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    PHOTON COUNTING X-RAY DETECTOR
    51.
    发明申请
    PHOTON COUNTING X-RAY DETECTOR 有权
    光电计数X射线探测器

    公开(公告)号：US20150234059A1

    公开(公告)日：2015-08-20

    申请号：US14421303

    申请日：2013-07-15

    Applicant: KONINKLIJKE PHILIPS N.V. ,  PHILIPS GMBH

    Inventor： Ewald Roessl ,  Daerr Heiner ,  Roger Steadman Booker

    IPC: G01T1/24 ,  G01N23/04

    CPC classification number: G01T1/247 ,  G01N23/046 ,  G01T1/171 ,  G01T1/248

    Abstract: The invention relates to a method and an X-ray detector (100) for detecting incident X-ray photons (X). The X-ray detector (100) comprises at least one sensor unit (105) in which X-ray photons (X) are converted into sensor signals (s) and at least one flux sensor (104) for generating a flux signal (f) related to the flux of photons (X). The sensor signals (s) are corrected based on the flux signal (f). In a preferred embodiment, the sensor signals (s) represent a spectrally resolved pulse counting. The flux sensor (104) may be integrated into an ASIC (103) that is coupled to the sensor unit (105).

    Abstract translation: 本发明涉及一种用于检测入射的X射线光子（X）的方法和X射线检测器（100）。 X射线检测器（100）包括至少一个传感器单元（105），其中将X射线光子（X）转换成传感器信号和至少一个通量传感器（104），用于产生通量信号（f ）与光子（X）的通量有关。 基于通量信号（f）校正传感器信号。 在优选实施例中，传感器信号表示频谱分辨的脉冲计数。 通量传感器（104）可以集成到耦合到传感器单元（105）的ASIC（103）中。

    DETECTION APPARATUS FOR DETECTING PHOTONS TAKING PILE-UP EVENTS INTO ACCOUNT
    52.
    发明申请
    DETECTION APPARATUS FOR DETECTING PHOTONS TAKING PILE-UP EVENTS INTO ACCOUNT 有权
    用于检测拍摄活动的照相机的检测装置

    公开(公告)号：US20140328466A1

    公开(公告)日：2014-11-06

    申请号：US14362458

    申请日：2012-12-13

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Roland Proksa ,  Ewald Roessl

    IPC: G01T1/17 ,  G01N23/04

    CPC classification number: A61B6/585 ,  A61B6/4241 ,  A61B6/5205 ,  A61B6/5258 ,  A61B6/582 ,  A61B2560/0223 ,  A61B2560/0238 ,  G01R29/0273 ,  G01R29/033 ,  G01R29/0878 ,  G01R29/24 ,  G01T1/171 ,  G01T1/18 ,  G06F7/64 ,  H01L27/14856 ,  H03K5/1252 ,  H03K5/2463 ,  H03K21/40

    Abstract: The invention relates to a detection apparatus (12) for detecting photons. The detection apparatus comprises a pile-up determining unit (15) for determining whether detection signal pulses being indicative of detected photons are caused by a pile-up event or by a non-pile-up event, wherein a detection values generating unit (16) generates detection values depending on the detection signal pulses and depending on the determination whether the respective detection signal pulse is caused by a pile-up event or by a non-pile-up event. In particular, the detection values generating unit can be adapted to reject the detection signal pulses caused by pile-up events while generating the detection values. This allows for an improved quality of the generated detection values.

    Abstract translation: 本发明涉及一种用于检测光子的检测装置（12）。 检测装置包括：堆积确定单元，用于确定是否由堆积事件或非堆积事件引起检测到的光子的指示的检测信号脉冲，其中检测值生成单元（16） ）根据检测信号脉冲产生检测值，并且取决于各个检测信号脉冲是由堆积事件还是由非堆积事件引起的。 特别地，检测值生成单元可以适于在产生检测值的同时拒绝由堆积事件引起的检测信号脉冲。 这样可以提高产生的检测值的质量。

    X-ray imaging data processing device and method
    53.
    发明授权
    X-ray imaging data processing device and method 有权

    公开(公告)号：US11529112B2

    公开(公告)日：2022-12-20

    申请号：US16322509

    申请日：2018-03-23

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Mattias Bartels ,  Thomas Koehler ,  Ewald Roessl

    IPC: A61B6/00

    Abstract: Data in X-ray images of a medical device is processed in order to reduce vibration artifacts in differential phase contrast imaging. A proportionality factor between an object induced phase shift for a first x-ray energy bin and an object induced phase shift for a second x-ray energy bin is provided. At least one of a dark field signal and an object induced phase shift is determined from a detected intensity value of a pixel for the first energy bin and a detected intensity value of the pixel for the second energy bin using the proportionality factor.

    Projection data acquisition apparatus and subject support device
    54.
    发明授权
    Projection data acquisition apparatus and subject support device 有权

    公开(公告)号：US11096639B2

    公开(公告)日：2021-08-24

    申请号：US16466308

    申请日：2017-12-07

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Ewald Roessl ,  Thomas Koehler

    IPC: A61B6/00 ,  A61B6/03 ,  G21K1/06 ,  A61B6/04

    Abstract: The invention relates to a subject support device (1) to be used in a projection data acquisition apparatus (2) for acquiring projection data of a subject (3). The subject support device comprises a support component (4) providing a support surface (5) for supporting the subject while acquiring the projection data, a diffraction grating (6) for diffracting x-rays, and a moving unit (7, 8) for moving the support component and the diffraction grating relative to each other. This relative movement can allow for a movement of the support component such that the subject is moved through x-rays (16) for determining projection data of different parts of the subject, while the diffraction grating can still be traversed by the x-rays. These projection data can be used for generating a relatively large phase-contrast and/or dark-field projection image.

    Imaging with modulated X-ray radiation
    55.
    发明授权
    Imaging with modulated X-ray radiation 有权

    公开(公告)号：US10925556B2

    公开(公告)日：2021-02-23

    申请号：US15742645

    申请日：2016-07-13

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Ewald Roessl ,  Stewart Young

    IPC: A61B6/00 ,  G01N23/04 ,  A61B6/06

    Abstract: The present invention relates to a modulation of X-ray radiation for the purposes of imaging an object of interest. For the modulation, the X-ray radiation provided by an X-ray source (12) is in part totally reflected by a mirror (20). Thus, an X-ray radiation at an object receiving space (16) is formed by an unreflected X-ray radiation (24) and a reflected X-ray radiation (26). The mirror (20) is displaceable by an actuator (28), such that the intensity of the reflected X-ray radiation (26) can be adjusted, in particular to a density of the object to be imaged.

    Baseline shift determination for a photon detector
    56.
    发明授权
    Baseline shift determination for a photon detector 有权

    公开(公告)号：US10660589B2

    公开(公告)日：2020-05-26

    申请号：US15534528

    申请日：2015-12-10

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Ewald Roessl

    IPC: A61B6/03 ,  G01T1/24 ,  A61B6/00 ,  G01T1/40 ,  G01T7/00 ,  H05G1/30

    Abstract: The present invention relates to determining baseline shift of an electrical signal generated by a photon detector (102) of an X-ray examination device (101). For this purpose, the photon detector comprises a processing unit (103) that is configured to determine a first crossing frequency of a first pulse height threshold by the electrical signal generated by the photon detector. The first pulse height threshold is located at a first edge of a noise peak in the pulse height spectrum of the electrical signal.

    Photon counting device and method
    57.
    发明授权
    Photon counting device and method 有权

    公开(公告)号：US10365380B2

    公开(公告)日：2019-07-30

    申请号：US15748750

    申请日：2016-07-29

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Roger Steadman Booker ,  Ewald Roessl

    IPC: G01T1/00 ,  G01T1/17 ,  G01T1/29 ,  G01T1/24 ,  H04N5/345 ,  G01J1/44

    Abstract: The invention relates a photon counting device and method for counting photon interactions in a piece of converter material and addressing the issue of charge sharing. The occurrence of a charge sharing event is already detected upon the onset of the pulse, taking into consideration an onset of a pulse in a neighboring pixel within a preferably very short coincidence window. According to the invention, it is detected whether a pulse is being processed and one or more neighboring pixels are scouted to decide whether a simultaneous interaction has been registered within a very short coincidence window.

    X-ray detector, imaging apparatus and calibration method
    59.
    发明授权
    X-ray detector, imaging apparatus and calibration method 有权

    公开(公告)号：US10001567B2

    公开(公告)日：2018-06-19

    申请号：US15114444

    申请日：2015-12-09

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Ewald Roessl ,  Heiner Daerr

    IPC: G01T1/24 ,  A61B6/00 ,  H05G1/08 ,  G01T7/00 ,  H01J35/02

    CPC classification number: G01T1/24 ,  A61B6/585 ,  G01T7/005 ,  H01J35/02 ,  H05G1/08

    Abstract: An X-ray detector comprises a directly converting semiconductor layer having a plurality of pixels for converting incident radiation into electrical measurement signals with a band gap energy characteristic of the semiconductor layer, wherein said incident radiation is x-ray radiation emitted by an x-ray source or light omitted by at least one light source. An evaluation unit calculates evaluation signals per pixel or group of pixels from first electrical measurement signals generated when light from said at least one light source at a first intensity is coupled into the semiconductor layer, and second electrical measurement signals generated when light from said at least one light source at a second intensity is coupled into the semiconductor layer. A detection unit determines detection signals from electrical measurement signals generated when x-ray radiation is incident onto the semiconductor layer, and a calibration unit calibrates the detection unit on the basis of the evaluation signals.

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