reduced design requirements for the local level converter.
Abstract:
A sense amplifier circuit for a flash memory device of the present invention includes first and second pre-charge circuits for pre-charging a data line (or bit line connected electrically to the data line). The first and second pre-charge circuits are each connected to the data line. The first pre-charge circuit provides a current changed by a fluctuation of the data line voltage to the data line, and the second pre-charge circuit provides a constant voltage regardless of the fluctuation of the data line voltage to the data line. The sense amplifier minimizes the time required to pre-charge the data line (or bit line) to a desired voltage.